中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
半导体研究所 [5]
采集方式
OAI收割 [4]
iSwitch采集 [1]
内容类型
期刊论文 [4]
会议论文 [1]
发表日期
1999 [3]
1997 [1]
1996 [1]
学科主题
半导体器件 [2]
半导体物理 [2]
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First charge collection and position-precision data on the medium-resistivity silicon strip detectors before and after neutron irradiation up to 2x10(14) n/cm(2)
期刊论文
iSwitch采集
Nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1999, 卷号: 426, 期号: 1, 页码: 38-46
作者:
Li, Z
;
Dezilllie, B
;
Eremin, V
;
Li, CJ
;
Verbitskaya, E
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2019/05/12
Strip detectors
Silicon detectors
Annealing
Simulation
Irradiation
First charge collection and position-precision data on the medium-resistivity silicon strip detectors before and after neutron irradiation up to 2x10(14) n/cm(2)
会议论文
OAI收割
2nd international conference on radiation effects on semiconductor materials, detectors and devices, florence, italy, mar 04-06, 1998
Li Z
;
Dezilllie B
;
Eremin V
;
Li CJ
;
Verbitskaya E
收藏
  |  
浏览/下载:14/0
  |  
提交时间:2010/11/15
strip detectors
silicon detectors
annealing
simulation
irradiation
N-EFF
JUNCTION DETECTORS
RADIATION-DAMAGE
MODELS
First charge collection and position-precision data on the medium-resistivity silicon strip detectors before and after neutron irradiation up to 2x10(14) n/cm(2)
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1999, 卷号: 426, 期号: 1, 页码: 38-46
Li Z
;
Dezilllie B
;
Eremin V
;
Li CJ
;
Verbitskaya E
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2010/08/12
strip detectors
silicon detectors
annealing
simulation
irradiation
JUNCTION DETECTORS
RADIATION-DAMAGE
MODELS
N-EFF
Temperature-stimulated abnormal annealing of neutron-induced damage in high-resistivity silicon detectors
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1997, 卷号: 385, 期号: 2, 页码: 321-329
Li Z
;
Li CJ
;
Verbitskaya E
;
Eremin V
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2010/11/17
CHARGES N-EFF
RADIATION-DAMAGE
SPECTROSCOPY
Investigation on the N-eff reverse annealing effect using TSC/I-DLTS: Relationship between neutron induced microscopic defects and silicon detector electrical degradations
期刊论文
OAI收割
nuclear instruments & methods in physics research section a-accelerators spectrometers detectors and associated equipment, 1996, 卷号: 377, 期号: 0, 页码: 265-275
Li Z
;
Li CJ
;
Eremin V
;
Verbitskaya E
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2010/11/17
RADIATION-DAMAGE
RESISTIVITY