机构

• 计算技术研究所 [3]
• 长春光学精密机械与物... [1]
• 中国科学院大学 [1]

采集方式

• OAI收割 [4]
• iSwitch采集 [1]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2020 [1]
• 2011 [1]
• 2009 [1]
• 2005 [2]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 A Guaranteed Secure Scan Design Based on Test Data Obfuscation by Cryptographic Hash 期刊论文  OAI收割 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 12, 页码: 4524-4536 作者:  Cui, Aijiao;  Li, Mengyang;  Qu, Gang;  Li, Huawei   |  收藏  |  浏览/下载：31/0  |  提交时间：2021/12/01 Ciphers  Encryption  Integrated circuits  Side-channel attacks  Testing  Cryptographic hash function  obfuscation logic  scan design  scan-based side-channel attack   Scan chain design for shift power reduction in scan-based testing 期刊论文  OAI收割 SCIENCE CHINA-INFORMATION SCIENCES, 2011, 卷号: 54, 期号: 4, 页码: 767-777 作者:  Li Jia;  Hu Yu;  Li XiaoWei   |  收藏  |  浏览/下载：22/0  |  提交时间：2019/12/16 low power DfT  scan-based testing  test power reduction  scan chain design   Static micro-michelson interferometer based on electro-optical effect (EI CONFERENCE) 会议论文  OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, November 19, 2008 - November 21, 2008, Chengdu, China 作者:  He X. 收藏  |  浏览/下载：29/0  |  提交时间：2013/03/25 Based on Electro-Optical (E-O) effect the interferometer is static and polarization-transparent. Using voltage scan to replace mechanical scan modulates the Optical Path Difference (OPD) without movement. Depending on the study of Tymon Barwicz  MIT  a special design makes the interferometer polarization-transparent. A method is given to compensate the optical dispersion of E-O material. In the end  a spectrometer composed of this interferometer is in the 550nm band with spectral resolution up to 1 nanometer. 2009 SPIE.   Wrapper scan chains design for rapid and low power testing of embedded cores 期刊论文  iSwitch采集 Ieice transactions on information and systems, 2005, 卷号: E88d, 期号: 9, 页码: 2126-2134 作者:  Han, YH;  Hu, Y;  Li, XW;  Li, HW;  Chandra, A 收藏  |  浏览/下载：16/0  |  提交时间：2019/05/10 Soc testing  Wrapper design  Scan slices  Overlapping   Wrapper scan chains design for rapid and low power testing of embedded cores 期刊论文  OAI收割 IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2005, 卷号: E88D, 期号: 9, 页码: 2126-2134 作者:  Han, YH;  Hu, Y;  Li, XW;  Li, HW;  Chandra, A   |  收藏  |  浏览/下载：16/0  |  提交时间：2019/12/16 SOC testing  wrapper design  scan slices  overlapping