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浏览/检索结果: 共13条,第1-10条 帮助

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Subspace tracking method for non-smooth yield surface 期刊论文  OAI收割
COMPUTERS & MATHEMATICS WITH APPLICATIONS, 2021, 卷号: 90, 页码: 125-134
作者:  
Li, Chunguang;  Li, Cuihua;  Zheng, Hong
  |  收藏  |  浏览/下载:33/0  |  提交时间:2021/06/18
Metal-Enhanced Adsorption of High-Density Polyelectrolyte Nucleation-Inducing Seed Layer for Highly Conductive Transparent Ultrathin Metal Films 期刊论文  OAI收割
FRONTIERS IN MATERIALS, 2019, 卷号: 6
作者:  
Wang, Zenggui;  Yang, Xi;  Yang, Zhenhai;  Guo, Wei;  Lin, Liujin
  |  收藏  |  浏览/下载:46/0  |  提交时间:2019/12/18
Improving the Back Electrode Interface Quality of Cu2ZnSn(S,Se)(4) Thin-Film Solar Cells Using a Novel CuAlO2 Buffer Layer 期刊论文  OAI收割
Acs Applied Energy Materials, 2019, 卷号: 2, 期号: 3, 页码: 2230-2237
作者:  
Y.P.Song;  B.Yao;  Y.F.Li;  Z.H.Ding;  R.J.Liu
  |  收藏  |  浏览/下载:38/0  |  提交时间:2020/08/24
Novel transparent, liquid-repellent smooth surfaces with mechanical durability 期刊论文  OAI收割
Chemical Engineering Journal, 2016, 卷号: 296, 页码: 458-465
作者:  
Men XH(门学虎);  Shi, Xiangchen;  Ge B(葛博);  Li, Yuan;  Zhu XT(朱小涛)
收藏  |  浏览/下载:38/0  |  提交时间:2016/08/19
Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者:  
Chen B.;  Chen B.
收藏  |  浏览/下载:37/0  |  提交时间:2013/03/25
A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.  
Research on automatic Hartmann test of membrane mirror (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Zhang P.
收藏  |  浏览/下载:47/0  |  提交时间:2013/03/25
Electrostatic membrane mirror is ultra-lightweight and easy to acquire a large diameter comparing with traditional optical elements  so its development and usage is the trend of future large mirrors. In order to research the control method of the static stretching membrane mirror  the surface configuration must be tested. However  membrane mirror's shape is always changed by variable voltages on the electrodes  and the optical properties of membrane materials using in our experiment are poor  so it is difficult to test membrane mirror by interferometer and null compensator method. To solve this problem  an automatic optical test procedure for membrane mirror is designed based on Hartmann screen method. The optical path includes point light source  CCD camera  splitter and diffuse transmittance screen. The spots' positions on the diffuse transmittance screen are pictured by CCD camera connected with computer  and image segmentation and centroid solving is auto processed. The CCD camera's lens distortion is measured  and fixing coefficients are given to eliminate the spots' positions recording error caused by lens distortion. To process the low sampling Hartmann test results  Zernike polynomial fitting method is applied to smooth the wave front. So low frequency error of the membrane mirror can be measured then. Errors affecting the test accuracy are also analyzed in this paper. The method proposed in this paper provides a reference for surface shape detection in membrane mirror research. 2010 Copyright SPIE - The International Society for Optical Engineering.  
White-light spectral scanning interferometry for surface measurement system (EI CONFERENCE) 会议论文  OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
作者:  
Wang C.
收藏  |  浏览/下载:41/0  |  提交时间:2013/03/25
The paper introduces the white-light spectral scanning interferometry for surface measurement. This interferometry can be used to measure the roughness of both smooth surfaces and those with large step heights. This real-time surface measurement can be achieved using acousto-optic tuneable filtering (AOTF) technique without mechanical scanning. At first  the structure and principle of this interferometry is introduced. Then the algorithm of the surface roughness measurement is proposed. What's more  the experiment with standard test piece is conducted. Compared with the traditional laser-light interferometry  the data shows that the proposed method has a higher accuracy which is proved to be nano-scale. A conclusion is given at last in which the superiorities and the limitations of the proposed system were discussed. 2010 SPIE.  
Study on experiment of grinding SiC mirror with fixed abrasive (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Wang X.;  Zhang X.-J.;  Wang X.;  Wang X.
收藏  |  浏览/下载:31/0  |  提交时间:2013/03/25
A brand-new technology for manufacturing SiC reflecting mirror that is different from the traditional method is adopted  which is called as fixed abrasive surfacing technology. Not only the new method achieves better mirror quality with bigger diamond in diameter quickly  but also because of the fixed motion between the abrasive and workpiece and it will be good for surface finishing. During experiment  material removal characteristic which is on SiC under certain rotation speed and pressure by W7  W5  W3.5  W1.5 pellets has been tested. Through those removal curves  we come to a conclusion that the technology not only has a higher removal rate  but also has much more stability. In addition  the surface roughness experiment is mentioned. In the first stage  we achieved a mirror with surface roughness 42.758nm rms with W7 pellets. The surface roughness is descending as we change pellets with smaller diamond in diameter . At the end of experiment  a smooth surface with roughness 1.591nm rms has been achieved after using W1.5 pellets. Experiment results indicate that the technology which manufactures SiC reflecting mirror with fixed abrasive is able to replace the traditional slurry abrasive completely in certain finishing phase and also has a great foreground in application. 2009 SPIE.  
Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文  OAI收割
Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states
Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C.
收藏  |  浏览/下载:43/0  |  提交时间:2013/03/25
A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.  
化学抛光和退火对钛酸锶基片表面改性研究 期刊论文  OAI收割
人工晶体学报, 2008, 卷号: 37, 期号: 5, 页码: 1107, 1112
陈光珠; 杭寅; 汪隽等
收藏  |  浏览/下载:1229/122  |  提交时间:2009/09/24