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长春光学精密机械与物... [3]
物理研究所 [1]
新疆理化技术研究所 [1]
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期刊论文 [5]
会议论文 [3]
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Visible Achromatic Metalens Design Based on Artificial Neural Network
期刊论文
OAI收割
ADVANCED OPTICAL MATERIALS, 2021, 页码: 8
作者:
Wang, Feilou
;
Geng, Guangzhou
;
Wang, Xueqian
;
Li, Junjie
;
Bai, Yang
  |  
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2022/06/15
achromatic focusing
metalenses
neural networks
visible wavelength
Facile phyto-mediated synthesis of silver nanoparticles using Chinese winter jujube (Ziziphus jujuba Mill. cv. Dongzao) extract and their antibacterial/catalytic properties
期刊论文
OAI收割
IET NANOBIOTECHNOLOGY, 2017, 卷号: 11, 期号: 8, 页码: 973-980
作者:
Liu, Jing-Fu
;
Yuan, Chun-Gang
;
Huo, Can
;
Gui, Bing
;
Chen, Yong-Sheng
  |  
收藏
  |  
浏览/下载:37/0
  |  
提交时间:2018/07/26
Silver
Nanoparticles
Nanofabrication
Antibacterial Activity
Biomedical Materials
Nanobiotechnology
Scanning Electron Microscopy
X-ray Diffraction
Transmission Electron Microscopy
Ultraviolet Spectra
Visible Spectra
X-ray Chemical Analysis
Fourier Transform Infrared Spectra
Catalysis
Wavelength 446 Nm
Temperature 293 k To 298 k
Ag
Escherichia Coli
Staphylococcus Aureus
Biomolecules
Catalytic Activity
Metal Ions
Colloidal Solution
Ftir Spectra
Uv-vis Absorbance
Tem
Sem
Xrd
Fourier Transform Infrared Spectroscopy
Energy-dispersive X-ray Spectroscopy
Scanning Electron Microscopy
X-ray Diffraction
Selected Area Electron Diffraction
Transmission Electron Microscopy
Atomic Force Microscopy
Uv-visible Spectroscopy
Catalytic Properties
Antibacterial Properties
Chinese Winter Jujube Extract
Silver Nanoparticles
Facile Phyto-mediated Synthesis
SnS nanostructures prepared by simple film technique: Catalyst-free vacuum thermal evaporation
期刊论文
OAI收割
Micro and Nano Letters, 2014, 卷号: 9, 期号: 1, 页码: 34-36
作者:
Li, Jin
;
Wang, Shengfeng
;
Jian, Jikang
;
Sun, Yanfei
;
Xu, Jinbao
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2014/11/11
nanostructured materials
photoluminescence
scanning electron microscopy
tin compounds
transmission electron microscopy
vacuum deposition
X-ray diffraction
tin chips
starting materials
scanning electron microscopy
transmission electron microscopy
high-resolution TEM
as-prepared products
X-ray diffraction
orthorhombic phase
photoluminescence spectra
emission bandcentres
visible light emitter
infrared light emitter
optical devices
nanostructures
simple film technique
catalyst-free vacuum thermal evaporation
wavelength 555
4 nm
electron volt energy 2
24 eV
electron volt energy 1
58 eV
wavelength 785 nm
SnS
In-situ plasmon-driven chemical reactions revealed by high vacuum tip-enhanced Raman spectroscopy
期刊论文
OAI收割
SCIENTIFIC REPORTS, 2012, 卷号: 2
Sun, MT
;
Zhang, ZL
;
Zheng, HR
;
Xu, HX
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2013/09/18
GOLD NANOPARTICLES
SURFACE-PLASMON
VISIBLE-LIGHT
FILMS
P
AMINOTHIOPHENOL
NANOSTRUCTURES
WAVELENGTH
MICROSCOPE
SCATTERING
P'-DIMERCAPTOAZOBENZENE
Analysis of measuring errors for the visible light phase-shifting point diffraction interferometer (EI CONFERENCE)
会议论文
OAI收割
2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010, December 3, 2010 - December 6, 2010, Guangzhou, China
作者:
Zhang Y.
