中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Effect of compaction pressure on the densification, microstructure, and mechanical properties of Ti-1Al-8V-5Fe alloy based on TiH2 and HDH-Ti powders 期刊论文  OAI收割
MICRO & NANO LETTERS, 2019, 卷号: 14, 期号: 8, 页码: 906-910
作者:  
Zhang, Yanan;  Guo, Xing;  Chen, Yungui;  Li, Qiangguo
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Effect of compaction pressure on the densification, microstructure, and mechanical properties of Ti-1Al-8V-5Fe alloy based on TiH2 and HDH-Ti powders 期刊论文  OAI收割
MICRO & NANO LETTERS, 2019, 卷号: 14, 期号: 8, 页码: 906-910
作者:  
Zhang, Yanan;  Guo, Xing;  Chen, Yungui;  Li, Qiangguo
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Optimization design of strengthening components for linear motion system of the novel optical testing target 期刊论文  OAI收割
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2018, 卷号: 47, 期号: 6
作者:  
Zhang, Shaojun;  Gao, Yunguo;  Xue, Xiangyao
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Design and detection for the photoelectric device used in the point source transmission testing 期刊论文  OAI收割
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2018, 卷号: 39, 期号: 1, 页码: 92-99
作者:  
Zhang, Ning;  Ye, Lu;  Song, Ying
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Calibration of stray light based on point source transmittance measurement system 期刊论文  OAI收割
guangxue jingmi gongcheng/optics and precision engineering, 2016, 卷号: 24, 期号: 7, 页码: 1607-1614
作者:  
Xu, Liang;  Gao, Li-Min;  Zhao, Jian-Ke;  Liu, Feng;  Zhou, Yan
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dealing with driver failures in the storage stack 会议论文  OAI收割
2009 4th Latin-American Symposium on Dependable Computing, LADC 2009, Joao Pessoa, Brazil, September
Herder Jorrit N.; Van Moolenbroek David C.; Appuswamy Raja; Wu Bingzheng; Gras Ben; Tanenbaum Andrew S.
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Research of automatic test technology of parameters used in a dual-CCD TV measure-system (EI CONFERENCE) 会议论文  OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 2, 2005 - November 5, 2005, Zian, China
作者:  
Wang L.;  Li Y.;  Li Y.;  Li Y.
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Intelligent MRTD testing for thermal imaging system using ANN (EI CONFERENCE) 会议论文  OAI收割
ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
Sun J.; Ma D.
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