中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Evolution and Growth Mechanism of Cu-2(In,Sn) Formed Between In-48Sn Solder and Polycrystalline Cu During Long-Time Liquid-State Aging 期刊论文  OAI收割
JOURNAL OF ELECTRONIC MATERIALS, 2020, 卷号: 49, 期号: 4, 页码: 9
作者:  
Tian, Feifei;  Pang, Xueyong;  Xu, Bo;  Liu, Zhi-Quan
  |  收藏  |  浏览/下载:35/0  |  提交时间:2021/02/02
Growth Behavior of Intermetallic Compounds in Cu/Sn3.0Ag0.5Cu Solder Joints with Different Rates of Cooling 期刊论文  OAI收割
Journal of Electronic Materials, 2015, 卷号: 44, 期号: 1, 页码: 590-596
L. M.; Zhang Yang, Z. F.
收藏  |  浏览/下载:27/0  |  提交时间:2015/05/08
In situ tensile creep behaviors of Sn-4Ag/Cu solder joints revealed by electron backscatter diffraction 期刊论文  OAI收割
Scripta Materialia, 2012, 卷号: 67, 期号: 3, 页码: 289-292
Q. K. Zhang; Z. F. Zhang
收藏  |  浏览/下载:20/0  |  提交时间:2013/02/05
Preparation of Sn-Ag-In Solder Bumps by Electroplating of Sn-Ag and Indium in Sequence and the Effect of Indium Addition on Microstructure and Shear Strength 期刊论文  OAI收割
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2012, 卷号: 2, 期号: 8, 页码: 1275-1279
Wang, DL; Yuan, Y; Luo, L
收藏  |  浏览/下载:22/0  |  提交时间:2013/04/23
In situ observations on creep fatigue fracture behavior of Sn-4Ag/Cu solder joints 期刊论文  OAI收割
Acta Materialia, 2011, 卷号: 59, 期号: 15, 页码: 6017-6028
Q. K. Zhang; Z. F. Zhang
收藏  |  浏览/下载:35/0  |  提交时间:2012/04/13
In situ observations on shear and creep-fatigue fracture behaviors of SnBi/Cu solder joints 期刊论文  OAI收割
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing, 2011, 卷号: 528, 期号: 6, 页码: 2686-2693
Q. K. Zhang; Z. F. Zhang
收藏  |  浏览/下载:12/0  |  提交时间:2012/04/13
Crack propagation of single crystal beta-Sn during in situ TEM straining 期刊论文  OAI收割
Journal of Electron Microscopy, 2010, 卷号: 59, 页码: S61-S66
P. J. Shang; Z. Q. Liu; D. X. Li; J. K. Shang
收藏  |  浏览/下载:17/0  |  提交时间:2012/04/13
Interfacial Reactions Between In-Sn Solder and Ni-Fe Platings 期刊论文  OAI收割
Journal of Electronic Materials, 2009, 卷号: 38, 期号: 12, 页码: 2506-2515
J. P. Daghfal; P. J. Shang; Z. Q. Liu; J. K. Shang
收藏  |  浏览/下载:17/0  |  提交时间:2012/04/13
Current-induced phase partitioning in eutectic indium-tin pb-free solder interconnect 期刊论文  OAI收割
Journal of Electronic Materials, 2007, 卷号: 36, 期号: 10, 页码: 1372-1377
J. P. Daghfal; J. K. Shang
收藏  |  浏览/下载:7/0  |  提交时间:2012/04/13