中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [5]
采集方式
OAI收割 [5]
内容类型
期刊论文 [4]
会议论文 [1]
发表日期
2006 [1]
1997 [1]
1996 [2]
1995 [1]
学科主题
半导体器件 [5]
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Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors
会议论文
OAI收割
11th conference on defects recognition imaging and physics in semiconductors, beijing, peoples r china, sep 13-19, 2005
Li, Z (Li, Z.)
;
Li, CJ (Li, C. J.)
收藏
  |  
浏览/下载:303/15
  |  
提交时间:2010/03/29
DLTS
Temperature-stimulated abnormal annealing of neutron-induced damage in high-resistivity silicon detectors
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1997, 卷号: 385, 期号: 2, 页码: 321-329
Li Z
;
Li CJ
;
Verbitskaya E
;
Eremin V
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2010/11/17
CHARGES N-EFF
RADIATION-DAMAGE
SPECTROSCOPY
Investigation on the N-eff reverse annealing effect using TSC/I-DLTS: Relationship between neutron induced microscopic defects and silicon detector electrical degradations
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1996, 卷号: 377, 期号: 0, 页码: 265-275
Li Z
;
Li CJ
;
Eremin V
;
Verbitskaya E
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2010/11/17
RADIATION-DAMAGE
RESISTIVITY
Microscopic analysis of defects in a high resistivity silicon detector irradiated to 1.7x10(15)n/cm(2)
期刊论文
OAI收割
ieee transactions on nuclear science, 1996, 卷号: 43, 期号: 3, 页码: 1590-1598
Li Z
;
Ghislotti G
;
Kraner HW
;
Li CJ
;
Nielsen B
;
Feick H
;
Lindstroem G
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2010/11/17
RADIATION-DAMAGE
JUNCTION
DEVELOPMENT OF CURRENT-BASED MICROSCOPIC DEFECT ANALYSIS-METHODS AND ASSOCIATED OPTICAL FILLING TECHNIQUES FOR THE INVESTIGATION ON HIGHLY IRRADIATED HIGH-RESISTIVITY SILICON DETECTORS
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1995, 卷号: 364, 期号: 1, 页码: 108-117
LI CJ
;
LI Z
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2010/11/17
LEVEL TRANSIENT SPECTROSCOPY
NEUTRON
RADIATION
TRAPS