机构

• 上海微系统与信息技术... [8]
• 力学研究所 [1]
• 水土保持研究所 [1]

采集方式

• OAI收割 [10]

内容类型

• 期刊论文 [9]
• 会议论文 [1]

发表日期

• 2017 [1]
• 2013 [1]
• 2011 [8]

学科主题

• Engineeri... [10]
• Electrical... [4]
• Applied [2]
• Electrical... [2]
• Electrical... [2]
• Aerospace [1]
• 更多

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浏览/检索结果: 共10条，第1-10条 帮助 限定条件 学科主题：Engineering     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Modelling sheet erosion on steep slopes in the loess region of China 期刊论文  OAI收割 JOURNAL OF HYDROLOGY, 2017, 卷号: 553, 页码: 549-558 作者:  Wu, Bing;  Wang, Zhanli;  Zhang, Qingwei;  Shen, Nan;  Liu, June   |  收藏  |  浏览/下载：24/0  |  提交时间：2018/04/12 Sheet Erosion Rate  Rainfall Intensity  Slope Gradient  Flow Velocity  Hydrodynamic Parameters   Concept of non-ablative thermal protection system for hypersonic vehicles 会议论文  OAI收割 17th AIAA International Space Planes and Hypersonic Systems and Technologies Conference, San Francisco, CA, APR 11-14, 2011 作者:  Jiang ZL(姜宗林);  Liu YF(刘云峰) 收藏  |  浏览/下载：22/0  |  提交时间：2013/12/12 Impact of within-wafer process variability on radiation response 期刊论文  OAI收割 MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 6, 页码: 883-888 Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：10/0  |  提交时间：2012/04/10 ELSEVIER SCI LTD   Comprehensive Study on the Total Dose Effects in a 180-nm CMOS Technology 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1347-1354 Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：14/0  |  提交时间：2012/04/10 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC   Simple Method for Extracting Effective Sheet Charge Density Along STI Sidewalls Due to Radiation 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1332-1337 Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：8/0  |  提交时间：2012/04/10 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC   Total Ionizing Dose Enhanced DIBL Effect for Deep Submicron NMOSFET 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1324-1331 Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：12/0  |  提交时间：2012/04/10 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC   Total ionizing dose effects in elementary devices for 180-nm flash technologies 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 8, 页码: 1295-1301 Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：16/0  |  提交时间：2012/04/10 PERGAMON-ELSEVIER SCIENCE LTD   Radiation Hardening by Applying Substrate Bias 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 卷号: 58, 期号: 3, 页码: 1355-1360 Hu,ZY; Liu,ZL; Shao,H; Zhang,ZX; Ning,BX; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：13/0  |  提交时间：2012/04/10 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC   The impact of total ionizing radiation on body effect 期刊论文  OAI收割 MICROELECTRONICS JOURNAL, 2011, 卷号: 42, 期号: 12, 页码: 1396-1399 Ning,BX; Hu,ZY; Zhang,ZX; Liu,ZL; Chen,M; Bi,DW; Zou,SC 收藏  |  浏览/下载：11/0  |  提交时间：2012/04/10 ELSEVIER SCI LTD   Comparison of TID response in core, input/output and high voltage transistors for flash memory 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2011, 卷号: 51, 期号: 6, 页码: 1148-1151 Liu,ZL; Hu,ZY; Zhang,ZX; Shao,H; Chen,M; Bi,DW; Ning,BX; Zou,SC 收藏  |  浏览/下载：8/0  |  提交时间：2012/04/10 PERGAMON-ELSEVIER SCIENCE LTD