机构

• 近代物理研究所 [18]
• 高能物理研究所 [2]
• 上海应用物理研究所 [1]
• 合肥物质科学研究院 [1]

采集方式

• OAI收割 [21]
• iSwitch采集 [1]

内容类型

• 期刊论文 [16]
• 会议论文 [6]

发表日期

• 2020 [2]
• 2019 [1]
• 2017 [6]
• 2016 [1]
• 2014 [1]
• 2012 [2]
• 更多

学科主题

• Instrument... [1]

筛选

浏览/检索结果: 共22条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Research on the Single Event Effect of CCD Analog Front-end for Satellite-borne directional polarization camera 会议论文  OAI收割 Shanghai, China, 2020-10-17-2020-10-20 作者:  Ping-ping Yao;  Zhengyu Zou;  Zhilong Xu;  Donggen Luo;  Jin Hong   |  收藏  |  浏览/下载：85/0  |  提交时间：2021/12/10 Directional Polarimetric Camera  CCD imaging system  Image processing  single event effects  high-energy particles  single event latch-up  heavy-ion  Analog front end   Effects of high energy heavy ion irradiation on resistive switches 期刊论文  OAI收割 MICROELECTRONIC ENGINEERING, 2020, 卷号: 231, 页码: 6 作者:  Guo, Xiangyu;  Liu, Jiande;  Wang, Qi;  He, Deyan   |  收藏  |  浏览/下载：25/0  |  提交时间：2021/12/15 Resistive switching  High energy heavy ion  Concentrated defects  Switching behavior   Beam optics of upgraded high energy heavy ion microbeam in Lanzhou 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 461, 页码: 10-15 作者:  Ponomarov, Artem;  Du, Guanghua;  Guo, Jinlong;  Liu, Wenjing;  Wu, Ruqun   |  收藏  |  浏览/下载：35/0  |  提交时间：2022/01/19 High energy heavy ion microbeam  Spatial resolution  Beam optics simulation  Cyclotron  Carbon therapy  Single event upset   Recent advances of microbial breeding via heavy-ion mutagenesis at IMP 期刊论文  OAI收割 LETTERS IN APPLIED MICROBIOLOGY, 2017, 卷号: 65, 页码: 274-280 作者:  Hu, W.;  Li, W.;  Chen, J.   |  收藏  |  浏览/下载：22/0  |  提交时间：2018/05/31 bioindustry  heavy-ion beam  high linear energy transfer  microbial breeding  mutagenesis   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258 作者:  Wang, Bin;  Liu, Tianqi;  Liu, Jie;  Yang, Zhenlei;  Guo, Jinlong   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/05/31 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 会议论文  OAI收割 作者:  Su, Hong;  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/08/20 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   Application of seu imaging for analysis of device architecture using a 25 mev/u kr-86 ion microbeam at hirfl 期刊论文  iSwitch采集 Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2017, 卷号: 404, 页码: 254-258 作者:  Liu, Tianqi;  Yang, Zhenlei;  Guo, Jinlong;  Du, Guanghua;  Tong, Teng 收藏  |  浏览/下载：102/0  |  提交时间：2019/04/23 Heavy-ion microbeam  High-energy  Single event upset  Fpga  Imaging   Application of SEU imaging for analysis of device architecture using a 25 MeV/u Kr-86 ion microbeam at HIRFL 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 404, 页码: 254-258 作者:  Tong T(童腾);  Liu, J;  Ye, B;  Wang, B;  Liu, JD   |  收藏  |  浏览/下载：35/0  |  提交时间：2019/08/27 Heavy-ion microbeam  High-energy  Single event upset  FPGA  Imaging   X-ray emission from 424-MeV/u C ions impacting on selected target 期刊论文  OAI收割 CHINESE PHYSICS B, 2016, 卷号: 25, 页码: 5 作者:  Cheng, Rui;  Lei, Yu;  Sun, Yuan-Bo;  Wang, Yu-Yu;  Wang, Xing   |  收藏  |  浏览/下载：40/0  |  提交时间：2017/03/24 High Energy Heavy Ions  Ion-atom Collisions  X-ray Emission