中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [4]
采集方式
OAI收割 [4]
内容类型
期刊论文 [4]
发表日期
2018 [1]
2014 [2]
2011 [1]
学科主题
Chemistry,... [1]
Materials ... [1]
Metallurgy... [1]
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The interfacial reaction between In-48Sn solder and polycrystalline Cu substrate during solid state aging
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2018, 卷号: 740, 页码: 500-509
作者:
Tian, FF
;
Li, CF
;
Zhou, M
;
Liu, ZQ
;
Liu, ZQ (reprint author), Chinese Acad Sci, Inst Met Res, Shenyang 110016, Liaoning, Peoples R China.
  |  
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2018/06/05
Heterogeneous Binary-systems
Chemical-compound Layers
2 Elementary Substances
Eutectic Snin Solder
Intermetallic Compounds
Phase Identification
Reaction-diffusion
Growth-kinetics
Joint
Transformations
Phase identification on the intermetallic compound formed between eutectic SnIn solder and single crystalline Cu substrate
期刊论文
OAI收割
Journal of Alloys and Compounds, 2014, 卷号: 591, 页码: 351-355
F. F. Tian
;
Z. Q. Liu
;
P. J. Shang
;
J. D. Guo
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2014/04/18
Phase identification
Interface
IMC
Eutectic SnIn solder
Single
crystalline Cu
gamma-angular correlations
lead-free solders
joint reliability
growth-kinetics
system
equilibria
mechanisms
interfaces
diffusion
layer
Precise Cr-marker investigation on the reactive interface in the eutectic SnIn solder joint
期刊论文
OAI收割
Materials Letters, 2014, 卷号: 121, 页码: 185-187
F. F. Tian
;
P. J. Shang
;
Z. Q. Liu
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2014/07/03
Interfaces
Intermetallic alloys and compounds
Diffusion
Kirkendall
void
SnIn solder
cu substrate
growth-kinetics
snagcu solder
diffusion
compound
identification
ni
Intermetallic compound identification and Kirkendall void formation in eutectic SnIn/Cu solder joint during solid-state aging
期刊论文
OAI收割
Philosophical Magazine Letters, 2011, 卷号: 91, 期号: 6, 页码: 410-417
P. J. Shang
;
Z. Q. Liu
;
D. X. Li
;
J. K. Shang
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2012/04/13
diffusion
intermetallic compounds
SnIn solder
interfaces
Kirkendall
void
cu-sn
interface
reliability
diffusion
systems
growth