机构

• 金属研究所 [4]
• 物理研究所 [3]
• 长春光学精密机械与物... [3]
• 长春应用化学研究所 [3]
• 宁波材料技术与工程研... [1]

采集方式

• OAI收割 [14]

内容类型

• 期刊论文 [11]
• 会议论文 [3]

发表日期

• 2021 [1]
• 2014 [1]
• 2010 [1]
• 2009 [1]
• 2008 [1]
• 2006 [1]
• 更多

学科主题

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浏览/检索结果: 共14条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Deep Bayesian local crystallography 期刊论文  OAI收割 NPJ COMPUTATIONAL MATERIALS, 2021, 卷号: 7, 期号: 1 作者:  Kalinin, Sergei, V;  Oxley, Mark P.;  Valleti, Mani;  Zhang, Junjie;  Hermann, Raphael P.   |  收藏  |  浏览/下载：19/0  |  提交时间：2021/12/01 ELECTRON-MICROSCOPY IMAGES  GEOMETRIC PHASE-ANALYSIS  CHEMICAL-IDENTIFICATION  MACROSCOPIC SYMMETRY  MAGNETIC-PROPERTIES  UNIT-CELL  RESOLUTION  CRYSTALS  GLASSES  PHYSICS   Deformation-induced structural transition in body-centred cubic molybdenum 期刊论文  OAI收割 Nature Communications, 2014, 卷号: 5 S. J. Wang; H. Wang; K. Du; W. Zhang; M. L. Sui; S. X. Mao 收藏  |  浏览/下载：44/0  |  提交时间：2014/07/03 molecular-dynamics simulation  electron-microscopy  phase-transitions  strength  metals  images  compression  diffraction  crystals  nickel   Expansion of interatomic distances in platinum catalyst nanoparticles 期刊论文  OAI收割 Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845 K. Du; F. Emst; M. C. Pelsozy; J. Barthel; K. Tillmann 收藏  |  浏览/下载：94/0  |  提交时间：2012/04/13 Nanoparticles  Catalysts  Atomistic structure  Quantitative  high-resolution transmission electron microscopy  Spherical-aberration-adjusted transmission electron microscopy  transmission electron-micrographs  pt-co electrocatalysts  oxygen  reduction  spherical-aberration  lattice-parameters  atomic-resolution  materials science  surface-tension  hrem images  in-situ   On the accuracy of maximum entropy reconstruction of high-resolution Z-contrast STEM images 期刊论文  OAI收割 Micron, 2009, 卷号: 40, 期号: 2, 页码: 247-254 X. H. Sang; K. Du; M. J. Zhuo; H. Q. Ye 收藏  |  浏览/下载：25/0  |  提交时间：2012/04/13 Scanning transmission electron microscopy  High-angle annular dark-field  image (HAADF)  Image processing  Quantitative electron microscopy  transmission electron-microscopy  dark-field images  grain-boundaries  adf stem  chemistry  silicon   Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the 0(1)over-bar10 orientation 期刊论文  OAI收割 Journal of Microscopy, 2008, 卷号: 232, 期号: 1, 页码: 137-144 K. Du; M. Ruhle 收藏  |  浏览/下载：18/0  |  提交时间：2012/04/13 high-resolution transmission electron microscopy  image simulation  quantitative electron microscopy  sapphire  crystal defect structures  hrem images  interfaces  hrtem  retrieval  alpha-al2o3  microscopy  evolution  package  films   Crystal structure determination by maximum entropy image deconvolution in combination with image simulation 期刊论文  OAI收割 Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials, 2006, 卷号: 211, 页码: 533 Wang, YM; Wang, HB; Li, FH 收藏  |  浏览/下载：21/0  |  提交时间：2013/09/17 RESOLUTION ELECTRON-MICROSCOPY  FOURIER IMAGES   Investigation of growth mode in ZnO thin films prepared at different temperature by plasma-molecular beam epitaxy (EI CONFERENCE) 会议论文  OAI收割 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004 Liang H. W.; Lu Y. M.; Shen D. Z.; Yan J. F.; Li B. H.; Zhang J. Y.; Liu Y. C.; Fan X. W. 