中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Mechanism of improved electromigration reliability using Fe-Ni UBM in wafer level package 期刊论文  OAI收割
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 2018, 卷号: 34, 期号: 8, 页码: 1305-1314
作者:  
Gao, LY;  Zhang, H;  Li, CF;  Guo, JD;  Liu, ZQ
  |  收藏  |  浏览/下载:40/0  |  提交时间:2018/12/25
Failure Mechanisms of SAC/Fe-Ni Solder Joints During Thermal Cycling 期刊论文  OAI收割
JOURNAL OF ELECTRONIC MATERIALS, 2017, 卷号: 46, 期号: 8, 页码: 5338-5348
Gao, Li-Yin; Liu, Zhi-Quan; Li, Cai-Fu
收藏  |  浏览/下载:41/0  |  提交时间:2017/08/17
Effect of Fe Content on the Interfacial Reliability of SnAgCu/Fe-Ni Solder Joints 期刊论文  OAI收割
Journal of Materials Science & Technology, 2014, 卷号: 30, 期号: 9, 页码: 928-933
H. Zhang; Q. S. Zhu; Z. Q. Liu; L. Zhang; H. Y. Guo; C. M. Lai
收藏  |  浏览/下载:34/0  |  提交时间:2015/01/14
Application of Electroless Fe-42Ni(P) Film for Under-bump Metallization on Solder Joint 期刊论文  OAI收割
Journal of Materials Science & Technology, 2013, 卷号: 29, 期号: 1, 页码: 7-12
H. F. Zhou; J. D. Guo; Q. S. Zhu; J. K. Shang
收藏  |  浏览/下载:28/0  |  提交时间:2013/12/24