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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [10]
金属研究所 [6]
物理研究所 [4]
光电技术研究所 [2]
长春光学精密机械与物... [1]
大连化学物理研究所 [1]
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OAI收割 [19]
iSwitch采集 [7]
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期刊论文 [23]
会议论文 [3]
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2018 [1]
2017 [1]
2013 [1]
2011 [7]
2010 [6]
2005 [1]
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学科主题
半导体材料 [3]
Formaldehy... [1]
光电子学 [1]
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NiCrNxinterlayer thickness dependence of spectral performance and environmental durability of protected-silver mirrors
期刊论文
OAI收割
Optical Engineering, 2018, 卷号: 57, 期号: 4, 页码: 045101
作者:
Xu, Xu
;
Li, Bincheng
;
He, Wenyan
;
Wang, Changjun
;
Wei, Ming
  |  
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2019/08/23
Chromium compounds
Corrosion protection
Corrosion resistance
Durability
Environmental testing
Mirrors
Reflection
Scanning electron microscopy
Silver
SiNx thickness dependence of spectral properties and durability of protected-silver mirrors
期刊论文
OAI收割
Surface and Coatings Technology, 2017, 卷号: 324, 页码: 175-181
作者:
Xu, Xu
;
He, Wenyan
;
Wang, Changjun
;
Wei, Ming
;
Li, Bincheng
  |  
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2018/11/20
Corrosion - Corrosion resistance - Environmental testing - Mirrors - Protective coatings - Reflection - Scanning electron microscopy - Silicon nitride - Silver
In situ diffuse reflectance fourier transform infrared spectroscopy (DRIFTS) study of formaldehyde adsorption and reactions on Pd-doped nano-纬-Fe2O3 Films
会议论文
OAI收割
作者:
Huang, Kaijin
;
Kong, Lingcong
;
Yuan, Fangli
;
Xie, Changsheng
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2023/06/16
Acetal resins - Fourier transform infrared spectroscopy - Hematite - Scanning electron microscopy - Alumina - X ray diffraction - Chemical sensors - Screen printing - Aluminum oxide - Reflection
Vi/ii ratio-dependent growth and photoluminescence of cubic cdse epilayers by molecular beam epitaxy
期刊论文
iSwitch采集
Journal of crystal growth, 2011, 卷号: 329, 期号: 1, 页码: 1-5
作者:
Zhao, Jie
;
Zeng, Yiping
;
Yang, Qiumin
;
Li, Yiyang
;
Cui, Lijie
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2019/05/12
Reflection high-energy electron diffraction
X-ray diffraction
Atomic force microscopy
Molecular beam epitaxy
Cadmium compounds
Semiconducting ii-vi materials
Growth and annealing of zinc-blende cdse thin films on gaas (001) by molecular beam epitaxy
期刊论文
iSwitch采集
Applied surface science, 2011, 卷号: 257, 期号: 21, 页码: 9038-9043
作者:
Yang, Qiumin
;
Zhao, Jie
;
Guan, Min
;
Liu, Chao
;
Cui, Lijie
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2019/05/12
Cdse
Molecular beam epitaxy
Reflection high energy electron diffraction
X-ray diffraction
Atomic force microscopy
VI/II ratio-dependent growth and photoluminescence of cubic CdSe epilayers by molecular beam epitaxy
期刊论文
OAI收割
JOURNAL OF CRYSTAL GROWTH, 2011, 卷号: 329, 期号: 1, 页码: 1-5
作者:
Zhao, Jie
;
Zeng, Yiping
;
Yang, Qiumin
;
Li, Yiyang
;
Cui, Lijie
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2021/02/02
Reflection high-energy electron diffraction
X-ray diffraction
Atomic force microscopy
Molecular beam epitaxy
Cadmium compounds
Semiconducting II-VI materials
VI/II ratio-dependent growth and photoluminescence of cubic CdSe epilayers by molecular beam epitaxy
期刊论文
OAI收割
JOURNAL OF CRYSTAL GROWTH, 2011, 卷号: 329, 期号: 1, 页码: 1-5
作者:
Zhao, Jie
;
Zeng, Yiping
;
Yang, Qiumin
;
Li, Yiyang
;
Cui, Lijie
  |  
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2021/02/02
Reflection high-energy electron diffraction
X-ray diffraction
Atomic force microscopy
Molecular beam epitaxy
Cadmium compounds
Semiconducting II-VI materials
Growth and annealing of zinc-blende CdSe thin films on GaAs (001) by molecular beam epitaxy
期刊论文
OAI收割
APPLIED SURFACE SCIENCE, 2011, 卷号: 257, 期号: 21, 页码: 9038-9043
作者:
Yang, Qiumin
;
Zhao, Jie
;
Guan, Min
;
Liu, Chao
;
Cui, Lijie
  |  
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/02
CdSe
Molecular beam epitaxy
Reflection high energy electron diffraction
X-ray diffraction
Atomic force microscopy
Growth and annealing of zinc-blende CdSe thin films on GaAs (001) by molecular beam epitaxy
期刊论文
OAI收割
APPLIED SURFACE SCIENCE, 2011, 卷号: 257, 期号: 21, 页码: 9038-9043
作者:
Yang, Qiumin
;
Zhao, Jie
;
Guan, Min
;
Liu, Chao
;
Cui, Lijie
  |  
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2021/02/02
CdSe
Molecular beam epitaxy
Reflection high energy electron diffraction
X-ray diffraction
Atomic force microscopy
Structures and optical characteristics of InGaN quantum dots grown by MBE
期刊论文
OAI收割
xiyou jinshu cailiao yu gongcheng/rare metal materials and engineering, 2011, 卷号: 40, 期号: 11, 页码: 2030-2032
Wang, Baozhu
;
Yan, Cuiying
;
Wang, Xiaoliang
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2012/06/14
Atomic force microscopy
Gallium nitride
Molecular beam epitaxy
Optical materials
Optical properties
Reflection high energy electron diffraction
Sapphire