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	Extended-wavelength 640 x 1 linear InGaAs detector arrays using N-on-P configuration for back illumination 期刊论文 OAI收割 JOURNAL OF INFRARED AND MILLIMETER WAVES, 2012, 卷号: 31, 期号: 1, 页码: 11-+ Zhu, YM; Li, YF; Li, X; Tang, HJ; Shao, XM; Chen, Y; Deng, HH; Wei, P; Zhang, YG; Gong, HM 收藏 \| 浏览/下载：26/0 \| 提交时间：2013/04/17 N-on-P configuration ICP etching linear detector array photoelectric characteristics
	Graph fitting test method for the interpolation error of Moire fringe (EI CONFERENCE) 会议论文 OAI收割 9th International Conference on Electronic Measurement and Instruments, ICEMI 2009, August 16, 2009 - August 19, 2009, Beijing, China 作者: Sun Y.; Sun Y. 收藏 \| 浏览/下载：30/0 \| 提交时间：2013/03/25 In order to realize the fast test for the interpolation error the graph fitting test method for the interpolation error of Moire fringe is put forward in this paper. Firstly the triangular wave Moire fringe photoelectric signal of the encoder whose phase difference is 90 are sampled to get the Lissajous graph of the two signals. Secondly the single wave represented by the founded subsection function is used to fit the practical Moire fringe Lissajous graph. Then the fitting result is tested to verify whether it satisfies the accuracy requirement. Lastly the founded subsection function instead of the practical wave function is used to calculate the interpolation error. Using the graph fitting method to sample the Moire fringe single of 15-bits photoelectric encoder to get the interpolation error curve the tested maximum interpolation error is 70" and the minimum error is - 69". Comparing with the interpolation error which is received from traditional test method the change trend of the interpolation error curve is similar and peak-peak value is almost equality. The results of experiment indicate that: the equipment is convenient and the examination method is efficient and feasible. The measure speed is fast and the manifestation result is intuitionistic. The system can be used in the working field. The method can avoid the speed influence and realize the dynamic interpolation error measure which is significant for the research of encoder's dynamic accuracy characteristics. 2009 IEEE.
	Research on the nonuniformity correction of linear TDI CCD remote camera (EI CONFERENCE) 会议论文 OAI收割 Advanced Materials and Devices for Sensing and Imaging II, November 8, 2004 - November 10, 2004, Beijing, China Ya-xia L.; Zhi-hang H. 收藏 \| 浏览/下载：24/0 \| 提交时间：2013/03/25 Many applications such as industrial inspection and overhead reconnaissance benefit from line scanning architectures where time delay integration (TDI) significantly improves sensitivity[5]. Images with linear response have become the backbone of the imaging industry. But each pixel of the TDI CCD has unique light sensitivity characteristics. Because these characteristics and the lens of the optical system affect camera's linearization and its performance they must be removed through calibration. The process by which a CCD image is calibrated is known as nonuniformity correction. This paper discusses several methods of nonuniformity correction[2]. The first is one-point correction technique which requires only one calibration point. This approach is to shift each curve toward the nominal curve by subtracting the offset from or adding the offset to the average. The second is two-point correction technique which requires two calibration points. Each point is rotated and aligned so that all the detectors have the same response under the same radiance. The third is multipoint correction. It is recommended that more calibration points be implemented at appropriate regions of the response curve. Depend on the linear photoelectric response of the TDI CCD we use two-point calibration and the standard deviations for the images are given before and after the correction.