中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共12条,第1-10条 帮助

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Optimal design of aspheric Offner compensator based on computer aided program 会议论文  OAI收割
Beijing, China, 2021-06-20
作者:  
Meng, Wen;  Ma, Zhen
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Fabricating and testing of the trim plate for the Zwicky Transient Facility 会议论文  OAI收割
SPIE Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation III(Vol. 10706), Austin, Texas, United States, 2018-6-10
作者:  
Chen Xu;  Yi Zheng;  Bo Li;  Xinnan Li;  Zhe Chen
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The Null-Test for peptide identification algorithm in Shotgun proteomics 期刊论文  OAI收割
JOURNAL OF PROTEOMICS, 2017, 卷号: 163, 页码: 118-125
作者:  
Zhou, Yuan;  Zhang, Yu-Kui;  Zhang, Shu-Rong;  Shan, Yi-Chu;  Jiang, Hao
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Full Time Discharge Simulation and Plasma Profile Control for CFETR 期刊论文  OAI收割
JOURNAL OF FUSION ENERGY, 2016, 卷号: 35, 期号: 2, 页码: 440-445
作者:  
Wang, Rongfei;  Yang, Jinhong;  Wang, Weihua;  Shi, Bo;  Han, Jiajia
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The optical design of cubic phase plate testing system (EI CONFERENCE) 会议论文  OAI收割
2011 Symposium on Photonics and Optoelectronics, SOPO 2011, May 16, 2011 - May 18, 2011, Wuhan, China
作者:  
Zhang X.;  Zhang X.;  Zhang X.;  Zhang Y.
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Research on automatic Hartmann test of membrane mirror (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Zhang P.
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Design and fabrication of CGH for aspheric surface testing and its experimental comparison with null lens (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Zhao J.;  Zhang X.;  Zhang X.;  Zhang X.;  Li F.
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Test of an off-axis asphere by subaperture stitching interferometry (EI CONFERENCE) 会议论文  OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China
作者:  
Zheng L.-G.;  Zhang X.-J.;  Zhang Z.-Y.;  Zhang Z.-Y.;  Deng W.-J.
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Design and tolerance analysis of compensator for high order aspheric surface testing (EI CONFERENCE) 会议论文  OAI收割
2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China
作者:  
Chen X.;  Liu W.;  Chen X.;  Chen X.
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Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者:  
Zheng L.-G.;  Zhang X.-J.;  Deng W.-J.;  Wang X.-K.
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