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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [5]
化学研究所 [4]
沈阳自动化研究所 [2]
合肥物质科学研究院 [2]
物理研究所 [1]
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OAI收割 [14]
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期刊论文 [12]
会议论文 [2]
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2018 [2]
2017 [1]
2011 [1]
2009 [2]
2008 [1]
2007 [2]
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A Simple, Compact and Rigid Scanning Tunneling Microscope
期刊论文
OAI收割
CHINESE JOURNAL OF CHEMICAL PHYSICS, 2018, 卷号: 31, 期号: 5, 页码: 731-734
作者:
Ge, Wei-feng
;
Wang, Ji-hao
;
Hou, Yu-bin
;
Lu, Qing-you
  |  
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2019/12/25
Scanning tunneling microscope
Sapphire guiding tube
Finite element analyses
Atomic-resolution image
Detecting the Micro/nano Physical Properties of Single Lymphoma Cells with Atomic Force Microscopy
会议论文
OAI收割
2017 7th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, CHINA, Augest 7-11, 2017
作者:
Liu LQ(刘连庆)
;
Wang B(王博)
;
Li M(李密)
;
Wei FN(魏发南)
;
Liu B(刘斌)
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2018/04/01
Atomic force microscopy
Lymphoma
Image
Elasticity
Force curve
INVESTIGATIONS ON THE g FACTORS AND THE SUPERHYPERFINE PARAMETERS FOR THE TETRAGONAL Pd(3+) CENTERS IN AgX (X = Cl, Br)
期刊论文
OAI收割
International Journal of Modern Physics B, 2011, 卷号: 25, 期号: 13, 页码: 1833-1843
H. M. Zhang
;
S. Y. Wu
;
X. F. Wang
;
Y. X. Hu
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2012/04/13
Electron paramagnetic resonance
crystal and ligand fields
Pd(3+)
AgCl
AgBr
transition-metal ions
epr spectroscopic investigations
electron-paramagnetic-resonance
atomic screening constants
laser-light
generation
color image-formation
silver bromide
superposition model
scf functions
agbr
THEORETICAL STUDIES OF THE LOCAL STRUCTURES AND SPIN HAMILTONIAN PARAMETERS FOR THE RHOMBIC Ni(2+) CENTERS IN AgX (X = Cl, Br)
期刊论文
OAI收割
Modern Physics Letters B, 2009, 卷号: 23, 期号: 11, 页码: 1415-1424
Z. H. Zhang
;
S. Y. Wu
;
C. J. Fu
;
L. H. Wei
;
X. F. Wang
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2012/04/13
Defect structures
AgX (X = Cl
electron paramagnetic resonance
Ni(2+)
Br)
atomic screening constants
laser-light generation
ab-initio
calculations
color image-formation
single-crystals
superposition
model
silver-chloride
scf functions
agbr
ions
Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface
期刊论文
OAI收割
JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 7
Wen, C
;
Wang, YM
;
Wan, W
;
Li, FH
;
Liang, JW
;
Zou, J
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2013/09/24
RESOLUTION ELECTRON-MICROSCOPY
PHASE-OBJECT APPROXIMATION
CHEMICAL-VAPOR-DEPOSITION
IMAGE DECONVOLUTION
HETEROEPITAXIAL GROWTH
THEORETICAL CONSIDERATION
ATOMIC CONFIGURATION
PARTIAL DISLOCATIONS
MISFIT DISLOCATIONS
LOMER DISLOCATION
Theoretical studies of the local structures and the spin Hamiltonian parameters of the tetragonal Ru3+ centers in AgCl and AgBr
期刊论文
OAI收割
Journal of Alloys and Compounds, 2008, 卷号: 455, 期号: 1-2, 页码: 42-46
S. Y. Wu
;
Q. Fu
;
H. M. Zhang
;
G. D. Lu
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2012/04/13
inorganic materials
crystal and ligand fields
point defects
electron
paramagnetic resonance
electron-paramagnetic-resonance
atomic screening constants
laser-light
generation
color image-formation
silver-chloride
scf functions
crystals
bromide
ions
cr3+
AFM Operating-Drift Detection and Analyses based on Automated Sequential Image Processing
会议论文
OAI收割
7th IEEE Conference on Nanotechnology, Hong Kong, China, August 2-5, 2007
作者:
Zhan ZK(詹志坤)
;
Yang YL(杨永良)
;
Li WJ(李文荣)
;
Dong ZL(董再励)
;
Qu YL(曲艳丽)
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2012/06/06
Atomic Force Microscopes (AFM)
automatic nanomanipulation
automated sequential image processing
manipulation drift
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
期刊论文
OAI收割
Ultramicroscopy, 2007, 卷号: 107, 期号: 4-5, 页码: 281-292
K. Du
;
K. von Hochmeister
;
F. Phillipp
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2012/04/13
high-resolution transmission electron microscopy
image simulation
atomic-resolution
noise transfer
ccd cameras
hrem
scattering
microscope
diffraction
holography
package
signal
Local conductivity study of TiO2 electrodes by atomic force microscopy
期刊论文
OAI收割
SURFACE AND INTERFACE ANALYSIS, 2001, 卷号: 32, 期号: 1, 页码: 125-129
作者:
Jiang, FZ
;
Zhang, DS
;
Lin, Y
;
Song, YL
;
Xiao, XR
  |  
收藏
  |  
浏览/下载:17/0
  |  
提交时间:2019/04/09
Conductivity
Tio2
Nanocrystalline Film Electrodes
Atomic Force Microscopy
Topography
Simultaneous Current Image