中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共7条,第1-7条 帮助

条数/页: 排序方式:
Oxidation precursor dependence of atomic layer deposited al2o3 films in a-si:h(i)/al2o3 surface passivation stacks 期刊论文  iSwitch采集
Nanoscale research letters, 2015, 卷号: 10, 期号: 1
作者:  
Xiang,Yuren;  Zhou,Chunlan;  Jia,Endong;  Wang,Wenjing
收藏  |  浏览/下载:74/0  |  提交时间:2019/05/09
Thermal analysis on supersonic ellipsoidal dome (EI CONFERENCE) 会议论文  OAI收割
2nd International Conference on Multimedia Technology, ICMT 2011, July 26, 2011 - July 28, 2011, Hangzhou, China
Jiang Z.; Wei Q.; Jia H.
收藏  |  浏览/下载:32/0  |  提交时间:2013/03/25
Studied the transient thermal transfer analysis method due to a kind of supersonic ellipsoidal dome  which is a conformal dome. Illuminated the principle of transient thermal transfer analysis. Accomplished the transient thermal analysis based on the model of ellipsoidal dome  and studied the influence about the different material and the different velocity. Considered three materials consist of MgF2  Al2O3  and ZnS  and meanwhile  the velocity was Mach2.5  and the time consists of 10s  20s and 60s. The temperature initial loads were from FLUENT thermal simulation. The thermal conduction analysis and the thermal convection analysis were finished in software ANSYS  in which the entire transient thermal analysis consists of modeling  meshing element  calculating and getting the results. The different temperature distributions based on varied time were gotten about the different materials. The results from analysis showed the temperature distribution of the structure of ellipsoidal dome  which could help the following coupled thermal-structure analysis. 2011 IEEE.  
Thermal-structure analysis of supersonic dome based on three materials (EI CONFERENCE) 会议论文  OAI收割
2011 International Conference on Electric Information and Control Engineering, ICEICE 2011, April 15, 2011 - April 17, 2011, Wuhan, China
Jiang Z.; Ai X.; Wei Q.; Liu B.; Jia H.
收藏  |  浏览/下载:27/0  |  提交时间:2013/03/25
To a supersonic missile  a seeker could enhance the aerodynamic ability due to decrease the resistance in flying. At the same time  the primary function of a seeker has been considered as the most important equipment for a missile  due to the importance for cueing of targets and tracking for the final approach. However  the dome of a seeker  which is made up of glass  has poor mechanical performance. Especially  in the higher altitude  for a dome  in which the aerothermal and pressure loads could destroy the structure easily  it is necessary to do the thermal-structure coupled analysis due to varied materials. In the paper  to take the spherical dome of a seeker as a example  the analysis has been completed according to the varied materials consist of MgF2  Al2O3 and ZnS. The temperature loads and the pressure loads derived from the results of fluent analysis has been forced on the surface of dome  which simulates the actual Mach 2.5 in flying. According to the results of coupled analysis  the SEQV stress of the dome radium 80mm based on three materials had reached to 31MPa  which shows that the strength is sufficient for Mach 2.5  and offered the warranty to design the attaching to missile for the dome. At the same time  the results required the flexible mounting for the dome due to the displacements results  which the crystal material couldn't accept. 2011 IEEE.  
Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Yang H.;  Liu L.;  Liu L.
收藏  |  浏览/下载:29/0  |  提交时间:2013/03/25
Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.  
热生长Al_2O_3膜型M-A1纳米复合镀层及制备方法和应用 成果  OAI收割
2008
中国科学院金属研究所
收藏  |  浏览/下载:22/0  |  提交时间:2013/07/24
Excitonic properties of vertically aligned ZnO nanotubes under high-density excitation (EI CONFERENCE) 会议论文  OAI收割
Lu Y. M.; Liang H. W.; Shen D. Z.; Zhang Z. Z.; Zhang J. Y.; Zhao D. X.; Liu Y. C.; Fan X. W.
收藏  |  浏览/下载:15/0  |  提交时间:2013/03/25
In this paper  highly oriented and vertically arranged ZnO nanotubes are prepared on Al2O3 (0 0 0 1) substrate without employing any metal catalysts by plasma-assisted molecular beam epitaxy. The photoluminescence (PL) spectra at room temperature are studied under high excitation densities. Under lower excitation density (60 kW/cm2)  PL spectrum shows that one strong free exciton emission (FE) locates at 3.306 eV. As the excitation density increases up to 200 kW/cm2  a new emission peak (Pn) located at low-energy side of FE is attributed to the spontaneous emission due to an exciton-exciton (Ex-E x) scattering process from two ground state excitons  where one exciton is recombined by emitting a photon and the other is scattered into the excited states of n=2  3  4.... Under excitation density of 300 kW/cm 2  the stimulated emission originating from Ex-E x scattering is obtained. When the excitation density is above 580 kW/cm2  the emission from electron-hole plasma is observed in low-energy side of the P band and indicates a typical superradiation recombination processes with increasing excitation density. 2006 Elsevier B.V. All rights reserved.  
Characterization of ZnO/Mg0.12Zn0.88O heterostructure grown by plasma-assisted molecular beam epitaxy (EI CONFERENCE) 会议论文  OAI收割
13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004
Lu Y. M.; Wu C. X.; Wei Z. P.; Zhang Z. Z.; Zhao D. X.; Zhang J. Y.; Liu Y. C.; Shen D. Z.; Fan X. W.
收藏  |  浏览/下载:30/0  |  提交时间:2013/03/25
In this paper  Mg0.12Zn0.88O/ZnO heterostructures were fabricated on c-plane sapphire (Al2O3) substrates by plasma-assisted molecular beam epitaxy (P-MBE). The quality of the Mg 0.12Zn0.88O alloy thin film was characterized by X-ray diffraction (XRD) and reflection high-energy electron diffraction (RHEED). Optical properties of the Mg0.12Zn0.88O/ZnO heterostructure were studied by absorption and photoluminescence (PL) spectra. At room temperature (RT)  Mg0.12Zn0.88O/ZnO heterostructures show two absorption edges originating from ZnO and Mg 0.12Zn0.88O layers  respectively. In PL spectra  two ultraviolet emission bands related to the ZnO layer and the Mg 0.12Zn0.88O layer were observed. The emission band from Mg0.12Zn0.88O layer dominates at moderately lower temperature  and the luminescence of ZnO becomes gradually important with increasing temperature. This is suggested to exist as a potential barrier in the interface and to restrict the relaxation of the carriers from the Mg 0.12Zn0.88O layer to ZnO layer. As the thickness of ZnO layer decreases  the emission from the Mg0.12Zn0.88O layer becomes weaker and weaker. When the ZnO thickness is up to 2 nm  only the luminescence of the ZnO layer is observed at RT. The quenching of the emission corresponding to the MgZnO layer indicates the existence of a strong injection process in the samples with thinner ZnO layer. 2005 Elsevier B.V. All rights reserved.  
  • 首页
  • 上一页
  • 1
  • 下一页
  • 末页