中国科学院机构知识库网格系统: 检索

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	Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors 期刊论文 OAI收割 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727 作者: Zhang, Ying; Chakrabarty, Krishnendu; Peng, Zebo; Rezine, Ahmed; Li, Huawei \| 收藏 \| 浏览/下载：50/0 \| 提交时间：2020/12/10 Circuit faults Built-in self-test Out of order Model checking Integrated circuit modeling Bounded model checking (BMC) online testing out-of-order superscalar processors software-based self-testing (SBST)
	Design-for-testability features and test implementation of a giga hertz general purpose microprocessor 期刊论文 iSwitch采集 Journal of computer science and technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Wang, Da; Hu, Yu; Li, Hua-Wei; Li, Xiao-Wei 收藏 \| 浏览/下载：21/0 \| 提交时间：2019/05/10 Microprocessor design-for-testability Test generation Built-in self-test At-speed testing
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Wang, Da; Hu, Yu; Li, Hua-Wei; Li, Xiao-Wei \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2019/12/16 microprocessor design-for-testability test generation built-in self-test at-speed testing
	Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Microprocessor 期刊论文 OAI收割 Journal of Computer Science and Technology, 2008, 卷号: 23, 期号: 6, 页码: 1037-1046 作者: Da Wang(王达); Yu Hu(胡瑜); Hua-Wei Li(李华伟); Xiao-Wei Li(李晓维) \| 收藏 \| 浏览/下载：21/0 \| 提交时间：2010/11/02 Microprocessor Design-for-testability Test Generation Built-in Self-test At-speed Testing
	A loop-based apparatus for at-speed self-testing 期刊论文 OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2001, 卷号: 16, 期号: 3, 页码: 278-285 作者: Li, XW; Cheung, PYS \| 收藏 \| 浏览/下载：15/0 \| 提交时间：2019/12/16 built-in self-test at-speed test multiple input shift register state transition graph