机构

• 金属研究所 [3]
• 半导体研究所 [2]
• 新疆生态与地理研究所 [1]
• 长春光学精密机械与物... [1]
• 新疆理化技术研究所 [1]
• 上海光学精密机械研究... [1]
• 更多

采集方式

• OAI收割 [10]
• iSwitch采集 [1]

内容类型

• 期刊论文 [9]
• 会议论文 [2]

发表日期

• 2019 [1]
• 2018 [1]
• 2013 [1]
• 2011 [1]
• 2010 [1]
• 2009 [1]
• 更多

学科主题

• Physics [1]
• 光学薄膜 [1]
• 半导体材料 [1]

筛选

浏览/检索结果: 共11条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 The Ionization Dose Radiation Effects of Analog Front-end for Satellite-borne Directional Polarization camera 会议论文  OAI收割 Xi'an, China, 2019-08-06-2019-08-09 作者:  YAO Ping-ping;  Tu bi-hai;  Chen di hu;  Lu mei na;  Luo dong gen   |  收藏  |  浏览/下载：100/0  |  提交时间：2021/12/10 Polarization, Imaging systems, Cameras, Annealing, Silicon, Signal processing, Ionization, Charge-coupled devices, Analog electronics, Radiation effects   Anomalous annealing of floating gate errors due to heavy ion irradiation 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 418, 页码: 80-86 作者:  Hou, Mingdong;  Zhao, Peixiong;  Luo, Jie;  Ji, Qinggang;  Ye, Bing   |  收藏  |  浏览/下载：70/0  |  提交时间：2018/05/31 Annealing  Flash memories  Heavy ions  Multiple cell upsets  Radiation effects   serial ferroelectric memory ionizing radiation effects and annealing characteristics 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2013, 卷号: 62, 期号: 15, 页码: - 作者:  Zhang Xing-Yao;  Guo Qi;  Lu Wu;  Zhang Xiao-Fu;  Zheng Qi-Wen 收藏  |  浏览/下载：36/0  |  提交时间：2013/11/07 ferroelectric random memory  ionizing radiation effects  annealing characteristics   Effect of annealing process on the surface roughness in multiple Al implanted4H-SiC 期刊论文  OAI收割 journal of semiconductors, 2011, 卷号: 32, 期号: 7, 页码: 72002 Wu, Hailei; Sun, Guosheng; Yang, Ting; Yan, Guoguo; Wang, Lei; Zhao, Wanshun; Liu, Xingfang; Zeng, Yiping; Wen, Jialiang 收藏  |  浏览/下载：33/0  |  提交时间：2012/06/14 Aluminum  Annealing  Ion implantation  Pressure effects  Semiconducting silicon compounds  Silicon carbide  Surface roughness   Total ionizing dose effects and annealing behavior for domestic VDMOS devices 期刊论文  OAI收割 Journal of Semiconductors, 2010, 卷号: 31, 期号: 4 Gao; Yu; Ren; Liu; Wang; Sun; Cui; Bo1; Xuefeng1; Diyuan1; Gang3; Yiyuan1; Jing1; Jiangwei1; 2; 2; 2; 2; 2; 2; 4; 4; 4 收藏  |  浏览/下载：19/0  |  提交时间：2011/08/19 Drain current - Electric breakdown - Experiments - Field effect transistors - Ionizing radiation - Irradiation - Radiation effects - Threshold voltage - Annealing behavior - Annealing time - Bias conditions - Breakdown voltage - Drain bias voltage - Electrical parameter - N-channel - On-state resistance - Preirradiation - Total dose - Total dose effect - Total ionizing dose effects - VDMOS device - VDMOS devices   Low-temperature magnetotransport behaviors of heavily mn-doped (ga,mn)as films with high ferromagnetic transition temperature 期刊论文  iSwitch采集 Applied physics letters, 2009, 卷号: 95, 期号: 18, 页码: 3 作者:  Chen, L.;  Yan, S.;  Xu, P. F.;  Lu, J.;  Wang, W. Z. 收藏  |  浏览/下载：26/0  |  提交时间：2019/05/12 Annealing  Curie temperature  Doping profiles  Electrical resistivity  Ferromagnetic materials  Gallium arsenide  Gallium compounds  Galvanomagnetic effects  Hopping conduction  Iii-v semiconductors  Manganese compounds  Semiconductor doping  Semiconductor thin films  Semimagnetic semiconductors   退火对HfO2/SiO2多层膜残余应力的影响 期刊论文  OAI收割 Chin. Opt. Lett., 2008, 卷号: 6, 期号: 3, 页码: 225, 227 申雁鸣; 韩朝霞; 邵建达; 邵淑英; 贺洪波 收藏  |  浏览/下载：1461/181  |  提交时间：2009/09/22 退火  Annealing effects  HfO2/SiO2多层膜  Electron beam evaporation  残余应力   Effect of annealing close to T-g on notch fracture toughness of Pd-based thin-film metallic glass for MEMS applications 期刊论文  OAI收割 SCRIPTA MATERIALIA, 2006, 卷号: 54, 期号: 5, 页码: 897-901 作者:  Zhang, GP;  Liu, Y;  Zhang, B   |  收藏  |  浏览/下载：19/0  |  提交时间：2021/02/02 notch fracture toughness  shear bands  thin-film metallic glasses  annealing effects   Effect of annealing close to T-g on notch fracture toughness of Pd-based thin-film metallic glass for MEMS applications 期刊论文  OAI收割 SCRIPTA MATERIALIA, 2006, 卷号: 54, 期号: 5, 页码: 897-901 作者:  Zhang, GP;  Liu, Y;  Zhang, B   |  收藏  |  浏览/下载：12/0  |  提交时间：2021/02/02 notch fracture toughness  shear bands  thin-film metallic glasses  annealing effects   Effect of annealing close to T(g) on notch fracture toughness of Pd-based thin-film metallic glass for MEMS applications 期刊论文  OAI收割 Scripta Materialia, 2006, 卷号: 54, 期号: 5, 页码: 897-901 G. P. Zhang; Y. Liu; B. Zhang 收藏  |  浏览/下载：18/0  |  提交时间：2012/04/14 notch fracture toughness  shear bands  thin-film metallic glasses  annealing effects  ni-cu-be  amorphous alloy  deformation  flow  behavior  state  tests  beams