中国科学院机构知识库网格系统: 检索

浏览/检索结果: 共9条，第1-9条

帮助

条数/页：排序方式：
	Thickness-dependent fracture characteristics of ceramic coatings bonded on the alloy substrates 期刊论文 OAI收割 SURFACE & COATINGS TECHNOLOGY, 2014, 卷号: 258, 页码: 1039-1047 作者: Wei YG(魏悦广); Liang, LH (reprint author), Chinese Acad Sci, Inst Mech, LNM, Beijing 100190, Peoples R China.; Li XN; Liang LH(梁立红); Xie JJ(谢季佳) \| 收藏 \| 浏览/下载：77/0 \| 提交时间：2015/01/23 Thickness Of Coatings Fracture Modes Three-point Bending Interface Cohesive Model
	Effect of design parameters on the reduction of top piston ring friction (EI CONFERENCE) 会议论文 OAI收割 2nd International Conference on Computer-Aided Design, Manufacturing, Modeling and Simulation, CDMMS 2012, September 21, 2012 - September 23, 2012, Chongqing, China 作者: Wang P. 收藏 \| 浏览/下载：138/0 \| 提交时间：2013/03/25 In order to reduce ring-liner interface friction power loss this paper focuses on the structure parameters of the top ring and investigates how the value of those parameters will influence top ring-liner friction power loss and the minimum thickness of oil film at top ring-liner interface. A mixed lubrication model is developed to simulate the effect of varying design parameters on ring-liner friction. Case study shows that ring-liner friction power loss will be reduced with decreased axial ring height and barrel height. This study provides a theoretical basis for design the top ring with reduced friction power loss at ring-liner interface. (2013) Trans Tech Publications Switzerland.
	Strength and interface failure mechanism of adhesive joints 期刊论文 OAI收割 INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES, 2012, 卷号: 34, 期号: 4, 页码: 80-92 作者: Xu W(许巍); Wei YG(魏悦广); Xu, W 收藏 \| 浏览/下载：33/0 \| 提交时间：2013/01/18 Interface Finite element analysis Mechanical properties of adhesive Cohesive zone model Single-Lap Joints Cohesive Zone Models Bonded-Joints Automotive Industry Composite Adherends Epoxy Adhesive Thickness Fracture Behavior Simulation
	Effect of content on microstructure and dielectric performance of pi/al2o3 hybrid films 期刊论文 iSwitch采集 Nanoscience and nanotechnology letters, 2011, 卷号: 3, 期号: 2, 页码: 226-229 作者: Liu, Xiaoxu; Yin, Jinghua; Chen, Minghua; Bu, Wenbin; Cheng, Weidong 收藏 \| 浏览/下载：38/0 \| 提交时间：2019/04/23 Al2o3/pi Saxs Thickness of interface Dielectric performance
	The method of separation of magnetic field step by step for inversion of magnetic stratigraphic interfaces 期刊论文 OAI收割 CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2007, 卷号: 50, 期号: 2, 页码: 611-618 作者: Zhao Bai-Min; Hao Tian-Yao; Xu Ya; Zhou Li-Hong; Gao Jia-Rui \| 收藏 \| 浏览/下载：13/0 \| 提交时间：2018/09/26 inversion of interface equivalent unit-thickness layer equivalent magnetization separation
	The method of separation of magnetic field step by step for inversion of magnetic stratigraphic interfaces 期刊论文 OAI收割 CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2007, 卷号: 50, 期号: 2, 页码: 611-618 作者: Zhao Bai-Min; Hao Tian-Yao; Xu Ya; Zhou Li-Hong; Gao Jia-Rui \| 收藏 \| 浏览/下载：15/0 \| 提交时间：2018/09/26 inversion of interface equivalent unit-thickness layer equivalent magnetization separation
	Effect of interface on luminescence properties in ZnO/MgZnO heterostructures (EI CONFERENCE) 会议论文 OAI收割 Wei Z. P.; Lu Y. M.; Shen D. Z.; Wu C. X.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Fan X. W. 收藏 \| 浏览/下载：30/0 \| 提交时间：2013/03/25 A set of ZnO/MgZnO heterostructures with well widths Lw varying from 2 to 20 nm has been grown by plasma-assisted molecular-beam epitaxy (P-MBE). We present a room-temperature (RT) study of the well-width-dependent photoluminescence (PL) spectra and carrier lifetimes in ZnO/MgZnO heterostructures. Bi-exponential process is seen at RT time-decay curves of the luminescence from the well layers. The fast process is from the recombination of the free exciton while the slow process is attributing to the recombination of the localized exciton in the interface of ZnO and MgZnO. It is also confirmed from the PL peak shift of time-resolved PL spectra. With decreasing the well thickness the fast process gradually increases and dominantly contributes to the PL spectrum due to the interface improvement. 2006 Elsevier B.V. All rights reserved.
	Characterization of ZnO/Mg0.12Zn0.88O heterostructure grown by plasma-assisted molecular beam epitaxy (EI CONFERENCE) 会议论文 OAI收割 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004 Lu Y. M.; Wu C. X.; Wei Z. P.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Liu Y. C.; Shen D. Z.; Fan X. W. 收藏 \| 浏览/下载：28/0 \| 提交时间：2013/03/25 In this paper Mg0.12Zn0.88O/ZnO heterostructures were fabricated on c-plane sapphire (Al2O3) substrates by plasma-assisted molecular beam epitaxy (P-MBE). The quality of the Mg 0.12Zn0.88O alloy thin film was characterized by X-ray diffraction (XRD) and reflection high-energy electron diffraction (RHEED). Optical properties of the Mg0.12Zn0.88O/ZnO heterostructure were studied by absorption and photoluminescence (PL) spectra. At room temperature (RT) Mg0.12Zn0.88O/ZnO heterostructures show two absorption edges originating from ZnO and Mg 0.12Zn0.88O layers respectively. In PL spectra two ultraviolet emission bands related to the ZnO layer and the Mg 0.12Zn0.88O layer were observed. The emission band from Mg0.12Zn0.88O layer dominates at moderately lower temperature and the luminescence of ZnO becomes gradually important with increasing temperature. This is suggested to exist as a potential barrier in the interface and to restrict the relaxation of the carriers from the Mg 0.12Zn0.88O layer to ZnO layer. As the thickness of ZnO layer decreases the emission from the Mg0.12Zn0.88O layer becomes weaker and weaker. When the ZnO thickness is up to 2 nm only the luminescence of the ZnO layer is observed at RT. The quenching of the emission corresponding to the MgZnO layer indicates the existence of a strong injection process in the samples with thinner ZnO layer. 2005 Elsevier B.V. All rights reserved.
	Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs 期刊论文 OAI收割 ACTA PHYSICA SINICA, 2001, 卷号: 50, 期号: 6, 页码: 1128-1131 作者: Li, ZH; Gong, YJ; Wu, D; Sun, YH; Wang, J 收藏 \| 浏览/下载：25/0 \| 提交时间：2016/06/29 small angle X-ray scattering sols the average thickness of interface layer