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	Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文 OAI收割 CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184 作者: Liu, BK (Liu Bingkai)[ 1,2,3 ]; Li, YD (Li Yudong)[ 1,2 ]; Wen, L (Wen Lin)[ 1,2 ]; Zhou, D (Zhou Dong)[ 1,2 ]; Feng, J (Feng Jie)[ 1,2 ] \| 收藏 \| 浏览/下载：32/0 \| 提交时间：2021/05/10 Backside‐ illuminated CMOS image sensors Dark signal behaviors Displacement damage effects Neutron irradiation
	Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal 期刊论文 OAI收割 RADIATION PHYSICS AND CHEMISTRY, 2021, 卷号: 189, 期号: 12, 页码: 1-5 作者: Li, YD (Li, Yudong); Liu, BK (Liu, Bingkai); Wen, L (Wen, Lin); Wei, Y (Wei, Ying); Zhou, D (Zhou, Dong) \| 收藏 \| 浏览/下载：47/0 \| 提交时间：2021/10/14 Radiation effectsTotal ionizing dose (TID)Charge coupled device (CCD)Dark signalOxide trapped charges
	Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors 期刊论文 OAI收割 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2020, 卷号: 57, 期号: 9, 页码: 1015-1021 作者: Zhang, X (Zhang, Xiang)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ]; Wen, L (Wen, Lin)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ] \| 收藏 \| 浏览/下载：17/0 \| 提交时间：2020/12/09 14-MeV neutron neutron irradiation radiation damage radiation effect
	A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文 OAI收割 RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550 作者: Liu, BK (Liu, Bingkai)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ]; Wen, L (Wen, Lin)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ] \| 收藏 \| 浏览/下载：29/0 \| 提交时间：2020/07/06 Charge coupled devices (CCDs) proton irradiation neutron irradiation hot pixels displacement damage effects
	Single-Event Effects in Pinned Photodiode CMOS Image Sensors: SET and SEL 期刊论文 OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 8, 页码: 1861-1868 作者: Cai, YL (Cai, Yulong)[ 1,2 ]; Wen, L (Wen, Lin)[ 3 ]; Li, YD (Li, Yudong)[ 3 ]; Guo, Q (Guo, Qi)[ 3 ]; Zhou, D (Zhou, Dong)[ 3 ] \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2020/09/09 Complementary metal-oxide-semiconductor (CMOS) image sensors (CIS) heavy ions pulsed laser single-event latchup (SEL) single-event transient (SET)
	Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors 期刊论文 OAI收割 RESULTS IN PHYSICS, 2020, 卷号: 19, 期号: 12, 页码: 1-7 作者: Liu, BK (Liu, Bingkai)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ]; Wen, L (Wen, Lin)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ] \| 收藏 \| 浏览/下载：21/0 \| 提交时间：2021/03/19 Backside illuminated CMOS image sensor Random telegraph signal Radiation effects Proton irradiation Theoretical calculation
	Electron irradiation-induced defects and photoelectric properties of Te-doped GaSb 期刊论文 OAI收割 JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2019, 卷号: 132, 期号: 9, 页码: 26-30 作者: Wang, DK (Wang, Dengkui)[ 1 ]; Chen, BK (Chen, Bingkun)[ 1 ]; Wei, ZP (Wei, Zhipeng)[ 1 ]; Fang, X (Fang, Xuan)[ 1 ]; Tang, JL (Tang, Jilong)[ 1 ] \| 收藏 \| 浏览/下载：69/0 \| 提交时间：2019/07/23 GaSb Electron irradiation Photoluminescence Defects
	Decoloration of sugarcane molasses by tight ultrafiltration: Filtration behavior and fouling control 期刊论文 OAI收割 SEPARATION AND PURIFICATION TECHNOLOGY, 2018, 卷号: 204, 页码: 66, 74 作者: Guo, SW; Luo, JQ; Wu, YY; Qi, BK; Chen, XR \| 收藏 \| 浏览/下载：38/0 \| 提交时间：2018/12/29 Sugarcane molasses BEET MOLASSES Tight ultrafiltration JUICE ULTRAFILTRATION Membrane fouling CANE MOLASSES Decolorization MEMBRANE Nanofiltration ACID PERFORMANCE WATER TEMPERATURE SEPARATION EFFICIENCY
	Involvement of smad4, but not of smad2, in transforming growth factor-beta1-induced trophoblast expression of matrix metalloproteinase-2 期刊论文 iSwitch采集 Frontiers in bioscience, 2006, 卷号: 11, 页码: 637-646 作者: Lin, HY; Yang, Q; Wang, HM; Qi, JG; Zhang, H 收藏 \| 浏览/下载：29/0 \| 提交时间：2019/05/10 Transcription factor Cytokine Matrix Smad Tgf-beta Mmp Retrovirus Trophoblast