机构

• 数学与系统科学研究院 [3]
• 长春光学精密机械与物... [2]
• 金属研究所 [1]
• 中国科学院大学 [1]
• 西安光学精密机械研究... [1]
• 近代物理研究所 [1]
• 更多

采集方式

• OAI收割 [8]
• iSwitch采集 [1]

内容类型

• 期刊论文 [8]
• 会议论文 [1]

发表日期

• 2020 [1]
• 2019 [5]
• 2018 [1]
• 2016 [2]

学科主题

• chemical r... [1]
• lasers [1]
• materials ... [1]
• semiconduc... [1]

筛选

浏览/检索结果: 共9条，第1-9条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 An improved dynamic load-strength interference model for the reliability analysis of aero-engine rotor blade system 期刊论文  OAI收割 PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART G-JOURNAL OF AEROSPACE ENGINEERING, 2020, 页码: 19 作者:  Zhao, Bingfeng;  Xie, Liyang;  Zhang, Yu;  Ren, Jungang;  Bai, Xin   |  收藏  |  浏览/下载：118/0  |  提交时间：2021/10/15 Aero-engine  rotor blade  load-strength interference  reliability analysis  strength degradation   Latent Reliability Degradation of Ultrathin Amorphous HfO2 Dielectric After Heavy Ion Irradiation: The Impact of Nano-Crystallization 期刊论文  OAI收割 IEEE ELECTRON DEVICE LETTERS, 2019, 卷号: 40, 期号: 10, 页码: 1634-1637 作者:  Li, Zongzhen;  Liu, Jie;  Zhai, Pengfei;  Liu, Tianqi;  Bi, Jinshun   |  收藏  |  浏览/下载：25/0  |  提交时间：2022/01/19 HfO2  heavy ion irradiation  reliability degradation  crystallization   Residual life prediction for complex systems with multi-phase degradation by ARMA-filtered hidden Markov model 期刊论文  OAI收割 QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT, 2019, 卷号: 16, 期号: 1, 页码: 19-35 作者:  Sheng, Zhidong;  Hu, Qingpei;  Liu, Jian;  Yu, Dan   |  收藏  |  浏览/下载：67/0  |  提交时间：2019/03/05 System reliability  residual life prediction  multi-phase degradation  hidden Markov model   Strategic allocation of test units in an accelerated degradation test plan 期刊论文  OAI收割 JOURNAL OF QUALITY TECHNOLOGY, 2019, 卷号: 51, 期号: 1, 页码: 64-80 作者:  Ye, Zhi-Sheng;  Hu, Qingpei;  Yu, Dan   |  收藏  |  浏览/下载：48/0  |  提交时间：2019/03/11 compromise test plan  general path model  large sample approximate variance  order statistics  random initial degradation  reliability   Analysis of the reliability of LED lamps during accelerated thermal aging test by online method 期刊论文  OAI收割 Optik, 2019, 卷号: 178, 页码: 1045-1050 作者:  J.Hao;  H.L.Ke;  R.T.Sun;  Q.Sun;  L.Jing   |  收藏  |  浏览/下载：83/0  |  提交时间：2020/08/24 Bayesian method,Reliability,Online method,LED lamps,junction temperature,optimal-design,offline tests,degradation,Optics   The Influence of Junction Temperature Variation of LED on the Lifetime Estimation During Accelerated Aging Test 期刊论文  OAI收割 Ieee Access, 2019, 卷号: 7, 页码: 4773-4781 作者:  X.X.Wang;  L.Jing;  Y.Wang;  Q.Gao;  Q.Sun   |  收藏  |  浏览/下载：21/0  |  提交时间：2020/08/24 Life testing,lifetime estimate,light emitting diodes,white leds,degradation,reliability,depreciation,Computer Science,Engineering,Telecommunications   A reliability assessment approach for systems with heterogeneous component information 期刊论文  OAI收割 QUALITY ENGINEERING, 2018, 卷号: 30, 期号: 4, 页码: 676-686 作者:  Xu, Jianyu;  Yu, Dan;  Hu, Qingpei;  Xie, Min   |  收藏  |  浏览/下载：18/0  |  提交时间：2019/04/02 component information  degradation models  MLE  pivot  system reliability assessment  Weibull distribution   A bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns 期刊论文  iSwitch采集 Reliability engineering & system safety, 2016, 卷号: 155, 页码: 55-63 作者:  Yuan, Tao 收藏  |  浏览/下载：31/0  |  提交时间：2019/05/09 Burn-in  Degradation model  Gibbs sampling  Hierarchical bayesian model  Reliability   Thermally accelerated ageing test of 808nm high power diode laser arrays in CW mode 会议论文  OAI收割 17th international conference on electronic packaging technology, icept 2016, wuhan, china, 2016-08-16 作者:  Nie, Zhiqiang;  Wu, Di;  Lu, Yao;  Wu, Dhai;  Wang, Shuna 收藏  |  浏览/下载：94/0  |  提交时间：2016/11/22 Chip scale packages  Defects  Degradation  Electronics packaging  High power lasers  Laser beam welding  Power semiconductor diodes  Reliability  Reliability analysis  Semiconductor diodes