机构

• 金属研究所 [7]
• 力学研究所 [1]
• 物理研究所 [1]
• 上海药物研究所 [1]
• 上海应用物理研究所 [1]
• 半导体研究所 [1]
• 更多

采集方式

• OAI收割 [12]

内容类型

• 期刊论文 [12]

发表日期

• 2018 [1]
• 2016 [1]
• 2015 [1]
• 2014 [2]
• 2013 [1]
• 2011 [1]
• 更多

学科主题

• 半导体物理 [1]

筛选

浏览/检索结果: 共12条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Determination of chemical ordering in the complex perovskite Pb(Cd1/3Nb2/3)O-3 期刊论文  OAI收割 IUCRJ, 2018, 卷号: 5, 页码: 808-815 作者:  Wang, Caiyan;  Fu, Zhengqian;  Zhang, Nan;  Pasciak, Marek;  Zhuang, Jian   |  收藏  |  浏览/下载：40/0  |  提交时间：2020/07/01 chemical ordering  diffuse scattering  electron microscopy  atomic resolution EDS  perovskites  dielectric permittivity  relaxors   Thermally stable coherent domain boundaries in complex-structured Cr2Nb intermetallics 期刊论文  OAI收割 PHILOSOPHICAL MAGAZINE, 2016, 卷号: 96, 期号: 1, 页码: 58-70 Zhang, Wei; Du, Kui; Chen, Xingqiu; Sheng, Liyuan; Ye, Hengqiang 收藏  |  浏览/下载：24/0  |  提交时间：2016/04/21 Nanostructured materials  thermal stability  domain structure  atomic-resolution electron microscopy  high-temperature materials  Cr2Nb   Strain-induced preferential dissolution at the dislocation emergences in MnS: an atomic scale study 期刊论文  OAI收割 PHILOSOPHICAL MAGAZINE, 2015, 卷号: 95, 期号: 22, 页码: 2365-2375 Zhou, Y. T.; Wang, Y. J.; Zheng, S. J.; Zhang, B.; Ma, X. L. 收藏  |  浏览/下载：17/0  |  提交时间：2016/04/21 MnS  strain  stainless steel  dislocations  corrosion  atomic-resolution electron microscopy   Using electron beams to investigate catalytic materials 期刊论文  OAI收割 Comptes Rendus Physique, 2014, 卷号: 15, 期号: 2-3, 页码: 258-268 B. S. Zhang; D. S. Su 收藏  |  浏览/下载：25/0  |  提交时间：2014/07/03 Electron microscopy  Catalyst  Chemical composition  Surface  Dynamic  process  Particle shape  energy-loss spectroscopy  heterogeneous catalysts  carbon nanotubes  atomic-resolution  materials chemistry  solid catalysts  microscopy  tomography  nanoparticles  surface   Synchrotron-Based X-Ray-Sensitive Nanoprobes for Cellular Imaging 期刊论文  OAI收割 ADVANCED MATERIALS, 2014, 卷号: 26, 期号: 46, 页码: 7889—7895 Zhu, Y; Earnest, T; Huang, Q; Cai, XQ; Wang, ZL; Wu, ZY; Fan, CH 收藏  |  浏览/下载：49/0  |  提交时间：2015/03/13 ATOMIC-FORCE MICROSCOPY  SCANNING-ELECTRON-MICROSCOPY  FLUORESCENCE MICROSCOPY  DIFFRACTION MICROSCOPY  SPATIAL-RESOLUTION  QUANTUM DOTS  CELLS  NANOPARTICLES  TOMOGRAPHY  PROTEIN   Interfacial defects in YBa2Cu3O7-/SrTiO3(001) heterostructures studied by aberration-corrected ultrahigh-resolution electron microscopy 期刊论文  OAI收割 Philosophical Magazine Letters, 2013, 卷号: 93, 期号: 5, 页码: 264-272 S. B. Mi 收藏  |  浏览/下载：13/0  |  提交时间：2013/12/24 thin films  atomic-resolution electron microscopy  interfacial  structure  cuprate superconductors  defect structures  ybco thin-films  srtio3 substrate  atomic-structure  yba2cu3o7-delta  growth  superconductors   Influence of growth temperatures on the quality of InGaAs/GaAs quantum well structure grown on Ge substrate by molecular beam epitaxy 期刊论文  OAI收割 journal of semiconductors, Journal of Semiconductors, 2011, 2011, 卷号: 32, 32, 期号: 4, 页码: 43004, 43004 作者:  He, Jifang;  Shang, Xiangjun;  Li, Mifeng;  Zhu, Yan;  Chang, Xiuying   |  收藏  |  浏览/下载：83/0  |  提交时间：2012/06/14 Atomic force microscopy  Buffer layers  Epitaxial growth  Gallium alloys  Gallium arsenide  Germanium  Growth temperature  High resolution transmission electron microscopy  Molecular beam epitaxy  Molecular beams  Semiconducting gallium  Semiconductor device structures  Semiconductor quantum wells  Atomic Force Microscopy  Buffer Layers  Epitaxial Growth  Gallium Alloys  Gallium Arsenide  Germanium  Growth Temperature  High Resolution Transmission Electron Microscopy  Molecular Beam Epitaxy  Molecular Beams  Semiconducting Gallium  Semiconductor Device Structures  Semiconductor Quantum Wells   Expansion of interatomic distances in platinum catalyst nanoparticles 期刊论文  OAI收割 Acta Materialia, 2010, 卷号: 58, 期号: 3, 页码: 836-845 K. Du; F. Emst; M. C. Pelsozy; J. Barthel; K. Tillmann 收藏  |  浏览/下载：96/0  |  提交时间：2012/04/13 Nanoparticles  Catalysts  Atomistic structure  Quantitative  high-resolution transmission electron microscopy  Spherical-aberration-adjusted transmission electron microscopy  transmission electron-micrographs  pt-co electrocatalysts  oxygen  reduction  spherical-aberration  lattice-parameters  atomic-resolution  materials science  surface-tension  hrem images  in-situ   Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface 期刊论文  OAI收割 JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 7 Wen, C; Wang, YM; Wan, W; Li, FH; Liang, JW; Zou, J 收藏  |  浏览/下载：42/0  |  提交时间：2013/09/24 RESOLUTION ELECTRON-MICROSCOPY  PHASE-OBJECT APPROXIMATION  CHEMICAL-VAPOR-DEPOSITION  IMAGE DECONVOLUTION  HETEROEPITAXIAL GROWTH  THEORETICAL CONSIDERATION  ATOMIC CONFIGURATION  PARTIAL DISLOCATIONS  MISFIT DISLOCATIONS  LOMER DISLOCATION   Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs 期刊论文  OAI收割 Ultramicroscopy, 2007, 卷号: 107, 期号: 4-5, 页码: 281-292 K. Du; K. von Hochmeister; F. Phillipp 收藏  |  浏览/下载：24/0  |  提交时间：2012/04/13 high-resolution transmission electron microscopy  image simulation  atomic-resolution  noise transfer  ccd cameras  hrem  scattering  microscope  diffraction  holography  package  signal