中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
深圳先进技术研究院 [2]
计算技术研究所 [2]
昆明植物研究所 [1]
采集方式
OAI收割 [5]
内容类型
期刊论文 [4]
会议论文 [1]
发表日期
2021 [1]
2020 [1]
2017 [1]
2012 [1]
2009 [1]
学科主题
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Fault Modeling and Efficient Testing of Memristor-Based Memory
期刊论文
OAI收割
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 卷号: 68, 期号: 11, 页码: 4444-4455
作者:
Liu, Peng
;
You, Zhiqiang
;
Wu, Jigang
;
Liu, Bosheng
;
Han, Yinhe
  |  
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2022/06/21
Electrical defects
fault model
defect-oriented testing
March algorithm
non-volatile memory
Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors
期刊论文
OAI收割
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727
作者:
Zhang, Ying
;
Chakrabarty, Krishnendu
;
Peng, Zebo
;
Rezine, Ahmed
;
Li, Huawei
  |  
收藏
  |  
浏览/下载:42/0
  |  
提交时间:2020/12/10
Circuit faults
Built-in self-test
Out of order
Model checking
Integrated circuit modeling
Bounded model checking (BMC)
online testing
out-of-order superscalar processors
software-based self-testing (SBST)
Fungal diversity notes 491-602: taxonomic and phylogenetic contributions to fungal taxa
期刊论文
OAI收割
FUNGAL DIVERSITY, 2017, 卷号: 83, 期号: 1, 页码: 1-261
作者:
Tibpromma, Saowaluck
;
Hyde, Kevin D.
;
Jeewon, Rajesh
;
Maharachchikumbura, Sajeewa S. N.
;
Liu, Jian-Kui
收藏
  |  
浏览/下载:155/0
  |  
提交时间:2017/07/10
Agaricomycetes
Ascomycota
Basidiomycota
Dacrymycetes
Dothideomycetes
Eurotiomycetes
New combination
Mucoromycotina
New genus
New records
New species
Pezizomycetes
Phylogeny
Sordariomycetes
Taxonomy
Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint
期刊论文
OAI收割
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2012
作者:
Li Jiang
;
Qiang Xu
;
Krishnendu Chakrabarty
;
T. M. Mak
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2015/08/25
Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint
会议论文
OAI收割
2009 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2009
作者:
Li Jiang
;
Qiang Xu
;
Krishnendu Chakrabarty
;
T. M. Mak
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2015/08/21