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CAS IR Grid
机构
上海光学精密机械研究... [6]
长春光学精密机械与物... [3]
光电技术研究所 [2]
上海应用物理研究所 [2]
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OAI收割 [13]
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期刊论文 [10]
会议论文 [3]
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2019 [1]
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激光技术;激光物理与... [2]
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Plasmonic Interference Lithography for Low-Cost Fabrication of Dense Lines with Sub-50 nm Half-Pitch
期刊论文
OAI收割
ACS Applied Nano Materials, 2019, 卷号: 2, 期号: 1, 页码: 489-496
作者:
Kong, Weijie
;
Luo, Yunfei
;
Zhao, Chengwei
;
Liu, Ling
;
Gao, Ping
  |  
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2021/05/06
interference lithography
surface plasmonic
optical waveguide
near-field
diffraction limit
super resolution
nanomanufacturing
subwavelength optics
Effects of donor and acceptor's fluorescence lifetimes on the method of applying Forster resonance energy transfer in STED microscopy
期刊论文
OAI收割
JOURNAL OF MICROSCOPY, 2018, 卷号: 269, 期号: 1, 页码: 59-65
作者:
  |  
收藏
  |  
浏览/下载:46/0
  |  
提交时间:2018/09/06
Diffraction Resolution Limit
Stimulated-emission
Breaking
Field
Fret
Excitation
Barrier
Light
Plasmonic Structures, Materials and Lenses for Optical Lithography beyond the Diffraction Limit: A Review
期刊论文
OAI收割
MICROMACHINES, 2016, 卷号: 7, 期号: 7
作者:
Wang, Changtao
;
Zhang, Wei
;
Zhao, Zeyu
;
Wang, Yanqin
;
Gao, Ping
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2016/11/15
surface plasmon polaritons
bulk plasmon polaritons
diffraction limit
subwavelength optics
near-field optics
metamaterial
super resolution
nano optical lithography
nanostructure fabrication
Nanoprobes for super-resolution fluorescence imaging at the nanoscale
期刊论文
OAI收割
SCIENCE CHINA-CHEMISTRY, 2014, 卷号: 57, 期号: 1, 页码: 100—106
Hou, SG
;
Liang, L
;
Deng, SH
;
Chen, JF
;
Huang, Q
;
Cheng, Y
;
Fan, CH
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2015/03/13
RESONANCE ENERGY-TRANSFER
DIFFRACTION RESOLUTION LIMIT
FIELD OPTICAL NANOSCOPY
GROUND-STATE-DEPLETION
CDSE/ZNS QUANTUM DOTS
STED MICROSCOPY
LOCALIZATION MICROSCOPY
STIMULATED-EMISSION
SCALE RESOLUTION
LIVING CELLS
Parabolic approximation analytical model of super-resolution spot generation using nonlinear thin films: Theory and simulation
期刊论文
OAI收割
opt. commun., 2014, 卷号: 316, 页码: 220
作者:
Wang, Rui
;
Wei, Jingsong
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2016/11/28
Optical nonlinearity
Diffraction limit
Super-resolution
Strong nonlinear saturation absorption-induced optical pinhole channel and super-resolution effects: a multi-layer system model
期刊论文
OAI收割
opt. lett., 2014, 卷号: 39, 期号: 22, 页码: 6387
作者:
Wei, Jingsong
;
Yan, Hui
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2016/11/28
DIFFRACTION LIMIT
ABSORBENCY-MODULATION
SATURABLE ABSORPTION
SPOT
MICROSCOPY
RESOLUTION
Parabolic approximation analytical model of super-resolution spot generation using nonlinear thin films: Theory and simulation
期刊论文
OAI收割
opt. commun., 2014, 卷号: 316, 页码: 220
作者:
Wang, Rui
;
Wei, Jingsong
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2016/11/28
Optical nonlinearity
Diffraction limit
Super-resolution
Strong nonlinear saturation absorption-induced optical pinhole channel and super-resolution effects: a multi-layer system model
期刊论文
OAI收割
opt. lett., 2014, 卷号: 39, 期号: 22, 页码: 6387
作者:
Wei, Jingsong
;
Yan, Hui
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2016/11/28
DIFFRACTION LIMIT
ABSORBENCY-MODULATION
SATURABLE ABSORPTION
SPOT
MICROSCOPY
RESOLUTION
Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE)
会议论文
OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Yang P.
;
Ai H.
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2013/03/25
Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules
allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity
polarization
phase plate
primary aberrations
STED pulse shape
pulse duration and delay time. In this paper
we found related models and simulate the relationship between the depletion patterns and the parameters
and put forward effective approach to enhance the system resolution. 2010 SPIE.
Resolution performance of extreme ultraviolet telescope (EI CONFERENCE)
会议论文
OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China
作者:
Yang L.
;
Chen B.
;
Chen B.
;
Liang J.-Q.
;
Ni Q.-L.
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2013/03/25
Extreme Ultraviolet Telescope (EUT) will image solar corona in four EUV narrow bandpasses defined by multilayered coatings deposited on normal incidence optics. In order to make sure it will get sub-arcsecond angular resolution in the mission we have to test its resolution performance on ground. The EUT is aligned by Zygo interferometer first and a global wavefront error of 0.152 peak to valley is obtained ( = 632.8nm ). Because of the difficulty of angular resolution test for EUT at its operating wavelengths
we test its optical performance at visible and UV band. The method is to place the resolution test-target on the focal plane of collimator and illuminate the target by visible and UV light espectively
then the collimated light will go through EUT and image at focal plane on CCD. By analysis of the images obtained in experiments we conclude that the angular resolution of EUT is 1.22 at visible light ( = 570nm ) which is very close to diffraction limit (1.20) and according to these results we estimate that the operational wavelength resolution is better than 0.32
meets design requirements. While for UV light
the angular resolution is 1.53 that is different from diffraction limit (0.53)
the error comes mainly from large pixel of EUV camera. 2009 SPIE.