机构

• 光电技术研究所 [11]

采集方式

• OAI收割 [11]

内容类型

• 期刊论文 [9]
• 会议论文 [2]

发表日期

• 2020 [1]
• 2018 [1]
• 2017 [2]
• 2016 [1]
• 2015 [1]
• 2013 [2]
• 更多

学科主题

• Atomic for... [1]
• Atomic for... [1]
• Atomic for... [1]

筛选

浏览/检索结果: 共11条，第1-10条 帮助 限定条件 专题：光电技术研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序题名升序题名降序作者升序作者降序发表日期升序发表日期降序 Fabrication of Ultralow Stress TiO2/SiO(2)Optical Coatings by Plasma Ion-Assisted Deposition 期刊论文  OAI收割 COATINGS, 2020, 卷号: 10, 期号: 8, 页码: 10080720-1-13 作者:  Guo, Chun;  Kong, Mingdong   |  收藏  |  浏览/下载：22/0  |  提交时间：2021/05/11 Stress  Plasma Ion-assisted Deposition  Tio(2)Film  Sio(2)Film  Annealing Treatment   Performance optimization of 93 nm antireflective coatings with wide incident angle ranges on strongly curved spherical substrates 期刊论文  OAI收割 OPTICS EXPRESS, 2018, 卷号: 26, 期号: 15, 页码: 19524-19533 作者:  Liu, Cunding;  Kong, Mingdong;  Li, Bincheng   |  收藏  |  浏览/下载：34/0  |  提交时间：2019/08/23 Antireflection coatings  Atomic force microscopy  Film thickness  Lanthanum compounds  Magnesium compounds  Refractive index  Spheres   Characterization of surface defects of silicon substrates by the total scattering and absorption 会议论文  OAI收割 作者:  Zhang, Kepeng;  Zhang, Xingxin;  Huang, Wei   |  收藏  |  浏览/下载：34/0  |  提交时间：2018/12/20 Absorption - Atomic force microscopy - Brillouin scattering - Light scattering - Microscopes - Optical systems - Photonics - Reflection - Silicon - Substrates - Surface roughness - Surface scattering   Measurement and analysis of the surface roughness of Ag film used in plasmonic lithography 期刊论文  OAI收割 Chinese Physics B, 2017, 卷号: 26, 期号: 1, 页码: 016801 作者:  Liang, Gao-Feng;  Jiao, Jiao;  Luo, Xian-Gang;  Zhao, Qing   |  收藏  |  浏览/下载：15/0  |  提交时间：2018/11/20 Atomic force microscopy - Deposition - Lithography - Photolithography - Plasmons - Substrates - Surface roughness   The effect of the surface energy and structure of the SiC substrate on epitaxial graphene growth 期刊论文  OAI收割 RSC Advances, 2016, 卷号: 6, 期号: 103, 页码: 100908-100915 作者:  Sun, Li;  Chen, Xiufang;  Yu, Wancheng;  Sun, Honggang;  Zhao, Xian   |  收藏  |  浏览/下载：16/0  |  提交时间：2018/06/14 Atomic Force Microscopy  Interfacial Energy  Microelectronics  Silicon  Silicon Carbide   Light scattering to investigate the surface quality of silicon substrates 会议论文  OAI收割 Proceedings of SPIE - The International Society for Optical Engineering, 2015 作者:  Zhang, Xingxin;  Huang, Wei;  Hu, Xiaochuan 收藏  |  浏览/下载：18/0  |  提交时间：2016/11/25 Microstructure-related properties of magnesium fluoride films at 193nm by oblique-angle deposition 期刊论文  OAI收割 Optics Express, 2013, 卷号: 21, 期号: 1, 页码: 960-967 作者:  Guo, Chun;  Kong, Mingdong;  Lin, Dawei;  Liu, Cunding;  Li, Bincheng 收藏  |  浏览/下载：14/0  |  提交时间：2016/11/21 Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements 期刊论文  OAI收割 Optics Letters, 2013, 卷号: 38, 期号: 1, 页码: 40-42 作者:  Guo, Chun;  Kong, Mingdong;  Gao, Weidong;  Li, Bincheng 收藏  |  浏览/下载：7/0  |  提交时间：2016/11/21 Linear and nonlinear optical properties of RF sputtered (Pb,La)(Zr,Ti)O-3 ferroelectric thin films 期刊论文  OAI收割 JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 卷号: 18, 期号: 8, 页码: 887-892 作者:  Leng, Wenjian;  Yang, Chuanren;  Ji, Hong;  Zhang, Jihua;  Tang, Jinlong 收藏  |  浏览/下载：10/0  |  提交时间：2015/09/21 Suppression of pinhole defects in fullerene molecular electron beam resists 期刊论文  OAI收割 MICROELECTRONIC ENGINEERING, 2007, 卷号: 84, 期号: 5-8, 页码: 1066-1070 作者:  Chen, X.;  Robinson, A. P. G.;  Manickam, M.;  Preece, J. A. 收藏  |  浏览/下载：7/0  |  提交时间：2015/09/21 molecular resist  fullerene  electron beam lithography  pinholes