中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共4条,第1-4条 帮助

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Influence of Dislocations on the Refractive Index of AlN by Nanoscale Strain Field 期刊论文  OAI收割
Nanoscale Research Letters, 2019, 卷号: 14, 期号: 1
作者:  
Li,Dabing;  Feng,Zhe Chuan;  Luo,Xuguang;  Wang,Yong;  Kai,Cuihong
  |  收藏  |  浏览/下载:133/0  |  提交时间:2019/08/21
High-resolution X-ray diffraction analysis on HVPE-grown thick GaN layers 会议论文  OAI收割
2nd International Symposium on Growth of III Nitrides (ISGN-2), Laforet Shuzenji, JAPAN, JUL 07-09, 2008
作者:  
Hu XJ (胡晓剑);  Xu K (徐科);  Yang H (杨辉);  Wang JF (王建峰);  Xu Y (徐俞)
收藏  |  浏览/下载:224/38  |  提交时间:2011/03/14
Strained state of the layer system depending on the SiGe layer thickness by micro-Raman mapping 期刊论文  OAI收割
JOURNAL OF CRYSTAL GROWTH, 2004, 卷号: 264, 期号: 1-3, 页码: 104
Zheng, XH; Chen, H; Li, YK; Huang, Q; Zhou, JM
收藏  |  浏览/下载:20/0  |  提交时间:2013/09/24
Evolution of mosaic structure in Si0.7Ge0.3 epilayers grown on Si(001) substrates 期刊论文  OAI收割
JOURNAL OF APPLIED PHYSICS, 1999, 卷号: 86, 期号: 3, 页码: 1292
Li, JH; Peng, CS; Mai, ZH; Zhou, JM; Huang, Q; Dai, DY
收藏  |  浏览/下载:16/0  |  提交时间:2013/09/17