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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [4]
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OAI收割 [4]
内容类型
期刊论文 [4]
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2018 [1]
2017 [1]
2014 [1]
2013 [1]
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Materials ... [2]
Engineerin... [1]
Metallurgy... [1]
Physics, A... [1]
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Mechanism of improved electromigration reliability using Fe-Ni UBM in wafer level package
期刊论文
OAI收割
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2018, 卷号: 34, 期号: 8, 页码: 1305-1314
作者:
Gao, LY
;
Zhang, H
;
Li, CF
;
Guo, JD
;
Liu, ZQ
  |  
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2018/12/25
Fe-Ni under bump metallization (UBM)
Intermetallic compounds (IMCs)
Electromigration (EM)
Diffusion
Vacancy formation
Failure Mechanisms of SAC/Fe-Ni Solder Joints During Thermal Cycling
期刊论文
OAI收割
JOURNAL OF ELECTRONIC MATERIALS, 2017, 卷号: 46, 期号: 8, 页码: 5338-5348
Gao, Li-Yin
;
Liu, Zhi-Quan
;
Li, Cai-Fu
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2017/08/17
Fe-Ni under bump metallization (UBM)
thermal cycling
microstructural evolution
lifetime
recrystallization
electron backscatter diffraction (EBSD)
Effect of Fe Content on the Interfacial Reliability of SnAgCu/Fe-Ni Solder Joints
期刊论文
OAI收割
Journal of Materials Science & Technology, 2014, 卷号: 30, 期号: 9, 页码: 928-933
H. Zhang
;
Q. S. Zhu
;
Z. Q. Liu
;
L. Zhang
;
H. Y. Guo
;
C. M. Lai
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2015/01/14
Fe-Ni alloy
Under bump metallization (UBM)
Intermetallic compound
(IMC)
Reliability
High temperature storage
Temperature cycling
lead-free solders
intermetallic compounds
growth-kinetics
cu
metallization
ag
strength
ball
ubm
Application of Electroless Fe-42Ni(P) Film for Under-bump Metallization on Solder Joint
期刊论文
OAI收割
Journal of Materials Science & Technology, 2013, 卷号: 29, 期号: 1, 页码: 7-12
H. F. Zhou
;
J. D. Guo
;
Q. S. Zhu
;
J. K. Shang
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2013/12/24
Under-bump metallization (UBM)
Electroless Fe-42Ni(P)
Sn
Solderability
Interfacial reaction
fe-p
solderability
deposition
alloys
sn
behavior
systems
surface
cu