中国科学院机构知识库网格系统: 检索

Influence Analysis of Spectral Line-Shape Models on Spectral Diagnoses Under High-Temperature Conditions 期刊论文 OAI收割
SPECTROSCOPY AND SPECTRAL ANALYSIS, 2023, 卷号: 43
作者: Zeng Si-xian; Ren Xin; He Hao-xuan; Nie Wei

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收藏 | 浏览/下载：19/0 | 提交时间：2023/11/17

Spectral line-shape profile TDLAS Integral absorbance Speed-averaged line-width Doppler HWHM (Half-width-at-half-maximum) Temperature

Drought limitation on tree growth at the Northern Hemisphere's highest tree line 期刊论文 OAI收割
DENDROCHRONOLOGIA, 2019, 卷号: 53, 页码: 40-47
作者: Lyu, Lixin; Zhang, Qi-Bin; Pellatt, Marlow G.; Buntgen, Ulf; Li, Mai-He

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收藏 | 浏览/下载：19/0 | 提交时间：2022/01/06

Alpine tree line Climate reconstructions Drought stress Growth-climate sensitivity Tibetan plateau Tree-Ring width Vegetation dynamics

Width Estimation of Glue Line for Engine Oil Sump Based on Planar Vision 会议论文 OAI收割
Yinchuan, China, 2016-5-28~2016-5-30
作者: Yan Changguo; Xu De; Liu Yan; Zhang Feng

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收藏 | 浏览/下载：19/0 | 提交时间：2016/06/20

Glue Line Width Estimation Morphological Method Curve Fitting

High density print circuit board line width measurement algorithm based on statistical process control theory 期刊论文 OAI收割
OPTIK, 2013, 卷号: 124, 期号: 20, 页码: 4472-4476
作者: Zhang, Jing; Ye, Yutang; Xie, Yu; Liu, Lin; Chang, Yongxin

收藏 | 浏览/下载：26/0 | 提交时间：2015/04/17

High-density circuit board Line width measurement Morphological erosion operator Clustering segmentation Measure system analysis

Cavity ring-down spectroscopy for trace ammonia detection 期刊论文 OAI收割
JOURNAL OF INFRARED AND MILLIMETER WAVES, 2012, 卷号: 31, 期号: 5, 页码: 431-436
作者: Qu Zhe-Chao; Li Bin-Cheng; Han Yan-Ling

收藏 | 浏览/下载：31/0 | 提交时间：2015/07/10

cavity ring-down spectroscopy quantum cascade laser ammonia line-width

Nanoscale patterns made by using a 13.5-nm Schwarzschild objective and a laser produced plasma source (EI CONFERENCE) 会议论文 OAI收割
Optical Micro- and Nanometrology IV, April 16, 2012 - April 18, 2012, Brussels, Belgium
作者: Wang X.; Wang X.; Wang X.; Wang Z.; Wang Z.

收藏 | 浏览/下载：37/0 | 提交时间：2013/03/25

Lithium fluoride (LiF) crystal is a very promising candidate as nanometer resolution EUV and soft X-ray detector. Compared with other EUV and soft X-ray detectors charge coupled device and photographic films LiF crystal has high resolution large field of view and wide dynamic range. In this paper using LiF crystal as EUV detector and a Schwarzschild objective (SO) working at 13.5nm as projection optics mesh images with 4.2 m 1.2 m and 800 nm line width and pinhole patterns with 1.5m diameter are acquired in projection imaging mode and direct writing mode respectively. Fluorescence intensity profiles of images show that the resolution of mesh image is 900 nm and the one of pinhole image is 800 nm. In the experiments a spherical condense mirror based on normal incidence type is used to eliminate the damage and contamination on the masks (mesh and pinhole) caused by the laser plasma and the energy density is not decreased compared with that the masks are close to the plasma. The development of the SO the alignment of the objective and the imaging experiments are also reported. 2012 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

The Research of real time auto-recognition of the moire fringe (EI CONFERENCE) 会议论文 OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011, Beijing, China
Wang M.-J.; Wu Z.-G.

