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	Profile controlling technologies in ITER BTCC U-shaped case manufacturing process 期刊论文 OAI收割 FUSION ENGINEERING AND DESIGN, 2022, 卷号: 179 作者: Feng, Siqing; Song, Yuntao; Wei, Jing; Yin, Dapeng; Liu, Peng \| 收藏 \| 浏览/下载：28/0 \| 提交时间：2022/12/23 BTCC U-shaped case Profile controlling Segmenting Welding Residual stress treatment
	Morphology and controlling factors of the longitudinal profile of gullies in the Yuanmou dry-hot valley 期刊论文 OAI收割 JOURNAL OF MOUNTAIN SCIENCE, 2017, 卷号: 14, 期号: 4, 页码: 674-693 作者: Ding Lin; Qin Fa-chao; Fang Hai-dong; Liu Hui; Zhang Bin \| 收藏 \| 浏览/下载：38/0 \| 提交时间：2017/04/07 Gully Longitudinal Profile Morphological Characteristics Soil Erosion Gully Erosion Controlling Factors Dry-hot Valley
	Spatio-temporal variability and temporal stability of water contents distributed within soil profiles at a hillslope scale 期刊论文 iSwitch采集 CATENA, 2015, 卷号: 132, 页码: 29-36 作者: Gao, Lei; Shao, Mingan; Peng, Xinhua; She, Dongli 收藏 \| 浏览/下载：39/0 \| 提交时间：2019/10/10 Profile soil water content Controlling factor Hillslope hydrology Rainwater replenishment depth Semi-arid area
	Spatio-temporal variability and temporal stability of water contents distributed within soil profiles at a hillslope scale SCI/SSCI论文 OAI收割 2015 作者: Gao L.; Shao, M. G.; Peng, X. H.; She, D. L. 收藏 \| 浏览/下载：30/0 \| 提交时间：2015/12/09 Profile soil water content Controlling factor Hillslope hydrology Rainwater replenishment depth Semi-arid area remote-sensing footprints loess plateau moisture variability spatial-patterns neutron probe storage china time surface layers
	Fabrication of multilayer laminar grating with high efficiency for extreme ultraviolet (EI CONFERENCE) 会议论文 OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者: Jin C.-S.; Zhang L.-C. 收藏 \| 浏览/下载：22/0 \| 提交时间：2013/03/25 The main goal for investigations on multilayer laminar gratings working at the EUV region is to enhance their efficiency. In this article second third we demonstrate a routine to fabricate multilayer laminar gratings with high efficiency. This routine comprises three steps: first optimizing fabricating techniques to obtain multilayer coatings with high reflectivity strictly controlling errors of multilayer grating parameters to ensure the coinciding of the optical performance with the expectation. Results demonstrate that this routine is feasible. The measured peak efficiency of -1 order at 12.8nm was 14.3%. Some related issues about efficiency curves such as wavelength separation and suppression of zero order are discussed. preparing grating substrates with ideal groove profile and low roughness by holographic recording and ion beam etching process
	Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Zhou C.; Li H.; Chen C.; Zhou C.; Qian S. 收藏 \| 浏览/下载：36/0 \| 提交时间：2013/03/25 Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle optical system mechanical constructions DC serve motor control system array detector data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy low cost multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.