机构

• 近代物理研究所 [6]
• 新疆理化技术研究所 [1]

采集方式

• OAI收割 [7]

内容类型

• 期刊论文 [7]

发表日期

• 2022 [1]
• 2021 [2]
• 2020 [1]
• 2019 [3]

学科主题

筛选

浏览/检索结果: 共7条，第1-7条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs 期刊论文  OAI收割 SCIENCE CHINA-INFORMATION SCIENCES, 2022, 卷号: 65, 期号: 2, 页码: 2 作者:  Cai, Chang;  Ning, Bingxu;  Fan, Xue;  Liu, Tianqi;  Ke, Lingyun   |  收藏  |  浏览/下载：49/0  |  提交时间：2021/12/09 Design and verification of multiple SEU mitigated circuits on SRAM-based FPGA system 期刊论文  OAI收割 MICROELECTRONICS RELIABILITY, 2021, 卷号: 126, 页码: 7 作者:  Yu, Jian;  Cai, Chang;  Ning, Bingxu;  Gao, Shuai;  Liu, Tianqi   |  收藏  |  浏览/下载：47/0  |  提交时间：2022/01/24 Heavy ions  Irradiation  Hardened  Single event upset   Measurement and evaluation of the Single Event Effects of high-performance SerDes circuits 期刊论文  OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2021, 卷号: 1012, 页码: 11 作者:  Wang, Shu;  Cai, Chang;  Ning, Bingxu;  He, Ze;  Huang, Zhiqin   |  收藏  |  浏览/下载：43/0  |  提交时间：2021/12/08 SerDes  SRAM-based FPGA  Single Event Upset  Single Event Functional Interrupt   Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381 作者:  Cai, Chang;  Liu, Tianqi;  Zhao, Peixiong;  Fan, Xue;  Huang, Hongyang   |  收藏  |  浏览/下载：30/0  |  提交时间：2022/01/19 D filp-flops (DFFs)  heavy ions  radiation hardening  single-event upsets (SEUs)  ultrathin body and buried oxide fully depleted silicon on insulator (UTBB FDSOI)   SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA 期刊论文  OAI收割 ELECTRONICS, 2019, 卷号: 8, 期号: 12, 页码: 12 作者:  Cai, Chang;  Gao, Shuai;  Zhao, Peixiong;  Yu, Jian;  Zhao, Kai   |  收藏  |  浏览/下载：34/0  |  提交时间：2022/01/19 field-programmable gate arrays  embedded block memory  single event  fault tolerance  radiation effect   Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits 期刊论文  OAI收割 IEICE ELECTRONICS EXPRESS, 2019, 卷号: 16, 期号: 10, 页码: 6 作者:  Xu, Liewei;  Cai, Chang;  Liu, Tianqi;  Ke, Lingyun;  Yu, Jun   |  收藏  |  浏览/下载：75/0  |  提交时间：2019/11/10 FPGA  single event effects  heavy ions  irradiation   Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors 期刊论文  OAI收割 IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709 作者:  Zheng, QW (Zheng, Qiwen)[ 1 ];  Cui, JW (Cui, Jiangwei)[ 1 ];  Xu, LW (Xu, Liewei)[ 2 ];  Ning, BX (Ning, Bingxu)[ 3 ];  Zhao, K (Zhao, Kai)[ 3 ]   |  收藏  |  浏览/下载：115/0  |  提交时间：2019/05/14 Back-gate biasing  forward body bias (FBB)  total ionizing dose (TID)  ultrathin body and buried oxide fully depleted silicon-on-insulator (UTBB FD-SOI)