机构

• 近代物理研究所 [30]
• 中国科学院大学 [1]
• 兰州化学物理研究所 [1]

采集方式

• OAI收割 [31]
• iSwitch采集 [1]

内容类型

• 期刊论文 [21]
• 会议论文 [11]

发表日期

• 2018 [1]
• 2017 [7]
• 2016 [8]
• 2015 [1]
• 2014 [3]
• 2013 [3]
• 更多

学科主题

• 物理化学与绿色催化 [1]

筛选

浏览/检索结果: 共32条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序题名升序题名降序作者升序作者降序发表日期升序发表日期降序 Anomalous annealing of floating gate errors due to heavy ion irradiation 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2018, 卷号: 418, 页码: 80-86 作者:  Hou, Mingdong;  Zhao, Peixiong;  Luo, Jie;  Ji, Qinggang;  Ye, Bing   |  收藏  |  浏览/下载：55/0  |  提交时间：2018/05/31 Annealing  Flash memories  Heavy ions  Multiple cell upsets  Radiation effects   A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 会议论文  OAI收割 作者:  Yan, Weiwei;  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi   |  收藏  |  浏览/下载：40/0  |  提交时间：2018/08/20 Heavy ion irradiation  Single event upset  Active delay element  SRAM cell  Radiation hardened  Silicon-on-insulator   Influence of heavy ion flux on single event effect testing in memory devices 会议论文  OAI收割 作者:  Xi, Kai;  Luo, Jie;  Liu, Jie;  Sun, Youmei;  Hou, Mingdong   |  收藏  |  浏览/下载：16/0  |  提交时间：2018/08/20 Swift heavy ions  Ion flux  Single event effect  Memory device   Influence of heavy ion flux on single event effect testing in memory devices 会议论文  OAI收割 作者:  Xi, Kai;  Sun, Youmei;  Luo, Jie;  Liu, Jie;  Liu, Tianqi   |  收藏  |  浏览/下载：18/0  |  提交时间：2018/08/20 Swift heavy ions  Ion flux  Single event effect  Memory device   A comparison of heavy ion induced single event upset susceptibility in unhardened 6T/SRAM and hardened ADE/SRAM 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 437-442 作者:  Wang, Bin;  Zeng, Chuanbin;  Geng, Chao;  Liu, Tianqi;  Khan, Maaz   |  收藏  |  浏览/下载：35/0  |  提交时间：2018/05/31 Heavy ion irradiation  Single event upset  Active delay element  SRAM cell  Radiation hardened  Silicon-on-insulator   Influence of heavy ion flux on single event effect testing in memory devices 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 406, 页码: 431-436 作者:  Luo, Jie;  Liu, Jie;  Sun, Youmei;  Hou, Mingdong;  Xi, Kai   |  收藏  |  浏览/下载：14/0  |  提交时间：2018/05/31 Swift heavy ions  Ion flux  Single event effect  Memory device   A molecular dynamics simulation study of irradiation induced defects in gold nanowire 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 卷号: 405, 页码: 22-30 作者:  Liu, Wenqiang;  Chen, Piheng;  Qiu, Ruizhi;  Khan, Maaz;  Liu, Jie   |  收藏  |  浏览/下载：47/0  |  提交时间：2018/05/31 Displacement cascade  Nanowires  Molecular dynamics  Defects  Radiation resistance   Investigation of optical properties of Cu/Ni multilayer nanowires embedded in etched ion-track template 期刊论文  OAI收割 APPLIED SURFACE SCIENCE, 2016, 卷号: 388, 页码: 155-159 作者:  Xie, Lu;  Yao, Huijun;  Duan, Jinglai;  Chen, Yonghui;  Lyu, Shuangbao   |  收藏  |  浏览/下载：32/0  |  提交时间：2018/05/31 Multilayer nanowires  Surface plasmon resonance  Optical properties  Electrochemical deposition   Investigation of optical properties of Cu/Ni multilayer nanowires embedded in etched ion-track template 会议论文  OAI收割 作者:  Xie, Lu;  Yao, Huijun;  Duan, Jinglai;  Chen, Yonghui;  Lyu, Shuangbao   |  收藏  |  浏览/下载：29/0  |  提交时间：2018/08/20 Multilayer nanowires  Surface plasmon resonance  Optical properties  Electrochemical deposition