机构

• 长春光学精密机械与物... [4]
• 长春应用化学研究所 [3]
• 金属研究所 [2]
• 物理研究所 [1]

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• OAI收割 [10]

内容类型

• 期刊论文 [6]
• 会议论文 [4]

发表日期

• 2012 [1]
• 2011 [1]
• 2010 [2]
• 2008 [2]
• 2006 [2]
• 2004 [1]
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浏览/检索结果: 共10条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Field electron emission based on resonant tunneling in diamond/CoSi2/Si quantum well nanostructures 期刊论文  OAI收割 SCIENTIFIC REPORTS, 2012, 卷号: 2 Gu, CZ; Jiang, X; Lu, WG; Li, JJ; Mantl, S 收藏  |  浏览/下载：19/0  |  提交时间：2013/09/17 VAPOR-DEPOSITED DIAMOND  COLD CATHODES  THIN-FILMS  COSI2  MECHANISM  SURFACES  EMITTER  GROWTH   Hole Transparent and Hole Blocking Transport in Single-Crystal-Like Organic Heterojunction: When Rods Hold up Disks 期刊论文  OAI收割 acs applied materials & interfaces, 2011, 卷号: 3, 期号: 7, 页码: 2195-2199 Zhu F; Grobosch M; Treske U; Huang LZ; Chen WC; Yang JB; Yan DH; Knupfer M 收藏  |  浏览/下载：22/0  |  提交时间：2012/06/08 FIELD-EFFECT TRANSISTORS  ENERGY-LEVEL ALIGNMENT  DEPOSITED THIN-FILMS  WEAK EPITAXY GROWTH  INTERFACES  SEMICONDUCTORS  DEVICES  MODEL  HETEROEPITAXY  INJECTION   ZnO films growth at different temperature on the substrate of Corning glass by MOCVD (EI CONFERENCE) 会议论文  OAI收割 2009 International Symposium on Liquid Crystal Science and Technology, August 2, 2009 - August 5, 2009, Kunming, China 作者:  Zhao J.;  Gao X.;  Wang C.;  Tang W. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 We deposited ZnO films on Corning glass substrate by metal-organic chemical vapor deposition (MOCVD). We found the diffraction (002) peak at ~34.46  indicating that the ZnO thin films were C-oriented. ZnO films were highly transparent with a transmission ratio larger than 85% in the visible range. The surface morphology of the films was observed by atomic force microscopy (AFM). (2010) Trans Tech Publications.   Variation of microstructure and composition of the Cr(2)AlC coating prepared by sputtering at 370 and 500 degrees C 期刊论文  OAI收割 Surface & Coatings Technology, 2010, 卷号: 204, 期号: 23, 页码: 3838-3845 J. J. Li; L. F. Hu; F. Z. Li; M. S. Li; Y. C. Zhou 收藏  |  浏览/下载：34/0  |  提交时间：2012/04/13 Cr(2)AlC coating  alpha-(Cr  MAX phase  Al)(2)O(3)  Magnetron sputtering  Microstructure  Substrate temperature  phase thin-films  ab-initio calculations  select max phases  tribological behavior  m(n+1)ax(n) phases  deposited chromium  oxidation  behavior  vapor deposits  nitride films  bulk cr2alc   Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Liu L.;  Yang H.;  Liu L. 收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25 We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.   Temperature-enhanced ultraviolet emission in ZnO thin film (EI CONFERENCE) 会议论文  OAI收割 Zhang Y. J.; Xu C. S.; Liu Y. C.; Liu Y. X.; Wang G. R.; Fan X. W. 收藏  |  浏览/下载：27/0  |  提交时间：2013/03/25 We have studied the structural and optical properties of ZnO thin films prepared by thermal oxidation of ZnS films deposited by plasma assisted electron-beam evaporation on Si(1 0 0) substrates. The transformation from zinc blende ZnS to hexagonal wurtzite ZnO is confirmed by Raman and X-ray diffraction (XRD) measurement. For the sample thermally oxidized at 600 C for 2 h  a novel UV emission peak Ix located at 3.22 eV (385 nm) has been observed. The temperature-dependent photoluminescence spectra show that the integrated intensity of Ix increases exponentially with increasing temperatures within the measuring temperature range  from 80 to 300 K  but the peak position remains nearly constant. We explain this behavior in terms of electron tunneling into the radiative recombination centers.   Internal stress and adhesion of Cu film/Si prepared by both MEVVA and IBAD 期刊论文  OAI收割 Surface & Coatings Technology, 2006, 卷号: 201, 期号: 3-4, 页码: 1243-1249 M. Yu; J. Z. Zhang; D. X. Li; Q. L. Meng; W. Z. Li 收藏  |  浏览/下载：23/0  |  提交时间：2012/04/14 MEVVA  IBAD  copper film  compressive stress  adhesion  deposited thin-films  intrinsic stress  residual-stress  cosi2 films  bombardment  diamond   Morphology and structure of poly(di-n-butylsilane) single crystals prepared by controlling kinetic process of solvent evaporation 期刊论文  OAI收割 macromolecules, 2004, 卷号: 37, 期号: 9, 页码: 3310-3318 Hu ZJ; Zhang FJ; Huang HY; Zhang ML; He TB 收藏  |  浏览/下载：191/41  |  提交时间：2010/08/17 CHAIN CONFORMATIONAL KINETICS  POLYMER PHASE-TRANSITIONS  SOLID-STATE STRUCTURE  DEPOSITED THIN-FILMS  BACKBONE CONFORMATIONS  MOLECULAR-ORIENTATION  SPECTROSCOPIC METHODS  ENERGY CALCULATIONS  LAMELLAR CRYSTALS  X-RAY   Morphology and structures of self-assembled symmetric poly(di-n-alkylsilanes) 期刊论文  OAI收割 langmuir, 2003, 卷号: 19, 期号: 21, 页码: 9013-9017 Hu ZJ; Zhang FJ; Du BY; Huang HY; He TB 收藏  |  浏览/下载：29/0  |  提交时间：2010/09/13 SCANNING-TUNNELING-MICROSCOPY  CHAIN CONFORMATIONAL KINETICS  ORIENTED PYROLYTIC-GRAPHITE  DEPOSITED THIN-FILMS  X-RAY  MOLECULAR-ORIENTATION  SPECTROSCOPIC METHODS  SOLID-STATE  POLYMERS  POLY(DI-N-HEXYLSILANE)