中国科学院机构知识库网格系统: 检索

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	Optimization of pencil beam f-theta lens for high-accuracy metrology 期刊论文 OAI收割 OPTICAL ENGINEERING, 2018, 卷号: 57, 期号: 1, 页码: - 作者: Peng, CQ; He, YM; Wang, J \| 收藏 \|
	Normal tracing deflectometry using a secondary light source 期刊论文 OAI收割 JOURNAL OF SYNCHROTRON RADIATION, 2017, 卷号: 24, 期号: -, 页码: 765-774 作者: Peng, CQ; He, YM; Wang, J \| 收藏 \|
	Nano-accuracy measurement technology of optical-surface profiles 会议论文 OAI收割 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT) - Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, Suzhou, PEOPLES R CHINA, APR 26-29, 2016 作者: Qian, SN; Gao, B 收藏 \|
	Design of co-path scanning long trace profiler for measurement of X-ray space optical elements (EI CONFERENCE) 会议论文 OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China Shun L.; Yan G.; Wei Z.; Yang Z. 收藏 \|
	In situ long trace profiler for measurement of Wolter type-I mirror (EI CONFERENCE) 会议论文 OAI收割 Advances in Metrology for X-Ray and EUV Optics III, August 1, 2010 - August 2, 2010, San Diego, CA, United states 作者: Chen B.; Chen B. 收藏 \|
	Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文 OAI收割 Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C. 收藏 \|
	Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Zhou C.; Li H.; Chen C.; Zhou C.; Qian S. 收藏 \|
	Recent progress on asphere manufacturing and testing at CIOM (EI CONFERENCE) 会议论文 OAI收割 Advanced Optical Manufacturing and Testing Technology 2000, November 1, 2000 - November 3, 2000, Chengdu, China 作者: Zhang X.; Yu J.; Zhang X.; Zhang X. 收藏 \|