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长春光学精密机械与... [11]
深圳先进技术研究院 [1]
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Green, cubic Y2O3: Tb3+ nanospheres: Synthesis and photoluminescence property
会议论文
OAI收割
nanotechnology 2014: graphene, cnts, particles, films and composites - 2014 nsti nanotechnology conference and expo, nsti-nanotech 2014, washington, dc, united states, 2014-06-15
Miao, H.
;
Hu, X.
;
Sun, X.
;
Wang, Z.
;
Sun, Q.
;
Wu, H.
;
Zhang, D.
;
Bai, J.
;
Hou, X.
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2015/03/31
Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique
会议论文
OAI收割
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
作者:
Zhang T.
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  |  
浏览/下载:36/0
  |  
提交时间:2014/05/15
Response spectrum 0.9-2.65 m of In0.82Ga0.18As detectors by two-step growth technique (EI CONFERENCE)
会议论文
OAI收割
2012 International Conference on Material Sciences and Manufacturing Technology, ICMSMT 2012, October 5, 2012 - October 6, 2012, Dalian, China
作者:
Zhang T.
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  |  
浏览/下载:20/0
  |  
提交时间:2013/03/25
InP/In0.82Ga0.18As/InP heterostructure used for infrared detector were grown on (100) S-doped InP substrates using two-step growth technique by low temperature metal-organic chemical vapor deposition. The growth was performed using TMIn
TMGa
AsH3
and PH3 as growth precursors in a horizontal reactor. The substrates on a graphite susceptor were heated by inductively coupling RF power
their temperatures were detected by a thermocouple
and the reactor pressure was kept at 10000 Pa. The growth structure of detector included In0.82Ga0.18As buffer with the thickness of 100 nm
In0.82Ga0.18As absorption layer with the thickness of 2.8 m
and the InP cap with the thickness of 0.8 m. The planar type of p-i-n detector was fabricated by Zn diffusion. The properties of In0.82Ga0.18As detector were studied
the curves of the I-V characteristics
the range of response spectrum
and the detectivity (D*) were obtained. (2013) Trans Tech Publications
Switzerland.
InGaAs nanoflowers grown by MOCVD (EI CONFERENCE)
会议论文
OAI收割
2012 Spring International Conference on Material Sciences and Technology, MST-S, May 27, 2012 - May 30, 2012, Xi'an, China
作者:
Zhang T.
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  |  
浏览/下载:16/0
  |  
提交时间:2013/03/25
InGaAs nanoflowers have been prepared on InP substrates by MOCVD
using TMIn
TMGa and AsH3 as reactive precursors at 420 C. Through observation by scanning electron microscopy
we find that InGaAs nanoflowers are composed with blades and rods. The flower patterns are controlled by the growth temperature. The nanoflowers of InGaAs are disappeared
when we alter the growth temperature up and down. The InGaAs nanoflowers are In0.98Ga0.02As. (2012) Trans Tech Publications
Switzerland.
Influence of spacial temperature distribution on high accuracy interferometric metrology
会议论文
OAI收割
2010
作者:
Yan F.
;
Yan F.
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  |  
浏览/下载:6/0
  |  
提交时间:2013/03/28
Temperature gradients effect on surface test with high precise interferometer
会议论文
OAI收割
2010
Miao E. L.
;
Gu Y. Q.
;
Zhang J. A.
;
Sui Y. X.
;
Yang H. J.
收藏
  |  
浏览/下载:24/0
  |  
提交时间:2013/03/28
Chirp estimation of PZT for integrating-bucket method (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Zhang J.
;
Liu W.
;
Zhang J.
;
Zhang J.
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  |  
浏览/下载:14/0
  |  
提交时间:2013/03/25
The nonlinear response of the PZT for the integrating bucket method is studied by our proposed method: discrete chirp Fourier transform (DCFT) and maximum likelihood estimation (MLE) techniques for the integrating bucket method. Based on the signal processing theory
the intensity obtained from CCD is processed by the DCFT and thus nonlinear response and chirp coefficient of the PZT can be coarsely estimated. This is followed by the MLE method
in which an iterative optimization process is complemented for accurately estimating the nonlinear response and chirp coefficient of the PZT. One key advantage of the proposed method is that not only the nonlinear response and chirp coefficient of the PZT can be acquired
but also initial phase acquired. Our method is tested by simulating conditions under which a certain magnitude of nonlinearity is assumed. Nonlinear response attained by the DCFT is compared to that attained by the MLE
and a difference between the actual nonlinear response of the PZT and our accurate estimation by the proposed method is revealed. Several factors that will have influence on the nonlinear response of the PZT are discussed. 2010 Copyright SPIE - The International Society for Optical Engineering.
Chirp Estimation of PZT for integrating-bucket method
会议论文
OAI收割
2010
Zhang J. A.
;
Shi Z. G.
;
Miao E. L.
;
Gu Y. Q.
;
Liu W. Q.
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2013/03/28
Temperature gradients effect on surface test with high precise interferometer (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Gu Y.-Q.
;
Yang H.-J.
;
Sui Y.-X.
;
Zhang J.
;
Zhang J.
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2013/03/25
In high precise surface testing
temperature stability and uniformity are of paramount importance to the high accuracy of test results. Micro-temperature variation and temperature gradients not only cause the change of the air refractive index and lead to the optical path variation in interferometer cavity
but also result in deformation of the tested surface itself
which always brings about errors to the test results. Temperature effects on the interferometer cavity and the tested surface are analyzed from the axial and radial directions in this letter. Temperature model of the interferometer cavity and the tested lens are established and quantitative calculations and diagram of test results versus temperature and lens dimension are provided. It shows that temperature gradients effect increase with the length of the interferometer and the dimension of the tested lens. The interferometer cavity is mainly affected by radial temperature gradients while the tested lens is mainly affected by the axial temperature gradients. 2010 Copyright SPIE - The International Society for Optical Engineering.
Influence of spatial temperature distribution on high accuracy interferometric metrology (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Yang H.
;
Zhang J.
;
Zhang J.
;
Zhang J.
;
Yan F.
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2013/03/25
We calculate the influence of temperature change on the refractive index of air
establish a model of air temperature distribution and analyze the effect of different temperature distribution on the high accuracy interferometric metrology. First
a revised Edlen formula is employed to acquire the relation between temperature and refractive index of air
followed by introducing the fixed temperature gradient distribution among the spatial grid within the optical cavity between the reference flat and the test flat of the Fizeau interferometer
accompanied by a temperature change random function within each grid. Finally
all the rays through the air layer with different incident angles are traced by Matlab program in order to obtain the final output position
angle and OPD for each ray. The influence of different temperature distribution and the length of the optical cavity in on the testing accuracy can be analyzed through the RMS value that results from repeatable rays tracing. As a result
the horizontal distribution (vertical to optical axis) has a large effect on the testing accuracy. Thus
to realize the high accuracy figure metrology
the horizontal distribution of temperature must be rigorously controlled as well as to shorten the length of the optical cavity to a large extent. The results from our simulation are of great significant for the accuracy analysis of interferometric testing and the research of manufacturing a interferometer. 2010 Copyright SPIE - The International Society for Optical Engineering.