中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
  • 国家空间科学中心 [9]
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共9条,第1-9条 帮助

限定条件                
条数/页: 排序方式:
Fabrication, structural and magnetic properties of one-dimensional anti-ferromagnetic FeMn nanostructures 期刊论文  OAI收割
AIP ADVANCES, 2019, 卷号: 9, 期号: 3, 页码: 35225
作者:  
Ali, S. S.;  Li, W. J.;  Zhang, X. M.;  Irfan, M.;  Feng, J. F.
  |  收藏  |  
Analysis of observational data from Extreme Ultra-Violet Camera onboard Chang'E-3 mission 期刊论文  OAI收割
ASTROPHYSICS AND SPACE SCIENCE, 2016, 卷号: 361, 期号: 2, 页码: 76
作者:  
Yan, Yan;  Wang, Hua-Ning;  He, Han;  He, Fei;  Chen, Bo
收藏  |  
Correction of Single Event Latchup Rate Prediction Using Pulsed Laser Mapping Test 期刊论文  OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2015, 卷号: 62, 期号: 2, 页码: 565-570
作者:  
Yu, Y. -T.;  Han, J. -W.;  Feng, G. -Q.;  Cai, M. -H.;  Chen, R.
收藏  |  
Comparative research on "high currents" induced by single event latch-up and transient-induced latch-up 期刊论文  OAI收割
CHINESE PHYSICS B, 2015, 卷号: 24, 期号: 4, 页码: 46103
作者:  
Chen Rui;  Han Jian-Wei;  Zheng Han-Sheng;  Yu Yong-Tao;  Shangguang Shi-Peng
收藏  |  
Laser SEU sensitivity mapping of deep submicron CMOS SRAM 期刊论文  OAI收割
Journal of Semiconductors, 2014, 卷号: 35, 期号: 6
作者:  
Yu, Yongtao;  Feng, Guoqiang;  Chen, Rui;  Han, Jianwei
收藏  |  
A single-event transient induced by a pulsed laser in a silicon-germanium heterojunction bipolar transistor 期刊论文  OAI收割
CHINESE PHYSICS B, 2013, 卷号: 22, 期号: 5, 页码: 56103
作者:  
Sun Ya-Bin;  Fu Jun;  Xu Jun;  Wang Yu-Dong;  Zhou Wei
收藏  |  
Pulsed laser method for SEE testing in FPGAs 期刊论文  OAI收割
Yuanzineng Kexue Jishu/Atomic Energy Science and Technology, 2012, 卷号: 46, 期号: SUPPL. 1, 页码: 582-586
Jiang, Yu-Guang; Feng, Guo-Qiang; Zhu, Xiang; Shangguan, Shi-Peng; Ma, Ying-Qi; Han, Jian-Wei
收藏  |  
Experimental study on single event latchup of SRAM K6R4016V1D and its protection 期刊论文  OAI收割
Yuanzineng Kexue Jishu/Atomic Energy Science and Technology, 2012, 卷号: 46, 期号: SUPPL. 1, 页码: 587-591
Yu, Yong-Tao; Feng, Guo-Qiang; Chen, Rui; Shangguan, Shi-Peng; Han, Jian-Wei
收藏  |  
SEE characteristics of small feature size devices by using laser backside testing 期刊论文  OAI收割
Journal of Semiconductors, 2012, 卷号: 33, 期号: 1
作者:  
Feng, Guoqiang;  Shangguan, Shipeng;  Ma, Yingqi;  Han, Jianwei
收藏  |