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浏览/检索结果: 共80条，第1-10条 帮助

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Context-wise attention-guided network for single image deraining 期刊论文  OAI收割
ELECTRONICS LETTERS, 2022, 卷号: 58, 期号: 4, 页码: 148-150
作者:  Fu B(傅博);  Jiang Y(姜勇);  Wang HG(王洪光);  Wang Q(王强);  Gao, Qian
  |  收藏  |  浏览/下载：22/0  |  提交时间：2021/12/20
Single event transient effect of frontside and backside illumination image sensors under proton irradiation 期刊论文  OAI收割
ACTA PHYSICA SINICA, 2022, 卷号: 71, 期号: 5, 页码: 1-9
作者:  Fu, J (Fu Jing) [1] , [2] , [3];  Cai, YL (Cai Yu-Long) [4];  Li, YD (Li Yu-Dong) [1] , [2];  Feng, J (Feng Jie) [1] , [2];  Wen, L (Wen Lin) [1] , [2]
  |  收藏  |  浏览/下载：44/0  |  提交时间：2022/06/06
Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文  OAI收割
CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184
作者:  Liu, BK (Liu Bingkai)[ 1,2,3 ];  Li, YD (Li Yudong)[ 1,2 ];  Wen, L (Wen Lin)[ 1,2 ]
  |  收藏  |  浏览/下载：35/0  |  提交时间：2021/05/10
Ground experiment of a 50 mm balloon-borne coronagraph for near space project 会议论文  OAI收割
Chengdu, China, 2021-06-14
作者:  Liu Y(刘煜);  Zhang XF(张雪飞);  Song TF(宋腾飞);  Sun, Mingzhe;  Liu, Dayang
  |  收藏  |  浏览/下载：64/0  |  提交时间：2022/03/07
Mechanism of Ionization Damage in Large Eight-Transistor Complementary Metal-Oxide-Semiconductor Color Image Sensors 期刊论文  OAI收割
JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS, 2021, 卷号: 16, 期号: 11, 页码: 1755-1761
作者:  Feng, J (Feng, Jie) [1] , [2];  Fu, J (Fu, Jing) [1] , [2] , [3];  Li, YD (Li, Yu-Dong) [1] , [2];  Wen, L (Wen, Lin) [1] , [2];  Guo, Q (Guo, Qi) [1] , [2]
  |  收藏  |  浏览/下载：20/0  |  提交时间：2022/03/24
Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文  OAI收割
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021
作者:  Zhang, X (Zhang, Xiang)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ]
  |  收藏  |  浏览/下载：17/0  |  提交时间：2020/12/09
A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文  OAI收割
RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
  |  收藏  |  浏览/下载：29/0  |  提交时间：2020/07/06
Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL 期刊论文  OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868
作者:  Cai, YL (Cai, Yulong)[ 1,2 ];  Wen, L (Wen, Lin)[ 3 ];  Li, YD (Li, Yudong)[ 3 ];  Guo, Q (Guo, Qi)[ 3 ];  Zhou, D (Zhou, Dong)[ 3 ]
  |  收藏  |  浏览/下载：19/0  |  提交时间：2020/09/09
Fabricating Pd isolated single atom sites on C3N4/rGO for heterogenization of homogeneous catalysis 期刊论文  OAI收割
NANO RESEARCH, 2020, 卷号: 13, 期号: 4, 页码: 947-951
作者:  Fu, NH;  Liang, X;  Li, Z;  Chen, WX;  Wang, Y
  |  收藏  |  浏览/下载：42/0  |  提交时间：2021/09/06
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文  OAI收割
RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7
作者:  Liu, BK (Liu, Bingkai)[ 1,2,3 ];  Li, YD (Li, Yudong)[ 1,2 ];  Wen, L (Wen, Lin)[ 1,2 ];  Zhou, D (Zhou, Dong)[ 1,2 ];  Feng, J (Feng, Jie)[ 1,2 ]
  |  收藏  |  浏览/下载：21/0  |  提交时间：2021/03/19