机构

• 金属研究所 [4]
• 武汉岩土力学研究所 [2]

采集方式

• OAI收割 [6]

内容类型

• 期刊论文 [6]

发表日期

• 2020 [1]
• 2015 [1]
• 2009 [4]

学科主题

筛选

浏览/检索结果: 共6条，第1-6条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Grouting diffusion mechanism in an oblique crack in rock masses considering temporal and spatial variation of viscosity of fast-curing grouts 期刊论文  OAI收割 GEOMECHANICS AND ENGINEERING, 2020, 卷号: 23, 期号: 2, 页码: 151-163 作者:  Huang, Shuling;  Pei, Qitao;  Ding, Xiuli;  Zhang, Yuting;  Liu, Dengxue   |  收藏  |  浏览/下载：27/0  |  提交时间：2021/05/25 fast-curing grout  oblique crack  grouting  multi-field coupling  diffusion mechanism   Numerical manifold method based on isogeometric analysis 期刊论文  OAI收割 SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2015, 卷号: 58, 期号: 9, 页码: 1520-1532 作者:  Zhang YouLiang;  Liu DengXue;  Tan Fei   |  收藏  |  浏览/下载：13/0  |  提交时间：2018/06/05 numerical manifold method (NMM)  isogeometric analysis  local refinement  mathematical cover   Fabrication and Surface Analysis of Boron Carbide Thin Films by Electron Beam Evaporation 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2009, 卷号: 38, 页码: 564-567 作者:  Yang Shuichang;  Liao Zhijun;  Liu Zhenliang;  Fan Qiang;  Wu Dengxue   |  收藏  |  浏览/下载：4/0  |  提交时间：2021/02/02 electron beam evaporation  boron carbide thin films  XRD  XPS   Effect of the Structure and Component on Refractive Index of TiO2 Film 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2009, 卷号: 38, 页码: 575-578 作者:  Liu Chengshi;  Wu Dengxue;  Zhao Lili;  Liao Zhijun;  Lu Tiecheng   |  收藏  |  浏览/下载：6/0  |  提交时间：2021/02/02 TiO2 film  refractive index  electron beam evaporation   Preparation and Characterization of Boron Carbide Nitrogen Thin Films 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2009, 卷号: 38, 页码: 568-571 作者:  Liu Zhenliang;  Liao Zhijun;  Fan Qiang;  Yang Shuichang;  Wu Dengxue   |  收藏  |  浏览/下载：5/0  |  提交时间：2021/02/02 boron carbon nitride thin films  X-ray diffraction (XRD)  X-ray photon electron spectroscopy (XPS)  fourier-transformed infrared spectroscopy (FTIR)   Preparation and Characterization of Boron Carbide Nitrogen Thin Films 期刊论文  OAI收割 RARE METAL MATERIALS AND ENGINEERING, 2009, 卷号: 38, 页码: 568-571 作者:  Liu Zhenliang;  Liao Zhijun;  Fan Qiang;  Yang Shuichang;  Wu Dengxue   |  收藏  |  浏览/下载：5/0  |  提交时间：2021/02/02 boron carbon nitride thin films  X-ray diffraction (XRD)  X-ray photon electron spectroscopy (XPS)  fourier-transformed infrared spectroscopy (FTIR)