中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共5条,第1-5条 帮助

条数/页: 排序方式:
Raman spectroscopic determination of hole concentration in undoped GaAsBi 期刊论文  OAI收割
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2019, 卷号: 34, 期号: 1, 页码: 15008
作者:  
Zhu Sixin;  Qiu Weiyang;  Wang Han;  Lin Tie;  Chen Pingping
  |  收藏  |  浏览/下载:34/0  |  提交时间:2019/11/13
Determination of the transport properties in 4h-sic wafers by raman scattering measurement 期刊论文  iSwitch采集
Chinese physics b, 2011, 卷号: 20, 期号: 3, 页码: 6
作者:  
Sun Guo-Sheng;  Liu Xing-Fang;  Wu Hai-Lei;  Yan Guo-Guo;  Dong Lin
收藏  |  浏览/下载:25/0  |  提交时间:2019/05/12
Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement 期刊论文  OAI收割
CHINESE PHYSICS B, 2011, 卷号: 20, 期号: 3, 页码: 6
作者:  
Sun Guo-Sheng;  Liu Xing-Fang;  Wu Hai-Lei;  Yan Guo-Guo;  Dong Lin
  |  收藏  |  浏览/下载:26/0  |  提交时间:2021/02/02
Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement 期刊论文  OAI收割
CHINESE PHYSICS B, 2011, 卷号: 20, 期号: 3, 页码: 6
作者:  
Sun Guo-Sheng;  Liu Xing-Fang;  Wu Hai-Lei;  Yan Guo-Guo;  Dong Lin
  |  收藏  |  浏览/下载:11/0  |  提交时间:2021/02/02
Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement 期刊论文  OAI收割
chinese physics b, 2011, 卷号: 20, 期号: 3, 页码: article no.33301
作者:  
Liu XF;  Yan GG;  Zheng L;  Dong L
收藏  |  浏览/下载:37/3  |  提交时间:2011/07/05