机构

• 光电技术研究所 [14]

采集方式

• OAI收割 [14]

内容类型

• 期刊论文 [13]
• 会议论文 [1]

发表日期

• 2019 [1]
• 2013 [3]
• 2012 [2]
• 2010 [1]
• 2008 [5]
• 2006 [1]
• 更多

学科主题

• 光学薄膜技术 [2]
• Computer s... [1]

筛选

浏览/检索结果: 共14条，第1-10条 帮助 限定条件 专题：光电技术研究所    第一署名单位    第一作者单位    通讯作者单位     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Application of vector diffraction theory in geometric phase based metasurfaces 期刊论文  OAI收割 Journal of the Optical Society of America B: Optical Physics, 2019, 卷号: 36, 期号: 7, 页码: E42-E47 作者:  Dai, Chengwei;  Huang, Yijia;  Guo, Yinghui;  Ma, Xiaoliang;  Wang, Yanqin   |  收藏  |   Carrier Diffusivity Measurement in Silicon Wafers Using Free Carrier Absorption 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2013, 卷号: 34, 期号: 8-9, 页码: 1721-1726 作者:  Zhang, Xiren;  Li, Bincheng 收藏  |   Design and fabrication of a diffractive optical element as a spectrum-splitting solar concentrator for lateral multijunction solar cells 期刊论文  OAI收割 APPLIED OPTICS, 2013, 卷号: 52, 期号: 11, 页码: 2312-2319 作者:  Huang, Qingli;  Wang, Jinze;  Quan, Baogang;  Zhang, Qiulin;  Zhang, Dongxiang 收藏  |   Carrier diffusivity measurement in silicon wafers using free carrier absorption 期刊论文  OAI收割 International Journal of Thermophysics, 2013, 卷号: 34, 期号: 8-9, 页码: 1721-1726 作者:  Zhang, Xiren;  Li, Bincheng 收藏  |   Accuracy Improvement of Multi-parameter Estimation in Combined Photocarrier Radiometry and Free Carrier Absorption for Characterization of Silicon Wafers 期刊论文  OAI收割 INTERNATIONAL JOURNAL OF THERMOPHYSICS, 2012, 卷号: 33, 期号: 10-11, 页码: 2076-2081 作者:  Huang, Qiuping;  Li, Bincheng;  Ren, Shengdong 收藏  |   Accuracy improvement of multi-parameter estimation in combined photocarrier radiometry and free carrier absorption for characterization of silicon wafers 会议论文  OAI收割 International Journal of Thermophysics, 2012 作者:  Huang, Qiuping;  Li, Bincheng;  Ren, Shengdong 收藏  |   Analysis of modulated free-carrier absorption measurement of electronic transport properties of silicon wafers 期刊论文  OAI收割 Journal of Physics: Conference Series, 2010, 卷号: 214 作者:  Wei Li;  Bincheng Li 收藏  |   Accuracy analysis for the determination of electronic transport properties of Si wafers using modulated free carrier absorption 期刊论文  OAI收割 JOURNAL OF APPLIED PHYSICS, 2008, 卷号: 104, 期号: 10 作者:  Zhang, Xiren;  Li, Bincheng;  Liu, Xianming 收藏  |   Measurement of electronic transport property of semiconductors by three-dimensional modulated free carrier absorption technique 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2008, 卷号: 57, 期号: 11, 页码: 7310-7316 作者:  Zhang Xi-Ren;  Li Bin-Cheng;  Liu Xian-Ming 收藏  |   Analysis of free carrier absorption measurement of electronic transport properties of silicon wafers 期刊论文  OAI收割 EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS, 2008, 卷号: 153, 页码: 279-281 作者:  Zhang, X.;  Li, B.;  Gao, C. 收藏  |