机构

• 高能物理研究所 [3]
• 长春光学精密机械与物... [2]
• 半导体研究所 [2]
• 近代物理研究所 [2]
• 光电技术研究所 [1]
• 中国科学院大学 [1]
• 更多

采集方式

• OAI收割 [9]
• iSwitch采集 [2]

内容类型

• 期刊论文 [8]
• 会议论文 [3]

发表日期

• 2022 [1]
• 2016 [2]
• 2011 [1]
• 2010 [1]
• 2009 [5]
• 2005 [1]
• 更多

学科主题

• Chemistry [1]
• Metallurgy... [1]
• 半导体物理 [1]

筛选

浏览/检索结果: 共11条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Effect of heavy ion irradiation on the interface traps of AlGaN/GaN high electron mobility transistors 期刊论文  OAI收割 CHINESE PHYSICS B, 2022, 卷号: 31, 期号: 3, 页码: 6 作者:  Lin, Zheng-Zhao;  Lu, Ling;  Zheng, Xue-Feng;  Cao, Yan-Rong;  Hu, Pei-Pei   |  收藏  |  浏览/下载：64/0  |  提交时间：2022/04/11 gallium nitride  radiation effects  defects  pulse testing   Single-event transient characterization of a radiation-tolerant charge-pump phase-locked loop fabricated in 130 nm pd-soi technology 期刊论文  iSwitch采集 Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 4, 页码: 2402-2408 作者:  Chen, Zhuojun;  Lin, Min;  Zheng, Yunlong;  Wei, Zuodong;  Huang, Shuigen 收藏  |  浏览/下载：46/0  |  提交时间：2019/05/09 Heavy-ion testing  Pd-soi  Phase-locked loop  Pulsed-laser testing  Radiation hardening by design  Single-event transients   Performance test and image correction of CMOS image sensor in radiation environment 期刊论文  OAI收割 Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment, 2016, 卷号: 9684, 页码: 96841H 作者:  Wang, Congzheng;  Hu, Song;  Gao, Chunming;  Feng, Chang   |  收藏  |  浏览/下载：27/0  |  提交时间：2018/06/14 Cmos Integrated Circuits  Digital Cameras  Digital Storage  Equipment  Gamma Rays  Image Reconstruction  Image Sensors  Ionizing Radiation  Manufacture  Optical Data Processing  Optical Testing  Pixels  Radiation  Signal To Noise Ratio   EXPERIENCE OF CYCLOTRON OPERATION WITH BEAM SHARING AT TSL 会议论文  OAI收割 Lanzhou, 2010-09-06 D. M. van Rooyen; E. Blomquist*; K. Gajewski; E. Grusell*; B. Gålnander; B. Lundström   |  收藏  |  浏览/下载：30/0  |  提交时间：2011/07/11 Tsl  Nuclear Physics  Radiation Testing   Design of co-path scanning long trace profiler for measurement of X-ray space optical elements (EI CONFERENCE) 会议论文  OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China Shun L.; Yan G.; Wei Z.; Yang Z. 收藏  |  浏览/下载：27/0  |  提交时间：2013/03/25 The Long Trace Profiler (LTP) is a precision surface slope error measurement instrument used in synchrotron radiation optics for many years. By making some modifications to the LTP system  we developed a co-path scanning LTP (CSLTP) system to test the cylindrical aspherical surface which used in X-ray space optics. To reduce the mistake caused by air turbulence and manufacture faults of optical elements used  the CSLTP is designed with the least difference between the testing beam path and the reference beam path. Also  it uses multiple-beam interference but double beam interference to reduce the width of beam fringe. This improves the position precision of the beam fringe on the image plane. 2010 SPIE.   Lattice polarity detection of inn by circular photogalvanic effect 期刊论文  iSwitch采集 Applied physics letters, 2009, 卷号: 95, 期号: 3, 页码: 3 作者:  Zhang, Q.;  Wang, X. Q.;  He, X. W.;  Yin, C. M.;  Xu, F. J. 收藏  |  浏览/下载：25/0  |  提交时间：2019/05/12 Iii-v semiconductors  Indium compounds  Nondestructive testing  Photoconductivity  Radiation effects  Semiconductor thin films  Wide band gap semiconductors   In Situ Observation of the Microstructure-evolution in Silicon Nitride Ceramics Sintering by Synchrotron Radiation X-ray Computed Tomography 期刊论文  OAI收割 ACTA CHIMICA SINICA, 2009, 卷号: 67, 期号: 11, 页码: 1205-1210 作者:  Xu, F;  Hu, XF;  Zhao, JH;  Yuan, QX;  Yuan QX(袁清习) 收藏  |  浏览/下载：22/0  |  提交时间：2016/06/29 analysis and testing technology of materials  sintering  synchrotron radiation X-ray computed tomography  silicon nitride ceramic  microstructure evolution   In situ observation of grain evolution in ceramic sintering by SR-CT technique 期刊论文  OAI收割 TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 2009, 卷号: 19, 页码: S684-S688 作者:  Xu, F;  Hu, XF;  Niu, Y;  Zhao, JH;  Yuan, QX 收藏  |  浏览/下载：16/0  |  提交时间：2016/06/29 sintering  grain evolution  non-destructive testing  synchrotron radiation X-ray computed tomography   In situ observation of grain evolution in ceramic sintering by SR-CT technique 期刊论文  OAI收割 Transactions of Nonferrous Metals Society of China, 2009, 期号: S3, 页码: 684-688 作者:  Xu F(许峰);  Hu XF(胡小方);  Niu Y(牛玉);  Zhao JH(赵建华);  Yuan QX(袁清习) 收藏  |  浏览/下载：20/0  |  提交时间：2015/12/25 sintering  grain evolution  non-destructive testing  synchrotron radiation X-ray computed tomography   Lattice polarity detection of InN by circular photogalvanic effect 期刊论文  OAI收割 applied physics letters, 2009, 卷号: 95, 期号: 3, 页码: art. no. 031902 Zhang Q; Wang XQ; He XW; Yin CM; Xu FJ; Shen B; Chen YH; Wang ZG; Ishitani Y; Yoshikawa A 收藏  |  浏览/下载：77/0  |  提交时间：2010/03/08 III-V semiconductors  indium compounds  nondestructive testing  photoconductivity  radiation effects  semiconductor thin films  wide band gap semiconductors