中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
计算技术研究所 [4]
物理研究所 [2]
近代物理研究所 [2]
化学研究所 [1]
新疆理化技术研究所 [1]
上海技术物理研究所 [1]
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采集方式
OAI收割 [11]
内容类型
期刊论文 [11]
发表日期
2023 [1]
2022 [1]
2020 [1]
2019 [3]
2017 [1]
2014 [1]
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学科主题
Physics [1]
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FeCrypto: Instruction Set Architecture for Cryptographic Algorithms Based on FeFET-Based In-Memory Computing
期刊论文
OAI收割
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2023, 卷号: 42, 期号: 9, 页码: 2889-2902
作者:
Liu, Rui
  |  
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2023/12/04
Computing-in-memory (CiM)
cryptographic algorithm
ferroelectric field-effect transistor (FeFET)
instruc-tion set architecture (ISA)
Re-FeMAT: A Reconfigurable Multifunctional FeFET-Based Memory Architecture
期刊论文
OAI收割
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2022, 卷号: 41, 期号: 11, 页码: 5071-5084
作者:
Zhang, Xiaoyu
;
Liu, Rui
;
Song, Tao
;
Yang, Yuxin
;
Han, Yinhe
  |  
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2023/07/12
Convolutional neural network (CNN)
ferroelectric field-effect transistor (FeFET)
few-shot learning
in-memory processing
ternary content-addressable memory (TCAM)
The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures
期刊论文
OAI收割
IEEE DESIGN & TEST, 2020, 卷号: 37, 期号: 1, 页码: 79-99
作者:
Chen, Xiaoming
;
Sun, Xiaoyu
;
Wang, Panni
;
Datta, Suman
;
Hu, Xiaobo Sharon
  |  
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2020/12/10
Iron
Transistors
Computer architecture
Switches
Capacitance
Logic gates
Computational modeling
Ferroelectric Field Effect Transistor
FeFET
Negative Capacitance Field Effect Transistor
NCFET
Preisach model
FPGAs
content addressable memories
CAM
TCAM
compute-in-memory
analog synapse
Effects of total ionizing dose on single event effect sensitivity of FRAMs
期刊论文
OAI收割
MICROELECTRONICS RELIABILITY, 2019, 卷号: 95, 页码: 1-7
作者:
Ji, Qinggang
;
Liu, Jie
;
Li, Dongqing
;
Liu, Tianqi
;
Ye, Bing
  |  
收藏
  |  
浏览/下载:58/0
  |  
提交时间:2019/11/10
Ferroelectric random access memory
Total ionizing dose
Single event effect
TCAD simulation
Ferroelectric FETs-Based Nonvolatile Logic-in-Memory Circuits
期刊论文
OAI收割
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2019, 卷号: 27, 期号: 1, 页码: 159-172
作者:
Chen, Xiaoming
;
Niemier, Michael
;
Hu, Xiaobo Sharon
;
Yin, Xunzhao
  |  
收藏
  |  
浏览/下载:83/0
  |  
提交时间:2019/04/03
Ferroelectric FET (FeFET)
logic-in-memory (LiM)
nonvolatile (NV) memory
Solution-Processed Flexible Organic Ferroelectric Phototransistor
期刊论文
OAI收割
ACS APPLIED MATERIALS & INTERFACES, 2017, 卷号: 9, 期号: 50, 页码: 43880-43885
作者:
Zhao, Qiang
;
Wang, Hanlin
;
Jiang, Lang
;
Zhen, Yonggang
;
Dong, Huanli
  |  
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2019/04/09
p(Vdf-trfe)
Nonvolatile Memory (Nvm)
Organic Ferroelectric Field-effect Transistor (Ofefet)
Organic Phototransistor (Opt)
Organic Field-effect Transistor (Ofet)
An Epitaxial Ferroelectric Tunnel Junction on Silicon
期刊论文
OAI收割
ADVANCED MATERIALS, 2014, 卷号: 26, 期号: 42, 页码: 7185
Li, ZP
;
Guo, X
;
Lu, HB
;
Zhang, ZL
;
Song, DS
;
Cheng, SB
;
Bosman, M
;
Zhu, J
;
Dong, ZL
;
Zhu, WG
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2015/04/14
ferroelectric tunnel junction
non-volatile memory
tunneling electroresistance
epitaxial growth
pulsed laser deposition
serial ferroelectric memory ionizing radiation effects and annealing characteristics
期刊论文
OAI收割
ACTA PHYSICA SINICA, 2013, 卷号: 62, 期号: 15, 页码: -
作者:
Zhang Xing-Yao
;
Guo Qi
;
Lu Wu
;
Zhang Xiao-Fu
;
Zheng Qi-Wen
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2013/11/07
ferroelectric random memory
ionizing radiation effects
annealing characteristics
Ferroelectric Random Access Memories
期刊论文
OAI收割
Journal of Nanoscience and Nanotechnology, 2012, 卷号: 12, 期号: 10, 页码: 7619-7627
-
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2016/05/16
Ferroelectric
Memory
FeRAM
FeFET
Pb(Zr,Ti)O-3
SrBi2Ta2O9
BiFeO3