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Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共16条,第1-10条 帮助

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Influence Analysis of Spectral Line-Shape Models on Spectral Diagnoses Under High-Temperature Conditions 期刊论文  OAI收割
SPECTROSCOPY AND SPECTRAL ANALYSIS, 2023, 卷号: 43
作者:  
Zeng Si-xian;  Ren Xin;  He Hao-xuan;  Nie Wei
  |  收藏  |  浏览/下载:20/0  |  提交时间:2023/11/17
Landslide longitudinal shape: a new concept for complementing landslide aspect ratio 期刊论文  OAI收割
LANDSLIDES, 2022, 页码: 21
作者:  
Li, Langping;  Lan, Hengxing;  Strom, Alexander;  Macciotta, Renato
  |  收藏  |  浏览/下载:26/0  |  提交时间:2022/09/21
Landslide longitudinal shape: a new concept for complementing landslide aspect ratio 期刊论文  OAI收割
LANDSLIDES, 2022, 页码: 21
作者:  
Li, Langping;  Lan, Hengxing;  Strom, Alexander;  Macciotta, Renato
  |  收藏  |  浏览/下载:15/0  |  提交时间:2022/09/21
Experimental Study on Scouring and Silting Deformation of Artificial Beach Under Storm Surge-Wave Coupling CNKI期刊论文  OAI收割
2022
作者:  
SUN Tian-ting;  HU Po;  PAN Jun-ning;  HOU Yi-jun;  MO Dong-xue
  |  收藏  |  浏览/下载:5/0  |  提交时间:2024/12/18
Experimental Study on Scouring and Silting Deformation of Artificial Beach Under Storm Surge-Wave Coupling 期刊论文  OAI收割
CHINA OCEAN ENGINEERING, 2022, 卷号: 36, 期号: 1, 页码: 65-75
作者:  
Sun Tian-ting;  Hu Po
  |  收藏  |  浏览/下载:47/0  |  提交时间:2022/07/15
浅海域系泊剖面浮标及其外形优化设计 期刊论文  OAI收割
机械设计与研究, 2020, 卷号: 36, 期号: 5, 页码: 169-173
作者:  
楚灯旺;  周悦;  龚涛;  郭威;  吴杰
  |  收藏  |  浏览/下载:15/0  |  提交时间:2021/01/18
On atypical affection on environment due to dewatering of foundation pit in developed river system area 会议论文  OAI收割
Guangzhou, PEOPLES R CHINA, MAR 15-16, 2014
作者:  
Li, Dan;  Li, Nianfeng;  Tang, Bin;  Gong, Jianwu
  |  收藏  |  浏览/下载:28/0  |  提交时间:2018/06/05
Investigation on meniscus shape and flow characteristics in open rectangular microgrooves heat sinks with micro-PIV 期刊论文  OAI收割
APPLIED THERMAL ENGINEERING, 2013, 卷号: 61, 期号: 2, 页码: 716-727
作者:  
Yu, Dong;  Hu, Xuegong;  Guo, Chaohong;  Wang, Tao;  Xu, Xianfeng
收藏  |  浏览/下载:29/0  |  提交时间:2015/10/27
Highly efficient TIG welding of Cr13Ni5Mo martensitic stainless steel 期刊论文  OAI收割
Journal of Materials Processing Technology, 2013, 卷号: 213, 期号: 2, 页码: 229-237
S. P. Lu; M. P. Qin; W. C. Dong
收藏  |  浏览/下载:103/0  |  提交时间:2013/12/24
Fabrication of high-efficiency ultraviolet blazed gratings by use of direct Ar2-CHF3 ion-beam etching through a rectangular photoresist mask (EI CONFERENCE) 会议论文  OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Sensor and Micromachined Optical Device Technologies, May 24, 2011 - May 26, 2011, Beijing, China
Tan X.
收藏  |  浏览/下载:25/0  |  提交时间:2013/03/25
In ultraviolet spectroscopy  groove irregularity and surface roughness of nanometer magnitude can cause a significant loss of diffraction efficiency. Therefore  there is a constant need to improve the diffraction efficiency. A blazed grating can concentrate most of the light intensity into a desired diffraction order  it is important to control the groove shape precisely  so it is the optimum choice among gratings of different kinds of profile. As the operating wavelength of most UV spectral applications is less than 200 nm  especially the blaze angle and the apical angle. We have presented a direct shaping method to fabricate EUV blazed gratings by using an ion-beam mixture of Ar+ and CHF2 +to etch K9 glass with a rectangular photoresist mask. With this method  the required blaze angle is small  we have succeeded in fabricating well-shaped UV blazed gratings with a 1200 line/mm groove density and 8.54 blaze angles and 1200 line/mm groove density and 11.68 blaze angles  and the metrical efficiency is about 81% and 78%. The good performance of the gratings was verified by diffraction efficiency measurements. When one uses the etching model  the conditions on the ion-beam grazing incident angle and the CHF3partial pressure should be noted. Besides  since the etched groove shape depends on the aspect ratio of the photoresist mask ridge  if we wish to fabricate larger gratings with this method  we must improve the uniformity of the photoresist mask before ion-beam etching. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).