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Chinese Academy of Sciences Institutional Repositories Grid
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Plasmonic Interference Lithography for Low-Cost Fabrication of Dense Lines with Sub-50 nm Half-Pitch 期刊论文  OAI收割
ACS Applied Nano Materials, 2019, 卷号: 2, 期号: 1, 页码: 489-496
作者:  
Kong, Weijie;  Luo, Yunfei;  Zhao, Chengwei;  Liu, Ling;  Gao, Ping
  |  收藏  |  浏览/下载:31/0  |  提交时间:2021/05/06
Effects of donor and acceptor's fluorescence lifetimes on the method of applying Forster resonance energy transfer in STED microscopy 期刊论文  OAI收割
JOURNAL OF MICROSCOPY, 2018, 卷号: 269, 期号: 1, 页码: 59-65
作者:  
  |  收藏  |  浏览/下载:46/0  |  提交时间:2018/09/06
Plasmonic Structures, Materials and Lenses for Optical Lithography beyond the Diffraction Limit: A Review 期刊论文  OAI收割
MICROMACHINES, 2016, 卷号: 7, 期号: 7
作者:  
Wang, Changtao;  Zhang, Wei;  Zhao, Zeyu;  Wang, Yanqin;  Gao, Ping
收藏  |  浏览/下载:29/0  |  提交时间:2016/11/15
Nanoprobes for super-resolution fluorescence imaging at the nanoscale 期刊论文  OAI收割
SCIENCE CHINA-CHEMISTRY, 2014, 卷号: 57, 期号: 1, 页码: 100—106
Hou, SG; Liang, L; Deng, SH; Chen, JF; Huang, Q; Cheng, Y; Fan, CH
收藏  |  浏览/下载:25/0  |  提交时间:2015/03/13
Parabolic approximation analytical model of super-resolution spot generation using nonlinear thin films: Theory and simulation 期刊论文  OAI收割
opt. commun., 2014, 卷号: 316, 页码: 220
作者:  
Wang, Rui;  Wei, Jingsong
收藏  |  浏览/下载:28/0  |  提交时间:2016/11/28
Strong nonlinear saturation absorption-induced optical pinhole channel and super-resolution effects: a multi-layer system model 期刊论文  OAI收割
opt. lett., 2014, 卷号: 39, 期号: 22, 页码: 6387
作者:  
Wei, Jingsong;  Yan, Hui
收藏  |  浏览/下载:17/0  |  提交时间:2016/11/28
Parabolic approximation analytical model of super-resolution spot generation using nonlinear thin films: Theory and simulation 期刊论文  OAI收割
opt. commun., 2014, 卷号: 316, 页码: 220
作者:  
Wang, Rui;  Wei, Jingsong
收藏  |  浏览/下载:22/0  |  提交时间:2016/11/28
Strong nonlinear saturation absorption-induced optical pinhole channel and super-resolution effects: a multi-layer system model 期刊论文  OAI收割
opt. lett., 2014, 卷号: 39, 期号: 22, 页码: 6387
作者:  
Wei, Jingsong;  Yan, Hui
收藏  |  浏览/下载:26/0  |  提交时间:2016/11/28
Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE) 会议论文  OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Yang P.; Ai H.
收藏  |  浏览/下载:22/0  |  提交时间:2013/03/25
Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules  allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity  polarization  phase plate  primary aberrations  STED pulse shape  pulse duration and delay time. In this paper  we found related models and simulate the relationship between the depletion patterns and the parameters  and put forward effective approach to enhance the system resolution. 2010 SPIE.  
Resolution performance of extreme ultraviolet telescope (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Yang L.;  Chen B.;  Chen B.;  Liang J.-Q.;  Ni Q.-L.
收藏  |  浏览/下载:28/0  |  提交时间:2013/03/25
Extreme Ultraviolet Telescope (EUT) will image solar corona in four EUV narrow bandpasses defined by multilayered coatings deposited on normal incidence optics. In order to make sure it will get sub-arcsecond angular resolution in the mission we have to test its resolution performance on ground. The EUT is aligned by Zygo interferometer first and a global wavefront error of 0.152 peak to valley is obtained ( = 632.8nm ). Because of the difficulty of angular resolution test for EUT at its operating wavelengths  we test its optical performance at visible and UV band. The method is to place the resolution test-target on the focal plane of collimator and illuminate the target by visible and UV light espectively  then the collimated light will go through EUT and image at focal plane on CCD. By analysis of the images obtained in experiments we conclude that the angular resolution of EUT is 1.22 at visible light ( = 570nm ) which is very close to diffraction limit (1.20) and according to these results we estimate that the operational wavelength resolution is better than 0.32  meets design requirements. While for UV light  the angular resolution is 1.53 that is different from diffraction limit (0.53)  the error comes mainly from large pixel of EUV camera. 2009 SPIE.