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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
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上海微系统与信息技... [11]
新疆理化技术研究所 [2]
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期刊论文 [17]
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Measurement and Evaluation of the Within-Wafer TID Response Variability on BOX Layer of SOI Technology
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021, 卷号: 68, 期号: 10, 页码: 2516-2523
作者:
Zheng, QW (Zheng, Qiwen) 1Cui, JW (Cui, Jiangwei) 1Yu, XF (Yu, Xuefeng) 1
;
Li, YD (Li, Yudong) 1
;
Lu, W (Lu, Wu) 1
;
He, CF (He, Chengfa) 1
;
Guo, Q (Guo, Qi) 1
  |  
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Multiple Layout-Hardening Comparison of SEU-Mitigated Filp-Flops in 22-nm UTBB FD-SOI Technology
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2020, 卷号: 67, 期号: 1, 页码: 374-381
作者:
Cai, Chang
;
Liu, Tianqi
;
Zhao, Peixiong
;
Fan, Xue
;
Huang, Hongyang
  |  
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Total Ionizing Dose Responses of Forward Body Bias Ultra-Thin Body and Buried Oxide FD-SOI Transistors
期刊论文
OAI收割
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2019, 卷号: 66, 期号: 4, 页码: 702-709
作者:
Zheng, QW (Zheng, Qiwen)[ 1 ]
;
Cui, JW (Cui, Jiangwei)[ 1 ]
;
Xu, LW (Xu, Liewei)[ 2 ]
;
Ning, BX (Ning, Bingxu)[ 3 ]
;
Zhao, K (Zhao, Kai)[ 3 ]
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Anomalous electrical properties induced by hot-electron-injection in 130-nm partially depleted soi nmosfets fabricated on modified wafer
期刊论文
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Ieee transactions on nuclear science, 2016, 卷号: 63, 期号: 5, 页码: 2731-2737
作者:
Dai, Lihua
;
Bi, Dawei
;
Ning, Bingxu
;
Hu, Zhiyuan
;
Song, Lei
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  |  
Influence of high-dose nitrogen implantation on the positive charge density of the buried oxide of silicon-on-insulator wafers
期刊论文
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Acta physica sinica, 2011, 卷号: 60, 期号: 5, 页码: 6
作者:
Tang Hai-Ma
;
Zheng Zhong-Shan
;
Zhang En-Xia
;
Yu Fang
;
Li Ning
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  |  
Influence of high-dose nitrogen implantation on the positive charge density of the buried oxide of silicon-on-insulator wafers
期刊论文
OAI收割
acta physica sinica, 2011, 卷号: 60, 期号: 5, 页码: article no.56104
作者:
Yu F
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Characterization and analysis of silicon on insulator fabricated by separation by implanted oxygen layer transfer
期刊论文
OAI收割
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2010, 卷号: 28, 期号: 1, 页码: 163-168
Wei,X
;
Wu,AM
;
Wang,X
;
Li,XY
;
Ye,F
;
Chen,J
;
Chen,M
;
Zhang,B
;
Li,CL
;
Zhang,M
;
Wang,X
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Investigation on Silicon on Insulator Fabricated by Separation by Implanted Oxygen Layer Transfer
期刊论文
OAI收割
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 卷号: 157, 期号: 1, 页码: H81-H85
Wei, X
;
Wu, AM
;
Wang, X
;
Li, XY
;
Ye, F
;
Chen, J
;
Chen, M
;
Zhang, B
;
Lin, CL
;
Zhang, M
;
Wang, X
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Gettering layer for oxygen accumulation in the initial stage of SIMOX processing
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 卷号: 267, 期号: 8-9, 页码: 1273-1276
Ou, X
;
Kogler, R
;
Skorupa, W
;
Moller, W
;
Wang, X
;
Gerlach, JW
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Oxygen gettering in Si by He ion implantation-induced cavity layer
期刊论文
OAI收割
NUCLEAR SCIENCE AND TECHNIQUES, 2009, 卷号: 20, 期号: 4, 页码: 202-207
Ou, X
;
Zhang, B
;
Wu, AM
;
Zhang, M
;
Wang, X
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