收藏
  |  
浏览/下载:13/0
  |  
提交时间:2013/03/25
In order to improve the measuring accuracy of the visible light phase-shifting point diffraction interferometer (PS/PDI) for the extreme ultraviolet lithography (EUVL) aspheric mirrors
the main measuring errors will be discussed in this paper. At first
the elementary configuration and measuring principle of the visible light phase-shifting point diffraction interferometer are introduced briefly
then the different errors which are possible to affect the measuring result are summed up
the errors include PZT phase-shifting error
detector nonlinearity error
detector quantization error
wavelength instability error and intensity instability error of the laser source
vibration error
air refractivity instability error and so on. Through detailed analysis and simulation
the magnitude of these errors can be obtained. By analysing the reasons which cause these errors and the relationship between these errors and interferometer configuration parameters
some methods are put forward to avoid or restrain these errors accordingly.
The calibration of faint simulation star magnitude based on single photon count technique (EI CONFERENCE)
会议论文
OAI收割
International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications, June 17, 2009 - June 19, 2009, Beijing, China
作者:
Xu S.-Y.
;
Guo J.
;
Guo J.
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2013/03/25
A calibration method of faint star magnitude of the star scene simulation device is proposed in this paper. In the research of simulation star magnitude
luminometers and CCD devices are the general calibration devices which are used to measure the illumination intensity and calibrate its magnitude. But if the simulation magnitude is only sixth magnitude
its illumination intensity is only 1.010-8 Lux. This illumination intensity level is the lowest illumination intensity that the commercial luminometer can detect. Hence the simulation star magnitude lower than six magnitude cannot be calibrated by luminoters. Likewise CCD devices also need an additive cooler in this case. When the single photon characteristic is presented due to the low luminosity of simulating light sources
the simulation star magnitude can be calibrated by detecting its photon flux of radiation with the method of single photon count. In this paper the detection principle of single photon based on a compact designed PMT detecting of the radiation level of simulation star magnitude is advanced. Especially a spectrum match method is proved theoretically to be an effective means for selecting PMT photosensitive type. In the case of the detection object of the simulation star in visible wavelength
a analysis indicates that the material of tri-alkali cathode materials its best choice after being compared the Signal-to-Noise of photon detector of several PMT photosensitive materials based on the different spectrum match ratio of different object light sources and different cathode materials. An experiment is employed to show the relationship of control voltage of PMT and its dark counter
the relationship of the environment temperature of PMT and its dark counter
which proves its only decades of CPS at room temperature. The so low dark counter avoids a bulky cooler and is convenient for installing it on the star scene simulation equipment. Finally in the experiment of calibrating the simulation star magnitudes the ability of its calibration is confirmed to reaches up to 12m
meanwhile its calibration error is within 0.2m. 2009 SPIE.
Resolution performance of extreme ultraviolet telescope (EI CONFERENCE)
会议论文
OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China
作者:
Yang L.
;
Chen B.
;
Chen B.
;
Liang J.-Q.
;
Ni Q.-L.
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2013/03/25
Extreme Ultraviolet Telescope (EUT) will image solar corona in four EUV narrow bandpasses defined by multilayered coatings deposited on normal incidence optics. In order to make sure it will get sub-arcsecond angular resolution in the mission we have to test its resolution performance on ground. The EUT is aligned by Zygo interferometer first and a global wavefront error of 0.152 peak to valley is obtained ( = 632.8nm ). Because of the difficulty of angular resolution test for EUT at its operating wavelengths
we test its optical performance at visible and UV band. The method is to place the resolution test-target on the focal plane of collimator and illuminate the target by visible and UV light espectively
then the collimated light will go through EUT and image at focal plane on CCD. By analysis of the images obtained in experiments we conclude that the angular resolution of EUT is 1.22 at visible light ( = 570nm ) which is very close to diffraction limit (1.20) and according to these results we estimate that the operational wavelength resolution is better than 0.32
meets design requirements. While for UV light
the angular resolution is 1.53 that is different from diffraction limit (0.53)
the error comes mainly from large pixel of EUV camera. 2009 SPIE.
Studies on the carbonylation of carbon dioxide under single wavelength visible light irradiation
期刊论文
OAI收割
chemical journal of chinese universities-chinese, 2001, 卷号: 22, 期号: 1, 页码: 75-77
作者:
Zhuang, JQ
;
Yin, JM
;
Gao, DB
;
Zheng, XF
;
Zhou, GY
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2015/11/10
single wavelength
visible light
carbon dioxide
carbonylation