收藏  |  浏览/下载：35/0  |  提交时间：2013/03/25 High-quality ZnO thin films on c-plane sapphire (Al2O 3) substrates were prepared by plasma-molecular beam epitaxy (P-MBE). The influence of growth temperature on growth mode of ZnO was investigated. Real-time monitored by reflection high-energy electron diffraction (RHEED) images show that  below 500 C  ZnO thin film was grown by three-dimension (3D) growth mode. While the two-dimension (2D) growth mode was obtained above growth temperature of 650 C. Atomic force microscopy (AFM) images present that the surface morphology of ZnO thin film with 2D growth is improved and X-ray rocking curves (XRC) indicate that the full width at half maximum (FWHM) of the ZnO (0 0 2) peak becomes narrow. From the photoluminescence (PL) spectra  ultraviolet (UV) emission peak exhibits obvious blue-shift for the samples grown at lower temperature  which is attributed to the effect of the quantum confinement arisen from small crystal grain sizes. The minimum carrier concentration of N=7.661016 cm-3 was obtained in the ZnO thin films with the 2D grown  which is closed to that of bulk ZnO. 2005 Elsevier B.V. All rights reserved.   Electrophoretic deposition and field emission properties of patterned carbon nanotubes (EI CONFERENCE) 会议论文  OAI收割 Zhao H.; H S.; Z L.; G Y.; Y J. 收藏  |  浏览/下载：17/0  |  提交时间：2013/03/25 Patterned carbon nanotubes on silicon substrates were obtained using electrophoretic method. The carbon nanotubes migrated towards the patterned silicon electrode in the electrophoresis suspension under the applied voltage. The carbon nanotubes arrays adhered well on the silicon substrates. The surface images of carbon nanotubes were observed by scanning electron microscopy. The field emission properties of the patterned carbon nanotubes were tested in a diode structure under a vacuum pressure below 5 10-4 Pa. The measured emission area was about 1.0 mm2. The emission current density up to 30 mA/cm2 at an electric field of 8 V/m has been obtained. The deposition of patterned carbon nanotubes by electrophoresis is an alternative method to prepare field emission arrays. 2005 Elsevier B.V. All rights reserved.   Maximum entropy image deconvolution applied to structure determination for crystal Nd1.85Ce0.15CuO4-delta 期刊论文  OAI收割 MICRON, 2005, 卷号: 36, 期号: 5, 页码: 393 Wang, YM; Wang, HB; Li, FH; Jia, LS; Chen, XL 收藏  |  浏览/下载：22/0  |  提交时间：2013/09/18 RESOLUTION ELECTRON-MICROSCOPY  EXIT WAVE RECONSTRUCTION  SINGLE-CRYSTALS  FOURIER IMAGES  ND2CUO4  GROWTH  HREM   Patterned deposition and field emission properties of carbon nanotubes by electrophoresis (EI CONFERENCE) 会议论文  OAI收割 IVESC2004 - 5th International Vacuum Electron Sources Conference Proceedings, September 6, 2004 - September 10, 2004, Beijing, China 作者:  Li Z.;  Li Z.;  Song H. 收藏  |  浏览/下载：21/0  |  提交时间：2013/03/25 Multi-wall carbon nanotubes were deposited on the patterned silicon substrates using electrophoretic deposition. The surface images of carbon nanotubes on substrate were observed by scanning electron microscopy. Field emission properties have been tested with a diode structure in a vacuum chamber below 510-4 Pa. The emission area measured is 1.0mm 2. Emission current density up to 30mA/cm2 at an electric field of 8V/m has been obtained. Patterned deposition of carbon nanotubes by electrophoresis is a potential method to prepare field emission arrays. 2004 IEEE.