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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [6]
长春光学精密机械与物... [2]
半导体研究所 [2]
化学研究所 [1]
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OAI收割 [10]
iSwitch采集 [1]
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期刊论文 [9]
会议论文 [2]
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2010 [1]
2007 [2]
2006 [5]
2000 [2]
1998 [1]
学科主题
半导体材料 [1]
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High-performance soft x-ray spectromicroscopy beamline at SSRF (EI CONFERENCE)
会议论文
OAI收割
作者:
Xue C.
;
Chen J.
;
Wang Y.
;
Wang Y.
;
Wang Y.
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2013/03/25
The Shanghai Synchrotron Radiation Facility (SSRF) is the first third-generation synchrotron facility in China and operated at an electron energy of 3.5 GeV. One of the seven beamlines in the first construction phase is devoted to soft x-ray spectromicroscopy and is equipped with an elliptically polarized undulator light source
a plane grating monochromator
and a scanning transmission x-ray microscope end station. Initial results reveal the high performance of this beamline
with an energy resolving power estimated to be over 10 000 at the argon L-edge and a spatial resolution better than 30 nm. 2010 American Institute of Physics.
The synthesis and field emission property of carbon nanotubes on carbon fibers substrate (EI CONFERENCE)
会议论文
OAI收割
Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, July 8, 2008 - July 12, 2008, Chicago, IL, United states
Leyong Z.
;
Weibiao W.
;
Jingqiu L.
;
Yuxue X.
;
Da L.
;
Song C.
;
Haifeng Z.
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  |  
浏览/下载:33/0
  |  
提交时间:2013/03/25
Using ferrocene as catalyst precursor
C2H2 as carbon source
carbon nanotubes (CNTs) with uniform density were synthesized on carbon fibers substrate by floating catalyst method. The morphology and microstructure were characterized by field emission scanning electron microscope (FESEM) and high-resolution transmission electron microscopy (HRTEM). The observation showed that the length of CNTs is about 2 m
the average space between adjacent CNTs is about 300 nm and the diameter of CNT is about 45 nm. The less dense "short and stubby" aligned CNTs films should have good electron field emission characteristics. The results of field emission showed that the emission current of CNTs/carbon fibers was 5 A at the field of 2.5 V/m
and the emission current can be 280 A with a field of 7 V/m (the specimen area is 0.25 cm2 and the distance between cathode and anode is 200 m). The calculation based on the F-N plot indicated that the field enhancement factor of CNTs tip is 499122. Using the conductivity and chemical stability of carbon fibers and the uniform and sparse density distribution of CNTs on carbon fibers substrate
the tip predominance of carbon nanotubes can be exerted
and simultaneously the effect of screening effects between adjacent carbon nanotubes on the field emission performance can also be effectively decreased. The CNTs synthesized on carbon fibers substrate has many predominances for the fabrication of cold cathode devices. For example
using the removability of carbon fibers
the cathode of CNTs/carbon fibers can be arbitrarily moved
enlaced or combined to form different patterns
and the cathode of CNTs/carbon fibers can be also fabricated in large size. Therefore
CNTs/carbon fibers may have potential application in field emission displays.
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
期刊论文
OAI收割
Ultramicroscopy, 2007, 卷号: 107, 期号: 4-5, 页码: 281-292
K. Du
;
K. von Hochmeister
;
F. Phillipp
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  |  
浏览/下载:25/0
  |  
提交时间:2012/04/13
high-resolution transmission electron microscopy
image simulation
atomic-resolution
noise transfer
ccd cameras
hrem
scattering
microscope
diffraction
holography
package
signal
Nanoelectronic devices-resonant tunnelling diodes grown on inp substrates by molecular beam epitaxy with peak to valley current ratio of 17 at room temperature
期刊论文
iSwitch采集
Chinese physics, 2006, 卷号: 15, 期号: 6, 页码: 1335-1338
作者:
Zhang, Y
;
Zeng, YP
;
Ma, L
;
Wang, BQ
;
Zhu, ZP
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2019/05/12
Resonant tunnelling diode
Inp substrate
Molecular beam epitaxy
High resolution transmission electron microscope
Nanoelectronic devices-resonant tunnelling diodes grown on InP substrates by molecular beam epitaxy with peak to valley current ratio of 17 at room temperature
期刊论文
OAI收割
CHINESE PHYSICS, 2006, 卷号: 15, 期号: 6, 页码: 1335-1338
作者:
Zhang, Y
;
Zeng, YP
;
Ma, L
;
Wang, BQ
;
Zhu, ZP
  |  
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2021/02/02
resonant tunnelling diode
InP substrate
molecular beam epitaxy
high resolution transmission electron microscope
Arc-discharge synthesis and microstructure characterization of AlN nanowires
期刊论文
OAI收割
Journal of Materials Science & Technology, 2006, 卷号: 22, 期号: 1, 页码: 113-116
Z. J. Li
;
Z. Q. Shen
;
F. Wang
;
L. L. He
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  |  
浏览/下载:16/0
  |  
提交时间:2012/04/13
arc-discharge
nanowire
high-resolution transmission electron
microscope (HRTEM)
field-emission
growth
nanorods
alpha-PbO2-type nanophase of TiO2 from coesite-bearing eclogite in the Dabie Mountains, China - Reply
期刊论文
OAI收割
American Mineralogist, 2006, 卷号: 91, 期号: 10, 页码: 1701-1702
X. L. Wu
;
D. W. Meng
;
Y. J. Han
收藏
  |  
浏览/下载:20/0
  |  
提交时间:2012/04/14
TiO2
high-resolution transmission electron microscope
Dabie Mountains
UHP metamorphism
Nanoelectronic devices-resonant tunnelling diodes grown on InP substrates by molecular beam epitaxy with peak to valley current ratio of 17 at room temperature
期刊论文
OAI收割
chinese physics, 2006, 卷号: 15, 期号: 6, 页码: 1335-1338
作者:
Zhang Y
收藏
  |  
浏览/下载:58/0
  |  
提交时间:2010/04/11
resonant tunnelling diode
InP substrate
molecular beam epitaxy
high resolution transmission electron microscope
CURRENT-VOLTAGE CHARACTERISTICS
INTRINSIC BISTABILITY
CIRCUIT
Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM
期刊论文
OAI收割
MICRON, 2000, 卷号: 31, 期号: 5, 页码: 581-586
作者:
Li, DX
;
Ping, DH
;
Huang, JY
;
Yu, YD
;
Ye, HQ
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2021/02/02
nanostructured materials
grain boundary
defect structure
solubility
high-resolution electron microscope and field-emission-gun transmission electron microscope
Microstructure and composition analysis of nanostructured materials using HREM and FEG-TEM
期刊论文
OAI收割
MICRON, 2000, 卷号: 31, 期号: 5, 页码: 581-586
作者:
Li, DX
;
Ping, DH
;
Huang, JY
;
Yu, YD
;
Ye, HQ
  |  
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/02/02
nanostructured materials
grain boundary
defect structure
solubility
high-resolution electron microscope and field-emission-gun transmission electron microscope