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浏览/检索结果: 共20条，第1-10条 帮助 限定条件 学科主题：Multidisciplinary     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Optical Beam Steering Based on the Symmetry of Resonant Modes of Nanoparticles 期刊论文  OAI收割 PHYSICAL REVIEW LETTERS, 2011, 卷号: 106, 期号: 20, 页码: 203903 Du,JJ; Lin,ZF; Chui,ST; Lu,WL; Li,H; Wu,AM; Sheng,Z; Zi,J; Wang,X; Zou,SC; Gan,FW 收藏  |  浏览/下载：10/0  |  提交时间：2012/04/10 AMER PHYSICAL SOC   Self-Collimation in Planar Photonic Crystals Fabricated by CMOS Technology 期刊论文  OAI收割 CHINESE PHYSICS LETTERS, 2010, 卷号: 27, 期号: 2, 页码: 24203-24203 Yang,ZF; Wu,AM; Fang,N; Jiang,XY; Lin,XL; Wang,X; Zou,SC 收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24 LITHOGRAPHY  BEAMS  SPLITTERS   Analysis of IBAD silicon oxynitride film for anti-reflection coating application 期刊论文  OAI收割 JOURNAL OF NON-CRYSTALLINE SOLIDS, 2004, 卷号: 333, 期号: 3, 页码: 296-300 Wang,YJ; Cheng,XL; Lin,ZL; Zhang,CS; Xiao,HB; Zhang,F; Zou,SC 收藏  |  浏览/下载：10/0  |  提交时间：2012/03/24 RAY PHOTOELECTRON-SPECTROSCOPY  REFRACTIVE-INDEX  ON-INSULATOR  THIN-FILMS  WAVE-GUIDE  AUGER-SPECTROSCOPY  INTEGRATED-OPTICS  NITRIDE FILMS  ELLIPSOMETRY  LAYERS   Electrical characterization of SIMOX SOI wafers with MOSOS C-V measurements 期刊论文  OAI收割 SILICON MATERIALS-PROCESSING, CHARACTERIZATION AND RELIABILITY, 2002, 卷号: 716, 期号: 0, 页码: 227-231 Li,CL; Yu,YH; Chen,M; Zou,SC; X,S; Lin,ZX 收藏  |  浏览/下载：8/0  |  提交时间：2012/03/24 Structural and optical properties of SiC films deposited on Si by DG magnetron sputtering 期刊论文  OAI收割 SILICON CARBIDE AND RELATED MATERIALS, ECSCRM2000, 2001, 卷号: 353-356, 期号: 0, 页码: 191-194 Lei,YM; Yu,YH; Cheng,LL; Lin,L; Sundaraval,B; Luo,EZ; Lin,S; Ren,CX; Cheung,WY; Wong,SP; Xu,JB; Zou,SC; Wilson,IH 收藏  |  浏览/下载：12/0  |  提交时间：2012/03/24 ALLOYS   A study of optical characteristics of damage in oxygen-implanted 6H-SiC 期刊论文  OAI收割 JOURNAL OF MATERIALS SCIENCE LETTERS, 1999, 卷号: 18, 期号: 12, 页码: 979-982 Wang,LW; Huang,JP; Lin,CL; Zou,SC; Zheng,YX; Wang,XJ; Huang,DM; Zetterling,CM; Ostling,M 收藏  |  浏览/下载：22/0  |  提交时间：2012/03/25 ENHANCED THERMAL-OXIDATION  SILICON-CARBIDE  ION-IMPLANTATION  THIN-FILMS  AMORPHIZATION  LAYERS   A study on the as redistribution in beta-FeSi2 film prepared by reactive deposition epitaxy 期刊论文  OAI收割 ION IMPLANTATION TECHNOLOGY - 96, 1997, 期号: 0, 页码: 721-724 Wang,LW; Lin,CG; Chen,XD; Zou,SC; Zhou,ZY; Liu,SH 收藏  |  浏览/下载：13/0  |  提交时间：2012/03/25 Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films 期刊论文  OAI收割 SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, 1997, 卷号: 40, 期号: 2, 页码: 126-134 Zheng,LR; Lin,CL; Xu,HP; Zou,SC 收藏  |  浏览/下载：10/0  |  提交时间：2012/03/25 LEAD-ZIRCONATE-TITANATE  INTEGRATION  MEMORIES   Experimental studies of N+ implantation into CVD diamond thin films 期刊论文  OAI收割 SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, 1997, 卷号: 40, 期号: 4, 页码: 361-368 Xin,HP; Lin,CL; Wang,JX; Zou,SC; Shi,XH; Lin,ZX; Zhou,ZY; Liu,ZG 收藏  |  浏览/下载：9/0  |  提交时间：2012/03/25 ION   Experimental studies of superhard materials carbon nitride CNx prepared by ion-beam synthesis method 期刊论文  OAI收割 SCIENCE IN CHINA SERIES E-TECHNOLOGICAL SCIENCES, 1996, 卷号: 39, 期号: 4, 页码: 404-411 Xin,HP; Lin,CL; Xu,HP; Zou,SC; Shi,XH; Wu,XL; Zhu,H; Hemment,PLF 收藏  |  浏览/下载：12/0  |  提交时间：2012/03/25 STRUCTURAL-PROPERTIES  SILICON-NITRIDE  FILMS  IMPLANTATION  N+