收藏 | 浏览/下载：18/0 | 提交时间：2013/03/25

Measuring the movement of raster by the method of moire fringe has the advantage of high sensitivity high resolution and non-contacted measurement. The characteristic of moire fringe is that the image is white alternate with black the angle of the stripes is uniform the width of the stripes is uniform the terminators of the stripes aren't clear. A fast method that can figure out the width and angle of the moire fringe precisely is put forward in this paper. It calculates the angle the stripes firstly. According to the principle of the minimum mean squared error (MMSE) the closer a series of data is the smaller the value of the MMSE will be. The method is described as follows: It takes the image's center as the origin 180 beelines pass through the origin with the same angle interval. it calculates the value of the minimum mean squared error of the 180 beelines and find out the least one among those then the angle of the moire fringe comes out primarily. In order to improving the calculating precision of moire fringe 60 equal angles are divided in the neighborhood of the angle then a precise angle of moire fringe is calculated according to the principle of the MMSE. After getting out the angle of the moire fringe we begin to calculate the width of moire fringe. A line vertical with the moire fringe is drawn and we can get the width of the moire fringe by the vertical line. In order to get over the influence of the noise an effective area with the shape of diamond is selected in the image. The data of area is accumulated and projected according to the direction of moire fringe and a sine curve come out. The width of moire fringe can be obtained by getting the position of the first wave crest the position of the last wave crest and the number of wave crest. Experiments prove that the precision of the method put forward in this paper is enhanced in comparison with the traditional frequency method the precision of width calculation achieves to 99.6% according to the evaluation indicators of width detection error. The computing speed is boosted largely compared with traditional method and it can achieve with 15 ms that satisfying the demand of real time. 2011 SPIE.

The automatic photoresist coating machine on the spherical surface (EI CONFERENCE) 会议论文 OAI收割
2009 IEEE International Conference on Mechatronics and Automation, ICMA 2009, August 9, 2009 - August 12, 2009, Changchun, China
作者: Li Y.; Li Y.; Li Y.; Li Y.; Wang H.

收藏 | 浏览/下载：19/0 | 提交时间：2013/03/25

The photoresist coating is an important micro machining process widely applied in engineering. The formed film should be uniform and enough thin to assure the quality of final pattern whose line width is micrometer or nanometer. It is more difficult to process it on the spherical surface than on the flat. In this work mathematic model of film thickness on the spherical surface is proposed by using hydromechanics. The key factors that influence the film thickness are obtained from the analysis of coating process. Then the rational parameters which be controlled by the automatic photoresist coating machine can be final set up according to the result of the coating experiments. And the accuracy analysis of the key part which is used for the main process is performed by the error analytics. This machine not only makes the whole coating process automation but also monitors the film quality in real time. It is adequate for aspheric surface also. 2009 IEEE.

Narrow line-width resonant cavity enhanced photodetectors operating at 1.55 mu m 期刊论文 iSwitch采集
Optics communications, 2008, 卷号: 281, 期号: 6, 页码: 1582-1587
作者: Mao, R. W.; Tsai, C. S.; Yu, J. Z.; Wang, Q. M.

收藏 | 浏览/下载：31/0 | 提交时间：2019/05/12

Resonant cavity enhanced (rce) Photodetector Line-width Free carrier absorption

Narrow line-width resonant cavity enhanced photodetectors operating at 1.55 mu m 期刊论文 OAI收割
optics communications, 2008, 卷号: 281, 期号: 6, 页码: 1582-1587
Mao, RW; Tsai, CS; Yu, JZ; Wang, QM

收藏 | 浏览/下载：46/1 | 提交时间：2010/03/08

resonant cavity enhanced (RCE) photodetector line-width free carrier absorption