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	In situ X-ray imaging of fatigue crack growth from multiple defects in additively manufactured AlSi10Mg alloy 期刊论文 OAI收割 INTERNATIONAL JOURNAL OF FATIGUE, 2022, 卷号: 155, 页码: 13 作者: Qian, Weijian; Wu, Shengchuan; Wu, Zhengkai; Ahmed, Saad; Zhang, Wen \| 收藏 \| 浏览/下载：56/0 \| 提交时间：2022/06/11 Additive manufacturing (AM) Multiple defects Synchrotron X-ray micro computed & nbsp Fatigue crack growth prediction AlSi10Mg alloys tomography ( mu CT)
	Void formation and failure in InGaN/AlGaN double heterostructures 期刊论文 OAI收割 JOURNAL OF CRYSTAL GROWTH, 2003, 卷号: 253, 期号: 1-4, 页码: 404 Wang, YG; Li, W; Han, PD; Zhang, Z 收藏 \| 浏览/下载：19/0 \| 提交时间：2013/09/23 LIGHT-EMITTING-DIODES MULTIPLE-QUANTUM WELLS THREADING EDGE DISLOCATION VAPOR-PHASE EPITAXY N-TYPE GAN GALLIUM NITRIDE GROWTH STOICHIOMETRY SCATTERING DEFECTS LUMINESCENCE
	Void formation and failure in InGaN/AlGaN double heterostructures 期刊论文 OAI收割 journal of crystal growth, 2003, 卷号: 253, 期号: 1-4, 页码: 404-412 作者: Han PD 收藏 \| 浏览/下载：214/2 \| 提交时间：2010/08/12 defects metalorganic vapor phase epitaxy nitrides semiconducting III-V materials light emitting diodes LIGHT-EMITTING-DIODES MULTIPLE-QUANTUM WELLS THREADING EDGE DISLOCATION VAPOR-PHASE EPITAXY N-TYPE GAN GALLIUM NITRIDE GROWTH STOICHIOMETRY SCATTERING DEFECTS LUMINESCENCE