中国科学院机构知识库网格系统: 检索

浏览/检索结果: 共28条，第1-10条

帮助

条数/页：排序方式：
	Single event transient effect of frontside and backside illumination image sensors under proton irradiation 期刊论文 OAI收割 ACTA PHYSICA SINICA, 2022, 卷号: 71, 期号: 5, 页码: 1-9 作者: Fu, J (Fu Jing) [1] , [2] , [3]; Cai, YL (Cai Yu-Long) [4]; Li, YD (Li Yu-Dong) [1] , [2]; Feng, J (Feng Jie) [1] , [2]; Wen, L (Wen Lin) [1] , [2] \| 收藏 \| 浏览/下载：44/0 \| 提交时间：2022/06/06 CMOS image sensor proton irradiation single event effect transientbrightspot
	Impact of incident direction on neutron-induced single-bit and multiple-cell upsets in 14 nm FinFET and 65 nm planar SRAMs 期刊论文 OAI收割 CHINESE PHYSICS B, 2022, 卷号: 31, 期号: 12, 页码: 126103 作者: Yang, SH; Zhang, ZG; Lei, ZF; Huang, Y; Xi, K \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2023/11/09 neutron fin field-effect transistor (FinFET) single event upset (SEU) Monte-Carlo simulation
	Investigation of single event effect in 28-nm system-on-chip with multi patterns* 期刊论文 OAI收割 CHINESE PHYSICS B, 2020, 卷号: 29, 期号: 10, 页码: 5 作者: Yang, Wei-Tao; Li, Yong-Hong; Guo, Ya-Xin; Zhao, Hao-Yu; Li, Yang \| 收藏 \| 浏览/下载：37/0 \| 提交时间：2021/12/15 system-on-chip heavy ion single event effect
	Silicon equivalent gas in silicon equivalent proportional counter - Monte Carlo simulations 期刊论文 OAI收割 RADIATION PHYSICS AND CHEMISTRY, 2020, 卷号: 167, 页码: 4 作者: Chiang, Yueh; Chao, Tsi-Chian; Cho, I-Chun; Lee, Chung-Chi; Hong, Ji-Hong \| 收藏 \| 浏览/下载：14/0 \| 提交时间：2022/01/19 Silicon equivalent gas Silicon equivalent proportional counter Monte Carlo simulation Linear energy transfer Single event effect
	SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA 期刊论文 OAI收割 ELECTRONICS, 2019, 卷号: 8, 期号: 12, 页码: 12 作者: Cai, Chang; Gao, Shuai; Zhao, Peixiong; Yu, Jian; Zhao, Kai \| 收藏 \| 浏览/下载：37/0 \| 提交时间：2022/01/19 field-programmable gate arrays embedded block memory single event fault tolerance radiation effect
	Preliminary single event effect distribution investigation on 28 nm soc using heavy ion microbeam 期刊论文 iSwitch采集 Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms, 2019, 卷号: 450, 页码: 323-326 作者: Yang, Weitao; Du, Xuecheng; Guo, Jinlong; Wei, Junze; Du, Guanghua 收藏 \| 浏览/下载：137/0 \| 提交时间：2019/10/08 Single event effect (see) System on chip (soc) Heavy ion microbeam On-chip-memory (ocm)
	Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam 期刊论文 OAI收割 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2019, 卷号: 450, 页码: 323-326 作者: Yang, Weitao; Du, Xuecheng; Guo, Jinlong; Wei, Junze; Du, Guanghua \| 收藏 \| 浏览/下载：83/0 \| 提交时间：2019/11/10 Single event effect (SEE) System on Chip (SoC) Heavy ion microbeam On-chip-memory (OCM)
	Effects of total ionizing dose on single event effect sensitivity of FRAMs 期刊论文 OAI收割 MICROELECTRONICS RELIABILITY, 2019, 卷号: 95, 页码: 1-7 作者: Ji, Qinggang; Liu, Jie; Li, Dongqing; Liu, Tianqi; Ye, Bing \| 收藏 \| 浏览/下载：60/0 \| 提交时间：2019/11/10 Ferroelectric random access memory Total ionizing dose Single event effect TCAD simulation
	Synergistic effect of enhanced low-dose-rate sensitivity and single event transient in bipolar voltage comparator LM139 期刊论文 OAI收割 JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2019, 卷号: 56, 期号: 2, 页码: 172-178 作者: Yao, S (Yao, Shuai)[ 1,2,3 ]; Lu, W (Lu, Wu)[ 1,2,4 ]; Yu, X (Yu, Xin)[ 1,2 ]; Wang, X (Wang, Xin)[ 1,2 ]; Li, XL (Li, Xiaolong)[ 1,2,3 ] \| 收藏 \| 浏览/下载：100/0 \| 提交时间：2019/02/25 Enhanced low dose rate sensitivity single event transient bipolar voltage comparator synergistic effect