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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
金属研究所 [3]
上海硅酸盐研究所 [1]
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OAI收割 [4]
内容类型
期刊论文 [4]
发表日期
2018 [1]
2017 [1]
2010 [1]
2009 [1]
学科主题
Materials ... [2]
Chemistry,... [1]
Metallurgy... [1]
Nanoscienc... [1]
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Integration of Oxide Semiconductor Thin Films with Relaxor-Based Ferroelectric Single Crystals with Large Reversible and Nonvolatile Modulation of Electronic Properties
期刊论文
OAI收割
ACS APPLIED MATERIALS & INTERFACES, 2018, 卷号: 10, 期号: 38, 页码: 32809, 32817
作者:
Xu, Zhi-Xue
;
Yan, Jian-Min
;
Xu, Meng
;
Guo, Lei
;
Chen, Ting -Wei
  |  
收藏
  |  
浏览/下载:63/0
  |  
提交时间:2018/12/28
ferroelectric field effect device
ferroelectric single crystal
electronic properties
tin dioxide thin film
magnetoresistance
Electromigration anisotropy introduced by tin orientation in solder joints
期刊论文
OAI收割
JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 卷号: 703, 页码: 264-271
Chen, Jian-Qiang
;
Liu, Kai-Lang
;
Guo, Jing-Dong
;
Ma, Hui-Cai
;
Wei, Song
;
Shang, Jian-Ku
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2017/08/17
Electromigration
Single crystal tin
Cu6Sn5
Intermetallic compounds
Orientation
Diffusion
Crack propagation of single crystal beta-Sn during in situ TEM straining
期刊论文
OAI收割
Journal of Electron Microscopy, 2010, 卷号: 59, 页码: S61-S66
P. J. Shang
;
Z. Q. Liu
;
D. X. Li
;
J. K. Shang
收藏
  |  
浏览/下载:19/0
  |  
提交时间:2012/04/13
in situ TEM
straining
single crystal Sn
slip system
self-diffusion
crack propagation
free solder alloys
lead-free solders
thermal fatigue
behavior
creep
tin
pb
joints
ag
deformation
A study on the orientation relationship between the scallop-type Cu(6)Sn(5) grains and (011) Cu substrate using electron backscattered diffraction
期刊论文
OAI收割
Journal of Applied Physics, 2009, 卷号: 106, 期号: 11
H. F. Zou
;
H. J. Yang
;
Z. F. Zhang
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2012/04/13
ageing
copper
copper alloys
electron backscattering
electron
diffraction
texture
tin alloys
wetting
lead-free solders
interfacial reactions
single-crystal
molten sn
growth
joints