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CAS IR Grid
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金属研究所 [2]
长春光学精密机械与物... [2]
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期刊论文 [8]
会议论文 [2]
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A guide to sample delivery systems for serial crystallography
期刊论文
OAI收割
FEBS JOURNAL, 2019, 卷号: 286, 期号: 22, 页码: 4402-4417
作者:
Zhao, FZ
;
Zhang, B
;
Yan, EK
;
Sun, B
;
Wang, ZJ
  |  
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2020/10/16
X-RAY-DIFFRACTION
ROOM-TEMPERATURE
FEMTOSECOND CRYSTALLOGRAPHY
PROTEIN CRYSTALLIZATION
STRUCTURAL BIOLOGY
MILLISECOND CRYSTALLOGRAPHY
CRYSTAL-STRUCTURE
RADIATION-DAMAGE
DATA-COLLECTION
MICROCRYSTALS
Mythen detector for X-ray diffraction at the Beijing synchrotron radiation facility
期刊论文
OAI收割
INSTRUMENTATION SCIENCE AND TECHNOLOGY, 2015, 卷号: 44, 期号: 1, 页码: 1-11
作者:
Du R(杜蓉)
;
Cai Q(蔡泉)
;
Chen ZJ(陈中军)
;
Gong Y(宫宇)
;
Wu ZH(吴忠华)
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2016/04/18
Basic parameters
Data treatment
Fast response
Flat field correction
Polycrystalline
Synchrotron radiation facility
Time-resolved
X-ray diffraction measurements
Pressure induced metallization of SiH4(H-2)(2) via first-principles calculations
期刊论文
OAI收割
Computational Materials Science, 2014, 卷号: 88, 页码: 116-123
Y. K. Wei
;
N. N. Ge
;
G. F. Ji
;
X. R. Chen
;
L. C. Cai
;
D. Q. Wei
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2014/07/03
Structure
X-ray diffraction data
Phonon dispersion curves
Band
structures
Metallization mechanism
1st principles
electronic-properties
molecular-hydrogen
phase-stability
superconductivity
gpa
temperature
crystal
methane
silane
Hanjiangite, a new barium-vanadium phyllosilicate carbonate mineral from the Shiti barium deposit in the Dabashan region, China
期刊论文
OAI收割
AMERICAN MINERALOGIST, 2012, 卷号: 97, 期号: 2-3, 页码: 281-290
作者:
Liu, Jiajun
;
Li, Guowu
;
Ma, Qian
;
Wu, Shenghua
;
Liu, Zhenjiang
  |  
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2018/09/26
New mineral
hanjiangite
electron-microprobe data
single-crystal X-ray diffraction
crystal structure
Shiti barium deposit
Ankang County
China
Hanjiangite, a new barium-vanadium phyllosilicate carbonate mineral from the Shiti barium deposit in the Dabashan region, China
期刊论文
OAI收割
American Mineralogist, 2012, 卷号: 97, 期号: 2-3, 页码: 281-290
作者:
Jiajun Liu
;
Guowu Li
;
Qian Mao
;
Shenghua Wu
;
Zhenjiang Liu
;
Shangguo Su
;
Ming Xiong
;
Xiaoyan Yu
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2020/12/15
New Mineral
hanjiangite
Electron-microprobe Data
Single-crystal X-ray Diffraction
crystal Structure
shiti Barium Deposit
ankang County
china
Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China
作者:
Chen B.
;
Chen B.
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2013/03/25
A grazing incidence x-ray scattering (XRS) method
Order perturbation theory (FOPT)
is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced
which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree
as the x-ray wavelength is 0.154 nm
have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison
the root mean square (RMS) surface roughness
grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM
which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.
Remarkable structural transformation of Zn(tza)(2) during recrystallization, syntheses and crystal structures of M(tza)(2) (M = Zn, Cd, Mn, Co; Htza = tetrazole-1-acetic acid)
期刊论文
OAI收割
Crystal Growth & Design, 2008, 卷号: 8, 期号: 8, 页码: 2882-2886
W. W. Dong
;
J. Zhao and L. Xu
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/01/22
powder diffraction data
x-ray-diffraction
cobaloxime complexes
magnetic-properties
state reaction
spin-crossover
racemization
polymers
bridge
copper(ii)
Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE)
会议论文
OAI收割
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China
作者:
Liu L.
;
Yang H.
;
Liu L.
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2013/03/25
A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data
which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known
the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result
quite good fitting results are obtained with high accuracy. Finally
an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.
Expression, purification, crystallization and molecular replacement studies of TorI, an inhibition protein of Tor system
期刊论文
OAI收割
Chinese Journal of Structural Chemistry, 2007, 卷号: 26, 期号: 5, 页码: 594-598
W. Huang
;
C. Yuan
;
A. Mireille
;
M. Xavier
;
E. J. Meehan
;
L. Q. Chen
;
M. D. Huang
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2013/04/01
TorI
inhibitor
crystallization
X-ray diffraction
n-oxide reductase
2-component signal-transduction
response regulator
inhibitor
escherichia-coli
operon expression
diffraction data
key
role
binding
involvement
chaperone
The crystal structure of alpha-SrGaBO4
期刊论文
OAI收割
Crystal Research and Technology, 2004, 卷号: 39, 期号: 7, 页码: 634-642
Z. Yang
;
X. L. Chen
;
J. K. Liang
;
M. He
;
J. R. Chen
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2012/04/14
alpha-SrGaBO4
borate
structure determination
powder X-ray
diffraction
DTA
diffraction data
phase-relations
compound
program
system