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Numerical simulation on flight dynamic characteristics of elastic wing based on gust response 会议论文  OAI收割
3rd International Conference on Advanced Design and Manufacturing Engineering, ADME 2013, July 13, 2013 - July 14, 2013, Anshan, China
Dong W. H.; Yang C. L.; Li Y. H.; Jia H. G.
收藏  |  浏览/下载:12/0  |  提交时间:2014/05/15
Immersed nanospheres super-lithography for the fabrication of sub-70nm nanoholes with period below 700nm (EI CONFERENCE) 会议论文  OAI收割
2012 12th IEEE International Conference on Nanotechnology, NANO 2012, August 20, 2012 - August 23, 2012, Birmingham, United kingdom
作者:  
Li S.;  Du J.;  Shi L.
收藏  |  浏览/下载:129/0  |  提交时间:2013/03/25
A maskless nano-lithography method by using polystyrene spheres (PSs) self-assembled on silver slab (NSSL) was proposed in [optics express  Vol. 16  No. 19 (2008) 14397]. Following that  to break the limitations in resolution and PSs period of NSSL method  in this paper  we present PSs immersed super-resolution lithography (NSISL) technology by embedding the PSs into appropriate material to improve the efficiency of the surface plasmon excitation. The energy modulating mechanism and the rules of the resolution affected by silver slab were studied by calculating and analysing the energy distribution. The curve of the lithography resolution versus the silver thickness was presented. In order to verify this method  contrast analysis was carried out with NSSL. The results show that the lithography resolution is improved efficiently. Taking a specific configuration with PS diameter of 600nm as an example  the resolution was improved to 54nm from 190nm with Ag thickness of 25nm. Based on the calculation results  we carried out the experiments. Nano holes with dimension of 75nm and period of 600nm were obtained. 2012 IEEE.  
A composite hardness stamp in 184 PDMS for nanostructures transfer in high fidelity (EI CONFERENCE) 会议论文  OAI收割
2012 12th IEEE International Conference on Nanotechnology, NANO 2012, August 20, 2012 - August 23, 2012, Birmingham, United kingdom
作者:  
Du J.;  Shi L.;  Li S.
收藏  |  浏览/下载:12/0  |  提交时间:2013/03/25
To improve the fidelity of nanostructures in transfer process  a composite stamp with reasonable hardness distribution in 184 PDMS used to nanoimprint was studied. The stamp is composed of a stiff 184 PDMS structured layer and a soft 184 PDMS supporter layer. We studied the relationship between the hardness of the 184 PDMS and the proportion of each component in 184 PDMS. The appropriate components proportions of prepolymer and curing agent corresponding to the different region of the composite stamp were presented. The fabrication method of the stamp is also presented. Corresponding experiments were carried out by using this stamp. Kinds of nanostructures were transferred in one inch diameter area with good fidelity. The feature sizes of the structures were less than 100 nm. 2012 IEEE.  
The electromagnetic compatibility design of restrained image transmission equipments (EI CONFERENCE) 会议论文  OAI收割
2011 3rd International Conference on Mechanical and Electronics Engineering, ICMEE 2011, September 23, 2011 - September 25, 2011, Hefei, China
作者:  
Wang W.;  Wang W.
收藏  |  浏览/下载:16/0  |  提交时间:2013/03/25
In order to improve the quality of image transmission  this paper puts forward a box shielding method that could eliminate electromagnetic interference signal on image transmission equipments. At first  this paper analyzes the shielding effectiveness of electromagnetic interference  selects the qualified shielding material and designs the structure. After that  it analyzes the descending of shielding effectiveness in the operational system  and improves the equipments shielding effectiveness by means of the electromagnetic compatibility design that accords with electromagnetic compatibility norms. At last  through the EMI radiometry  this paper confirms that the equipments are in accordance with the design requirements of electromagnetic compatibility norms. (2012) Trans Tech Publications  Switzerland.  
Observations and analysis of extreme ultraviolet emission between 10nm and 70nm by capillary discharge with Xe as target (EI CONFERENCE) 会议论文  OAI收割
2011 Academic International Symposium on Optoelectronics and Microelectronics Technology, AISOMT 2011, October 12, 2011 - October 16, 2011, Harbin, China
作者:  
Yang L.;  Yang L.
收藏  |  浏览/下载:11/0  |  提交时间:2013/03/25
SoC test data compression technique based on RLE-G (EI CONFERENCE) 会议论文  OAI收割
2010 International Conference on Advanced Measurement and Test, AMT 2010, May 15, 2010 - May 16, 2010, Sanya, China
作者:  
Liu W.;  Yang L.;  Yang L.;  Zheng X.
收藏  |  浏览/下载:20/0  |  提交时间:2013/03/25
Test data compression has been an effective way to reduce test data volume and test time  as well as to solve automatic test equipment (ATE) memory and bandwidth limitation. We analyze the limitations of current test data compression algorithm and draw on the previous experience to deduce an optimal compression coding model suitable for SoC test data. In addition  in this paper we make full use of the relevance of the test vectors and the advantages of statistical coding to present an efficient test data compression method RLE-G based on the coding model  and give the RLE-G the optimal compression efficiency of the boundary conditions and realization steps. The experimental results for ISCAS 89 benchmark circuits demonstrate RLE-G have the excellent advantages of high compression ratio. (2010) Trans Tech Publications.  
Contrast research on interpolation and subpixel imaging in CCD geometric superresolution reconstruction 会议论文  OAI收割
2009
Xu Z. P.; Ge W. Q.; Yang S. W.; Xu Y. S.; Zhai L. P.; Xu Z. P.; Yang S. W.; Ieee
收藏  |  浏览/下载:5/0  |  提交时间:2013/03/28
Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Liu L.;  Yang H.;  Liu L.
收藏  |  浏览/下载:11/0  |  提交时间:2013/03/25
We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.  
Optical characteristic of ion beam sputter deposited aluminum thin films - art. no. 66241B 会议论文  OAI收割
2008
作者:  
Liu L.;  Liu L.
收藏  |  浏览/下载:9/0  |  提交时间:2013/03/28
Ion beam sputter deposition of zirconia thin films - art. no. 66241A 会议论文  OAI收割
2008
作者:  
Liu L.;  Liu L.
收藏  |  浏览/下载:7/0  |  提交时间:2013/03/28